User Manual
2400 Series SourceMeter
®
 User’s Manual SCPI Command Reference 18-39
FAIL?
:CALCulate2:LIMit[1]:FAIL? Read LIMIT 1 test result
:CALCulate2:LIMitx:FAIL? Read LIMIT x test result (x = 2, 3, 5-12)
Description These commands are used to read the results of LIMIT 1, LIMIT 2, 
LIMIT 3, and LIMIT 5 to LIMIT 12 tests:
0 = Limit test passed
1 = Limit test failed
The response message (0 or 1) only tells you if a limit test has 
passed or failed. For Limit 2, Limit 3, and Limit 5-12, it does not tell 
you which limit (upper or lower) has failed. To determine which limit 
has failed, you will have to read the Measurement Event Register. 
(See 
“STATus subsystem,” page 18-101.)
Reading the results of a limit test does not clear the fail indication of 
the test. A failure can be cleared by using a :CLEar command.
Composite testing
PASS:SOURce2 <NRf> | NDN
:CALCulate2:CLIMits:PASS:SOURce2 <NRf> | <NDN> Specify composite pass pattern
NOTE The above command to set the composite pass pattern for the Model 2401 is 
invalid and will cause an undefined header error.
Parameters <NRf> =  0 to 7 (3-bit)  Decimal value  
0 to 15 (4-bit)  Decimal value 
<NDN> =  0 to #b111 (3-bit) Binary value 
0 to #b1111 (4-bit) Binary value 
0 to #q7 (3-bit) Octal value 
0 to #q17 (4-bit) Octal value 
0 to #h7 (3-bit) Hexadecimal value 
0 to #hF (4-bit) Hexadecimal value
Query :SOURce2? Query programmed source value
Description This command is used to define the 3-bit or 4-bit output pattern for 
the Digital I/O Port when there are no failures. Note that the output 
value can be specified in binary, octal, decimal, or hexadecimal for
-
mat. Use the table provided in the “Description” for the :SOURce 
command to determine the parameter value for the desired decimal 
digital output pattern.
The SourceMeter can be configured to place the defined pass bit 
pattern on the digital output immediately when the pass condition 
occurs, or it can wait until all testing on a device package is com
-
pleted (operation leaves trigger layer). See “Composite testing,” 
page 18-39 and “BCONtrol <name>,” page 18-41, for details.










