Brochure

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TEK.COM/KEITHLEY-SOURCE-MEASURE-UNITS
SPECIALTY SMUS FOR VERY LOW CURRENT
AND OPTOELECTRONICS TESTING
Remote Electrical Test
Head included
6430 Sub-femtoamp Remote
SourceMeter SMUInstrument
• 0.4fA p-p (4E–16A) noise (typical)
• >10
16
Ω input resistance on voltage measurements
• High speed — up to 2000 readings/second
• Up to 6½-digit resolution
• 0.012% basic voltage accuracy; 0.025% basic
current accuracy
2510 and 2510-AT TEC and Autotuning
TEC SourceMeter SMU Instruments
• 50 W TEC Controller combined with DC measurement functions
• Fully digital P-I-D control; Autotuning capability
for the thermal control loop (2510-AT)
• Designed to control temperature during laser diode
module testing
• Wide temperature setpoint range (–50˚C to +225˚C) and high
setpoint resolution (±0.001˚C) and stability (±0.005˚C)
• Compatible with a variety of temperature sensor
inputs: thermistors, RTDs, and IC sensors
2520 Pulsed Laser Diode Test System
• Integrated solution for in-process LIV production testing
of laser diodes at the chip or bar level
• Combines high accuracy source and measure capabilities
or pulsed and DC testing
• Synchronized DSP-based measurement channels ensure
highly accurate light intensity and voltage measurements
• Programmable pulse on time from 500ns to 5ms up to 4%
duty cycle
• Pulse capability up to 5A, DC capability up to 1 A
• 14-bit measurement accuracy on three measurement channels
(V
F
, front photodiode, back photodiode)
• Up to 1000-point sweep stored in buffer memory eliminates
GPIB trafc during test, increasing throughput
6430
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2510
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2520
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