Datasheet
TEK.COM 3
2601B-PULSE System SourceMeter 10 µs Pulser/SMU Instrument
Unmatched Throughput for Automated Test with TSP Technology
For test applications that demand the highest levels of automation and throughput, the 2601B-PULSE’s TSP technology
delivers industry-best performance. TSP technology goes far beyond traditional test command sequencers — it fully
embeds, then executes, complete test programs from within the SMU instrument itself. This virtually eliminates the time-
consuming bus communications to and from the PC controller, and thusdramatically improves overall test times.
Typical pulse output from a competitive SMU with overshoot and 6.47 μs
rise time.
2601B-PULSE output without overshoot and 1.4µs rise time.
• Conditional branching
• Advanced calculations
and flow control
• Variables
• Pass/Fail test
• Prober/Handler control
• Datalogging/
Formatting
Test Script
DUT
TSP technology executes complete test programs from the non-volatile
memory of the 2601B-PULSE.
SMU1
<500ns
SMU2
SMU3
SMU4
All channels in the TSP-Link system are synchronized to under 500ns.