Datasheet

Datasheet
TEK.COM2
device under test (DUT), and share the measurement
results with others. It allows you to visualize, interact with,
and share measurement results without programming,
while gaining a deeper understanding of your DUT. These
unique capabilities boost productivity across a wide range
of applications in R&D, education, QA/FA, and more.
Unmatched Throughput for Automated Test
with TSP Technology
For test applications that demand the highest levels of
automation and throughput, the 2600B’s TSP technology
delivers industry-best performance. TSP technology goes
far beyond traditional test command sequencers — it
fully embeds then executes complete test programs from
within the SMU instrument itself. This virtually eliminates
all the time-consuming bus communications to and from
the PC controller, and thus dramatically improves overall
test times.
• Conditional branching
• Advanced calculations
and flow control
• Variables
• Pass/Fail test
• Prober/Handler control
• Datalogging/
Formatting
Test Script
DUT
TSP technology executes complete test programs from the 2600B’s
non-volatile memory.
SMU-Per-Pin Parallel Testing with TSP-Link
Technology
TSP-Link is a channel expansion bus that enables multiple
Series 2600B’s to be inter-connected and function as a
single, tightly-synchronized, multi-channel system. The
2600B’s TSP-Link Technology works together with its TSP
technology to enable high-speed, SMU-per-pin parallel
testing. Unlike other high-speed solutions such as large
ATE systems, the 2600B achieves parallel test
performance without the cost or burden of a mainframe.
The TSP-Link based system also enables superior
flexibility, allowing for quick and easy system re-
configuration as test requirements change.
2400 Software Emulation
The Series 2600B is compatible with test code developed
for Keithley’s 2400 SourceMeter SMU instrument. This
enables an easier upgrade from 2400-based test systems
to Series 2600B, and can improve test speeds by as
much as 80%. In addition, it provides a migration path
from SCPI programming to Keithley’s TSP technology,
which when implemented can improve test times even
more. For complete support of legacy test systems, the
2400’s Source-Memory-List test sequencer is also fully
supported in this mode.
SMU1
<500ns
SMU2
SMU3
SMU4
All channels in the TSP-Link system are synch ronized to under 500ns.
Test 1
running
To
Device 1
GPIB, USB, or Ethernet
TSP-Link
Test 2
running
To
Device 2
Test 3
running
To
Device 3
SMU-Per-Pin Parallel Testing using TSP and TSP-Link improves test
throughput and lowers the cost of test.