Data Sheet

TEK.COM 5
2600B System SourceMeter
®
SMU Instruments
Typical Applications
I-V functional test and characterization of a wide
range of devices, including:
• Discrete and passive components
– Two-leaded – Sensors, disk drive heads,
metal oxide varistors (MOVs), diodes, zener
diodes, sensors, capacitors,
thermistors
– Three-leaded – Small signal
bipolar junction transistors (BJTs),
field-effect transistors (FETs), and
more
• Simple ICs – Optos, drivers,
switches, sensors, converters,
regulators
• Integrated devices – small scale
integrated (SSI) and large scale
integrated (LSI)
– Analog ICs
– Radio frequency integrated
circuits (RFICs)
– Application specific integrated
circuits (ASICs)
– System on a chip (SOC) devices
• Optoelectronic devices such as light-
emitting diodes (LEDs), laser diodes,
high brightness LEDs (HBLEDs),
vertical cavity surface-emitting lasers
(VCSELs), displays
• Wafer level reliability
– NBTI, TDDB, HCI,
electromigration
• Solar Cells
• Batteries
• And more...
2604B/2614B rear panel (Single channels 2601B, 2611B, 2635B not shown)
2636B rear panel