User manual

2400 Series SourceMeter

User’s Manual Limit Testing 12-13

If the handler requires a a high-going or low-going EOT pulse, program SourceM-

eter for 3-bit operation and appropriate EOT mode.

NOTE The EOT and 3-bit modes are configured from the CONFIG LIMITS

MENU. See

“Configuring limit tests,” page 12-16.

Basic binning systems

Two basic binning systems are shown in Figure 12-7 and Figure 12-8. Both sys-

tems require a handler to physically place the device packages in the appropriate

bins. The handler is controlled by the SourceMeter via the Digital I/O port.

Single-element device binning

Figure 12-7 shows a basic binning system for single-element devices (i.e., resis-

tors). After all programmed testing on the DUT is completed, the pass/fail digital

output information is sent to the component handler, which then places the DUT in

the appropriate bin. The component handler selects the next DUT, and the testing

process is repeated.

Figure 12-7

Binning system single-element devices

Multiple-element device binning

Figure 12-8 shows a basic binning system to test three-element resistor networks.

Note that this system requires a scanner card that is installed in a switching main-

Handler

Dig

DUT

IN/OUT

SourceMeter

Dig

I/O