Datasheet
Datasheet
TEK.COM2
Pulsed Testing for Device
Characterization
Testing real device operation and minimizing the heating
effects with on-wafer testing just got easier with the
2601B-PULSE SMU. Thermal management is critical
during the testing of many devices, especially those at the
semiconductor wafer level, such as VCSELs, laser diodes,
and LEDs. Pulsed I-V testing minimizes the heating effects
of the current in the device, especially if tested at the wafer
level when devices have no temperature control circuitry.
Testing with DC would either change their characteristics,
or at worst, destroy them. Later on, in production, when
they have been assembled into modules with temperature
controls, the devices can be DC tested and the results
compared to those from the pulsed test. Some devices
will pass a DC test and fail a pulsed test due to device
characteristic changes resulting from temperature shift.
The 10V/ 10A/ 10µs output of the 2601B-PULSE
ensures that you get a proper output pulse into your
device and an accurate measurement when it isrequired.
No Tuning Required
When outputting current pulses, cabling and inductance
can be a problem. Inductance can have a limiting effect
and could even be damaging. Quite often, the inductance
can be different from device to device, even when testing
laser diodes on a wafer. The effect of inductance on
a current source is that inductance resists changes in
current. This can cause the current source to increase
the output voltage. The result is overshoot and ringing
as the pulse settles. This may not be acceptable in your
test. Some solutions require tuning to compensate for
these behaviors, which can be time consuming. The
2601B-PULSE’s control loop system eliminates the need
to tune for load changes up to 3μH so that your pulse has
no overshoot and ringing when outputting pulses from 10
μs up to 500 μs at a current up to 10 amps. This ensures
a fast rise time, so your devices are sourced with a current
pulse to properly characterize the device or circuit. The
images on the next page show the performance of the
2601B-PULSE with PulseMeter technology compared to
a competitive modular SMU outputting a 5A, 50 μs pulse
on a device with an impedance of 3µH.
Pulse output performance of the 2610B-PULSE SMU.