Datasheet

SMU INSTRUMENTS
www.keithley.com
1.888.KEITHLEY
(U.S. only)
A Greater Measure of Confidence
Automation for Speed
A SourceMeter SMU instrument streamlines production testing. It sources voltage or current while
making measurements without needing to change connections. It is designed for reliable operation
in non-stop production environments. To provide the throughput demanded by production applica-
tions, the SourceMeter SMU instrument offers many built-in features that allow it to run complex test
sequences without computer control or GPIB communications slowing things down.
Standard and Custom Sweeps
Sweep solutions greatly accelerate testing with
automation hooks. Three basic sweep waveforms
are provided that can be programmed for single-
event or continuous operation. They are ideal for
I/V, I/R, V/I, and V/R characterization.
• Linear Staircase Sweep: Moves from the start
level to the stop level in equal linear steps
• Logarithmic Staircase Sweep: Done on a
log scale with a specified number of steps
per decade
• Custom Sweep: Allows construction of
special sweeps by specifying the number of
measurement points and the source level at
each point
• Up to 1700 readings/second at 4½ digits to
the GPIB bus
• 5000 readings can be stored in the non-
volatile buffer memory
Built-In Test Sequencer
(Source Memory List)
The Source Memory list provides faster and
easier testing by allowing you to setup and
execute up to 100 different tests that run without
PC intervention.
• Stores up to 100 instrument configurations, each containing source settings, measurement
settings, pass/fail criteria, etc.
• Pass/fail limit test as fast as 500µs per point
• Onboard comparator eliminates the delay caused when sending data to the computer for analysis
• Built-in, user definable math functions to calculate derived parameters
Start
Start
Start
Bias
Bias
Bias
Bias
Bias
Bias
User
defined
steps
Stop
Stop
Stop
Linear staircase sweep
Logarithmic staircase sweep
Custom sweep
TYPICAL APPLICATIONS
Devices:
• Discrete semiconductor devices
• Passive devices
• Transient suppression devices
• ICs, RFICs, MMICs
• Laser diodes, laser diode
modules, LEDs, photodetectors
• Circuit protection devices: TVS,
MOV, Fuses, etc.
• Airbags
• Connectors, switches, relays
• High brightness LEDs
(DC and pulse)
Tests:
• Leakage
• Low voltage/resistances
• LIV
• IDDQ
• I-V characterization
• Isolation and trace resistance
• Temperature coefficient
• Forward voltage, reverse
breakdown, leakage current
• DC parametric test
• DC power source
• HIPOT
• Photovoltaic cell efficiency
(source and sink)
• Dielectric withstanding
Test Pass/Fail Test If Passes Test If Fails Test
Test 1 Check V
F1
at
100mA against
pass/fail limits
Go to Test 2
1. Bin part to bad bin
2. Transmit data to
computer while
handler is placing
new part
3. Return to Test 1
Test 2 Check V
F2
at 1A
against pass/fail
limits
Go to Test 3
Test 3 Check leakage
current at –500V
and test against
pass/fail limits
1. Bin part to good bin
2. Transmit readings to
computer while handler
is placing new part
3. Return to Test 1
Example Test Sequence
Test 3
Test 2
V
I
Test 1
I
R
V
F2
V
F1
Series 2400
SourceMeter
®
SMU Instruments
Tightly coupled precision sourcing and measurement Tightly coupled precision sourcing and measurement