Instructions
Table Of Contents
- Model DMM6500 6½-Digit Multimeter User's Manual
- 1 Introduction
- 2 Front-panel overview
- 3 Using a remote interface
- 4 Making basic front-panel measurements
- 5 Measuring DC voltage with high accuracy
- 6 Measuring 4-wire resistance with offset compensation
- 7 Scanning temperature at a set time interval
- 8 Grading and binning resistors
- 9 Measuring power using digitizing and TSP-Link
- 10 Troubleshooting FAQs
- About this section
- Where can I find updated drivers?
- Is there any software to help me get started?
- Why did my settings change?
- Why can't the DMM6500 read my USB flash drive?
- How do I upgrade the firmware?
- How do I change the command set?
- How do I save the present state of the instrument?
- How do I save what is displayed on the screen?
- What is the ethernet port number?
- 11 Next steps
- Contact information
In this section:
Introduction .............................................................................. 7-1
Equipment required .................................................................. 7-1
Device connections .................................................................. 7-2
Sample temperatures at a specific time interval ....................... 7-4
Introduction
This application example demonstrates how to use the DMM6500 to log temperature measurement
data from multiple scan-card channels, one every minute for 24 hours. The data is saved to a USB
flash drive.
During production or storage, the temperature of the testing environment can be important. You can
use the DMM6500 to monitor temperature at a fixed time interval for an extended period.
This application requires a Keithley Instruments 2001-TCSCAN card. The 2001-TCSCAN provides
connections for up to nine channels of thermocouple temperature measurements.
For this application example, the card is connected to a type K thermocouple on each channel.
Equipment required
• One DMM6500
• One 2001-TCSCAN card
• One computer set up for communication with the instrument
• One USB flash drive
• One device or component to be tested
Section 7
Scanning temperature at a set time interval










