User Manual

2400 Series SourceMeter
®
User’s Manual Limit Testing 12-17
allows multi-element devices (i.e., resistor networks) to be tested. After
testing is finished, the bit pattern for the first failure is placed on the out
-
put. If all tests pass, the pass pattern will instead be placed on the out-
put.
In SORTING mode, a reading will fail if it fails the optional Contact
Check Test, the Compliance Test, or is not within any of the Digital I/O
Bands. If the tests pass and only Limit 1 or 4 (optional contact check
test) is enabled, the associated pass pattern will be output. Otherwise,
the first limit test band that passes will output its lower limit pattern
(upper limit patterns will be ignored). If Limit 1 or 4 fails, their failure pat
-
terns will be output. If no Limit 2, 3, or 5-12 passes, their failure pattern
will be output. When SORTING is selected, the Digital I/O bit pattern
can also be set (0 to 7, 3-bit; 0 to 15, 4-bit).
– AUTO CLEAR — Use this menu item to ENABLE or DISABLE auto-
clear for the digital output. After enabling auto-clear, you will be
prompted to set the pass/fail pattern pulse width (delay; 0 to
60.00000sec). You will then be prompted to set the digital output clear
pattern (0 to 7, 3-bit; 0 to 15, 4-bit).
• H/W LIMITS — Use this menu item to control and set the fail mode for the
Limit 1 (Compliance) test:
– CONTROL — Use to ENABLE or DISABLE the test.
– FAIL MODE — Use to select the fail mode for Limit 1 test. With IN
selected, the test will fail when the SourceMeter is in compliance. With
OUT selected, the test will fail when not in compliance. Also use to
specify the digital output bit pattern for Limit #1 IN or OUT test failure (0
to 7, 3-bit; 0 to 15, 4-bit).
NOTE If the contact check option is installed, the H/W LIMITS selection will also
set options for the Contact Check Test (Limit 4). See
Appendix F for
contact check details.
• S/W LIMITS — Use this menu item to control, set limits for, and define out-
put bit patterns for LIM2, LIM3, and LIM5 through LIM12 tests:
– CONTROL — Use to ENABLE or DISABLE the test.
– LOLIM — Use to set the low limit and, for the grading mode, specify
the fail bit pattern (0-7; 3-bit; 0 to 15; 4-bit).
– HILIM — Use to set the high limit and, for the grading mode, specify
the fail bit pattern (0 to 7; 3-bit; 0 to 15; 4-bit).
• PASS — Use this menu item to dictate actions upon a PASS condition:
– DIG I/O PATTERN — Use this option item to define the digital output bit
pattern (0 to 7, 3-bit; 0 to 15, 4-bit). For the grading mode, it is the pass
pattern for the all tests pass condition. For the sorting mode, it is the
pass pattern for Limit 1 (compliance) when all other software limit tests
are disabled (0 to 7, 3-bit; 0 to 15, 4-bit).