Datasheet

Datasheet
TEK.COM4
Typical Applications
I-V functional test and characterization of a wide range of
devices, including:
• Discrete and passive components
– Two-leaded – Sensors, disk drive heads,
metal oxide varistors (MOVs), diodes,
zener diodes, sensors, capacitors,
thermistors
– Three-leaded – Small signal bipolar
junction transistors (BJTs), field-effect
transistors (FETs), and more
• Simple ICs – Optos, drivers, switches,
sensors, converters, regulators
• Integrated devices – small scale integrated
(SSI) and large scale integrated (LSI)
– Analog ICs
– Radio frequency integrated circuits (RFICs)
– Application specific integrated circuits
(ASICs)
– System on a chip (SOC) devices
• Optoelectronic devices such as light-emitting
diodes (LEDs), laser diodes, high brightness
LEDs (HBLEDs), vertical cavity surface-
emitting lasers (VCSELs), displays
• Wafer level reliability
– NBTI, TDDB, HCI, electromigration
• Solar Cells
• Batteries
• And more...
When you need to acquire data on a packaged part quickly, the wizard-based user
interface of ACS Basic Edition makes it easy to find and run the test you want, like this
common FET curve trace test.
Three New Dual-Channel Bench-Top
Models of Series 2600B Offer Industry-
Best Value and Performance
For applications that do not require leading-edge
system-level automation capabilities, Keithley has
expanded the Series 2600B to include 3 new
value-priced “bench-top” models – the 2604B,
2614B, and 2634B. These models offer similar
performance to Models 2602B, 2612B, and
2636B, respectively, however do not include TSP-
Link, Contact Check, and Digital I/O capabilities.
Complete Automated System Solutions
Keithley’s S500 Integrated Test Systems are
highly configurable, instrument-based systems
for semiconductor characterization at the device,
wafer, or cassette level. Built on our proven Series
2600B System SourceMeter SMU instruments,
our S500 Integrated Test Systems provide
innovative measurement features and system
flexibility, scalable to your needs. The unique
measurement capability, combined with the
powerful and flexible Automated Characterization
Suite (ACS) software, provides a comprehensive
range of applications and features not offered on
other comparable systems on the market.
The flexible software architecture of ACS Basic Edition allows
configuring systems with a wide range of controllers and test
fixtures, as well as the exact number of SourceMeter SMU
instruments the application requires.