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SMU INSTRUMENTS

A Greater Measure of Conﬁdence

www.keithley.com

1.888.KEITHLEY

(U.S. only)

The high power Model 2651A SourceMeter SMU Instrument is specifically designed to characterize

and test high power electronics. This SMU instrument can help you improve productivity in applica-

tions across the R&D, reliability, and production spectrums, including high brightness LEDs, power

semiconductors, DC-DC converters, batteries, solar cells, and other high power materials, compo-

nents, modules, and subassemblies.

The Model 2651A offers a highly flexible, four-quadrant voltage and current source/load coupled with

precision voltage and current meters. It can be used as a:

• Semiconductor characterization instrument

• V or I waveform generator

• V or I pulse generator

• Precision power supply

• True current source

• Digital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution)

• Precision electronic load

+20A

+50A

–50A

–10A

+10A

+5A

–5A

–20A

+10V

–10V

+20V–20V 0V

+40V–40V

DC and

Pulse

only

The Model 2651A can source or sink up to ±40V and ±50A.

Two Measurement Modes: Digitizing or Integrating

Precisely characterize transient and steady-state behavior, including rapidly changing thermal effects,

with the two measurement modes in the Model 2651A. Each mode is defined by its independent

analog-to-digital (A/D) converters.

The Digitizing Measurement mode enables 1µs per point measurements. Its 18-bit A/D converters

allow you to precisely measure transient characteristics. For more accurate measurements, use its

Integrating Measurement mode, which is based on 22-bit A/D converters.

2651A

50A, High Power System

SourceMeter

SMU Instrument

• Source or sink:

– 2,000W of pulsed power

(±40V, ±50A)

– 200W of DC power

(±10V@±20A, ±20V@±10A,

±40V@±5A)

• Easily connect two units (in

series or parallel) to create

solutions up to ±100A or ±80V

• 1pA resolution enables precise

measurement of very low

leakage currents

• 1µs per point (1MHz),

18-bit sampling, accurately

characterizes transient behavior

• 1% to 100% pulse duty cycle for

pulse width modulated (PWM)

drive schemes and device-

specific drive stimulus

• Combines a precision power

supply, current source, DMM,

arbitrary waveform generator,

V or I pulse generator with

measurement, electronic load,

and trigger controller—all in one

instrument

• Includes TSP

Express I-V

characterization software,

LabVIEW

driver, and Keithley’s

Test Script Builder software

development environment

APPLICATIONS

• Power semiconductor,

HBLED, and optical device

characterization and testing

• Solar cell characterization

and testing

• Characterization of GaN, SiC, and

other compound materials and

devices

• Semiconductor junction

temperature characterization

• High speed, high precision

digitization

• Electromigration studies

• High current, high power

device testing

High power System SourceMeter SMU instrument

Summary of content (7 pages)

PAGE 1
• Source or sink: –– 2,000W of pulsed power (±40V, ±50A) –– 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A) • Easily connect two units (in series or parallel) to create solutions up to ±100A or ±80V • 1pA resolution enables precise measurement of very low leakage currents • 1μs per point (1MHz), 18-bit sampling, accurately characterizes transient behavior • 1% to 100% pulse duty cycle for pulse width modulated (PWM) drive schemes and devicespecific drive stimulus • Combines a precision power supply, curre
PAGE 2
50A, High Power System SourceMeter® SMU Instrument unit can pulse up to 50A; combine two units to pulse up to 100A. 2651A Expansion Capabilities Through TSP-Link Technology technology, multiple Model 2651As and selected Series 2600B SMU instruments can be combined to form a larger integrated system with up to 64 channels. Precision timing and tight channel synchronization are guaranteed with built-in 500ns trigger controllers.
PAGE 3
2651A 50A, High Power System SourceMeter® SMU Instrument Specification Conditions VOLTAGE ACCURACY SPECIFICATIONS 1, 2 SOURCE Range 100.000 mV 1.00000 V 10.0000 V 20.0000 V 40.0000 V Programming Resolution 5 μV 50 μV 500 μV 500 μV 500 μV Accuracy ±(% reading + volts) 0.02% + 500 μV 0.02% + 500 μV 0.02% + 5 mV 0.02% + 5 mV 0.02% + 12 mV MEASURE Noise (Vpp) (typical) 0.
PAGE 4
2651A 50A, High Power System SourceMeter® SMU Instrument Maximum output power: 202W maximum. Source/Sink Limits 1: Voltage: ±10.1V at ±20.0A, ±20.2V at ±10.0A, ±40.4V at ±5.0A 2. Four-quadrant source or sink operation. Current: ±5.05A at ±40V 2, ±10.1A at ±20V, ±20.2A at ±10V Four-quadrant source or sink operation. +50A CAUTION: Carefully consider and configure the appropriate output-off state and source and compliance levels before connecting the Model 2651A to a device that can deliver energy.
PAGE 5
0A, High Power System SourceMeter® SMU Instrument Noise (10Hz to 20MHz): <100mV peak-peak (typical), <30mV RMS (typical), 10V range with a 20A limit. Overshoot: Voltage: <±(0.1% + 10mV) (typical). Step size = 10% to 90% of range, resistive load, maximum current limit/compliance. Current: <±(0.1% + 10mV) (typical). Step Size = 10% to 90% of range, resistive load. See Current Source Output Settling Time specifications for additional test conditions. Range change overshoot: Voltage: <300mV + 0.
PAGE 6
2651A 50A, High Power System SourceMeter® SMU Instrument Measurement Speed Specifications 1, 2 A/D Converter Speed 0.001 NPLC 0.001 NPLC 0.01 NPLC 0.01 NPLC 0.1 NPLC 0.1 NPLC 1.0 NPLC 1.
PAGE 7
2651A 50A, High Power System SourceMeter® SMU Instrument SUPPLEMENTAL INFORMATION To Host Computer Node 1 Node 2 To Additional Nodes Each Model 2651A has two TSP-Link connectors to make it easier to connect instruments together in sequence. Once source-measure instruments are interconnected through the TSP-Link expansion interface, a computer can access all the resources of each source-measure instrument through the host interface of any Model 2651A.