User Manual

2400 Series SourceMeter
®
User’s Manual SCPI Command Reference 18-41
1) in the list regardless of the outcome of the test (PASS or FAIL con-
dition).
When a memory location is specified with FAIL, the sweep will
branch to that location on a failure. If not (PASS condition), the
sweep proceeds to the next memory location in the list. With NEXT
selected (the default), the sweep proceeds to the next memory loca
-
tion (present location +1) in the list regardless of the outcome of the
test (FAIL or PASS condition). Note that branch on FAIL is available
only via remote.
See Section 10, “Source memory sweep,” for more information.
BCONtrol <name>
:CALCulate2:CLIMits:BCONtrol <name> Control Digital I/O port pass/fail update
Parameters <name> = IMMediate Update output when first failure occurs
END Update output after sweep is completed
Query :BCONtrol? Query when digital output will update
Description This command is used to control when the digital output will update
to the pass or fail bit pattern. The pass or fail bit pattern tells the han
-
dler to stop the testing process and place the DUT in the appropriate
bin.
With IMMediate selected, the digital output will update immediately to
the bit pattern for the first failure in the testing process. If all the tests
pass, the output will update to the pass bit pattern.
With END selected, the digital output will not update to the pass or
fail bit pattern until the SourceMeter completes the sweep or list
operation. This allows multiple test cycles to be performed on DUT.
With the use of a scanner card, multi-element devices (i.e. resistor
network) can be tested. If, for example, you did not use END and the
first element in the device package passed, the pass bit pattern will
be output. The testing process will stop and the DUT will be binned.
As a consequence, the other elements in the device package are not
tested.
MODE <name>
:CALCulate2:CLIMits:MODE <name> Control Digital I/O port pass/fail output
Parameters <name> = GRADing Output graded pass/fail pattern
SORTing Output sorted pass/fail pattern
Query :MODE? Query Digital I/O pass/fail mode
Description This command controls how limit calculations drive the Digital I/O
lines. In GRADing mode, a reading passes if it is within all of the hi/
low limit tolerances enabled, assuming that it has passed the LIMIT 4
contact check (contact check option only) and LIMIT 1 compliance
tests first. The Digital I/O lines will be driven with the first pattern of