Data Sheet

Datasheet
TEK.COM4
Three New Dual-Channel Bench-
Top Models of Series 2600B
Offer Industry-Best Value and
Performance
For applications that do not require leading-edge system-
level automation capabilities, Keithley has expanded the
Series 2600B to include 3 new value-priced “bench-top”
models – the 2604B, 2614B, and 2634B. These models
offer similar performance to Models 2602B, 2612B, and
2636B, respectively, however do not include TSP-Link,
Contact Check, and Digital I/O capabilities.
Complete Automated
System Solutions
Keithley’s S500 Integrated Test Systems are
highly configurable, instrument-based systems for
semiconductor characterization at the device, wafer, or
cassette level. Built on our proven Series 2600B System
SourceMeter SMU instruments, our S500 Integrated
Test Systems provide innovative measurement features
and system flexibility, scalable to your needs. The unique
measurement capability, combined with the powerful and
flexible Automated Characterization Suite (ACS) software,
provides a comprehensive range of applications and
features not offered on other comparable systems on
the market.
In the first and third quadrants, Series 2600B SMU
instruments operate as a source, delivering power to a
load. In the second and fourth quadrants, they operate
as a sink, dissipating power internally.
+1.5A
+3A
+5A
–3A
–5A
+10A
–10A
–1A
+1A
–1.5A
+40V+6V
–6V
+20V–20V 0V
0A
+35V–35V–40V
DC
Pulse
Models 2601B, 2602B, and 2604B I-V capability.
+1.5A
+10A
–10A
–1A
+1A
+0.1A
–0.1A
–1.5A
+200V+5V
–5V
+20V–20V 0V
0A
+180V–180V–200V
DC
Pulse
Models 2611B, 2612B, and 2614B I-V capability.
+1.5A
+10A
–10A
–1A
+1A
+0.1A
–0.1A
–1.5A
+200V+5V
–5V
+20V–20V 0V
0A
+180V–180V–200V
DC
Pulse
Models 2634B, 2635B, and 2636B I-V capability.