Data Sheet

Datasheet
TEK.COM2
device under test (DUT), and share the measurement
results with others. It allows you to visualize, interact with,
and share measurement results without programming,
while gaining a deeper understanding of your DUT. These
unique capabilities boost productivity across a wide range
of applications in R&D, education, QA/FA, and more.
Unmatched Throughput
for Automated Test with
TSP Technology
For test applications that demand the highest levels of
automation and throughput, the 2600B’s TSP technology
delivers industry-best performance. TSP technology goes
far beyond traditional test command sequencers — it
fully embeds then executes complete test programs from
within the SMU instrument itself. This virtually eliminates
all the time-consuming bus communications to and from
the PC controller, and thus dramatically improves overall
test times.
• Conditional branching
• Advanced calculations
and flow control
• Variables
• Pass/Fail test
• Prober/Handler control
• Datalogging/
Formatting
Test Script
DUT
TSP technology executes complete test programs from the 2600B’s
non-volatile memory.
SMU-Per-Pin Parallel Testing
with TSP-Link Technology
TSP-Link is a channel expansion bus that enables multiple
Series 2600B’s to be inter-connected and function as a
single, tightly-synchronized, multi-channel system. The
2600B’s TSP-Link Technology works together with its TSP
technology to enable high-speed, SMU-per-pin parallel
testing. Unlike other high-speed solutions such as large
ATE systems, the 2600B achieves parallel test performance
without the cost or burden of a mainframe. The TSP-Link
based system also enables superior flexibility, allowing for quick
and easy system re-configuration as test requirements change.
SMU1
<500ns
SMU2
SMU3
SMU4
All channels in the TSP-Link system are synch ronized to under 500ns.
2400 Software Emulation
The Series 2600B is compatible with test code developed
for Keithley’s 2400 SourceMeter SMU instrument. This
enables an easier upgrade from 2400-based test systems
to Series 2600B, and can improve test speeds by as much
as 80%. In addition, it provides a migration path from SCPI
programming to Keithley’s TSP technology, which when
implemented can improve test times even more. For complete
support of legacy test systems, the 2400’s Source-Memory-
List test sequencer is also fully supported in this mode.
Test 1
running
To
Device 1
GPIB, USB, or Ethernet
TSP-Link
Test 2
running
To
Device 2
Test 3
running
To
Device 3
SMU-Per-Pin Parallel Testing using TSP and TSP-Link improves test throughput and
lowers the cost of test.