Datasheet

TEK.COM 5
2601B-PULSE System SourceMeter 10 µs Pulser/SMU Instrument
Typical Applications
I-V functional test and characterization of a wide
range of devices, including:
• Optoelectronic devices such
as vertical cavity surface-
emitting lasers (VCSELs), laser
diodes, light emitting diodes
(LEDs), high brightness LEDs
(HBLEDs), displays
• Discrete and passive
components including sensors,
disk drive heads, metal oxide
varistors (MOVs), diodes, Zener
diodes, sensors, capacitors,
thermistors
• Simple ICs – Optos, drivers,
switches, sensors, converters,
regulators
• Integrated devices – small
scale integrated (SSI) and large
scale integrated (LSI)
– Analog ICs
– Radio frequency integrated
circuits (RFICs)
– Application specific
integrated circuits (ASICs)
– System on a chip (SOC)
devices
• Wafer level reliability
– NBTI, TDDB, HCI,
electromigration
• Batteries
• Failure Analysis
• And more...
Comprehensive Built-in Connectivity
Rear panel access to rear-input connectors, remote control
interfaces (GPIB, USB 2.0, and LXI/ethernet), D-sub 25-pin
digital I/O port (for internal/external trigger signals and
handler control), and TSP-Link connectors make it simple
to configure multiple instrument test solutions and eliminate
the need to invest in additional adapter accessories.
2601-PULSE rear panel.
The 2601B-P-INT interlock / connector box interconnects
both the SMU and Pulser functions and converts both
of the Phoenix connectors on the rear panel to standard
BNC connectors. The interlock/connector box also
provides an optional safety interlock for use when testing
LASER devices.
2601B-PULSE Interlock / Connector (front/rear), included with
2601B-PULSE