Datasheet
The 2470 High Voltage SourceMeter
®
Source Measure
Unit (SMU) Instrument brings advanced Touch, Test,
Invent
®
technology right to your fingertips. It combines an
innovative graphical user interface (GUI) with capacitive
touchscreen technology to make testing intuitive and
minimize the learning curve to help engineers and
scientists learn faster, work smarter, and invent easier.
With its 1100 V and 10 fA capability, the 2470 is optimized
for characterizing and testing high voltage, low leakage
devices, materials, and modules, such as silicon
carbide (SiC), gallium nitride (GaN), power MOSFETs,
transient suppression devices, circuit protection devices,
power modules, batteries, and much more. These
new capabilities, combined with Keithley’s decades of
expertise in developing high precision, high-accuracy
SMU instruments, make the 2470 a “go-to instrument”
for high-voltage source and low-current measurement
applications in the lab and in the test rack.
Key Features
• Wide coverage up to 1100 V / 1 A DC 20 W max.
• 10 fA measure resolution
• 0.012% basic measure accuracy with 6½-digit
resolution
• Five-inch, high resolution capacitive touch screen GUI
• Source and sink (4-quadrant) operation
• SCPI and TSP
®
scripting programming modes
• TSP-Link for multi-channel I-V testing
• Front panel input banana jacks; rear panel
high-voltage input triaxial connections
• Built-in context-sensitive help
• Front-panel USB 2.0 memory I/O port for transferring
data, test scripts, and test configurations
2470 Graphical SourceMeter
®
SMU Instrument Data Sheet
Datasheet
A Tektronix Company