User Manual

12-16 Limit Testing 2400 Series SourceMeter
®
User’s Manual
The pulse width (delay) of the pass/fail pattern can be set from 0 to 60sec (10µsec
resolution) as required by the component handler. Note that the delay specifies
the pulse width of line 4. The pulse width of lines 1, 2, and 3 is actually 20µsec
longer. Line 4 is skewed because it is used as the end-of-test (EOT) strobe by cat-
egory register component handlers. Lines 1, 2, and 3 establish the bit pattern and
then 10µsec later the SOT strobe tells the handler to read the bit pattern and per-
form the binning operation. This 10µsec offset is used to make sure the correct bit
pattern is read by the handler.
After the pass/fail is read by the handler, the digital output returns to the clear pat-
tern with auto-clear enabled.
Configuring and performing limit tests
Configuring limit tests
NOTE The Model 2401 does not use the digital output lines of the Digital I/O
port. Therefore it cannot be used with a handler to perform binning
operations. If using a Model 2401 for limit testing, ignore all actions and
information that pertain to binning.
Press CONFIG and then LIMIT to display the CONFIG LIMITS MENU. The limits
configuration menu is structured shown below and in Figure 12-10. Note that bul-
lets indicate the primary items of the limit menu and dashes indicate the options of
each menu or submenu item. Refer to Section 1, “Rules to navigate menus” to
configure the limit tests.
• DIGOUT — Use this menu item to control the following Digital I/O aspects:
– SIZE — Use to select 3-BIT or 4-BIT Digital I/O bit size. In the 3-BIT
mode, Digital I/O line 4 becomes the EOT, /EOT, BUSY, or /BUSY sig
-
nal depending on the selected END OF TEST mode. In the 4-BIT
mode, Digital I/O line 4 is controlled manually if the END OF TEST
mode is set to EOT.
– MODE — Use to select GRADING or SORTING mode:
In GRADING mode, a reading passes if it is within all of the HI/LO limit
tolerances enabled, assuming that it has passed the Contact Check
(contact check option only) and Compliance tests first. The Digital I/O
will be driven with the first pattern of the first Contact Check, Compli
-
ance, HI, or LO failure. Otherwise, the pass pattern will be output. In
GRADING mode, you will also choose bin control modes. With IMME
-
DIATE, the testing process will stop after the first failure and place the
fail pattern on the digital output. If none of the limit tests fail, the pass
pattern will be placed on the output, and the testing process will stop.
With END, the testing process will continue until the programmed
sweep is completed, regardless of how many failures occur. This