Datasheet

© 2004 IXYS All rights reserved
2 - 3
20071004
DSEI 12-06A
IXYS reserves the right to change limits, test conditions and dimensions.
100 3000 200 400
0.0
0.1
0.2
0.3
0.4
0.5
0.001 0.01 0.1 1 10
0.0
0.5
1.0
1.5
2.0
2.5
0 40 80 120 160
0.2
0.4
0.6
0.8
1.0
1.2
1.4
K
f
T
VJ
[°C]
-di
F
/dt [A/µs]
t [s]
0 100 200 300 400
0
4
8
12
16
20
0
200
400
600
800
1000
V
FR
[V]
di
F
/dt [A/µs]
100 3000 200 400
5
15
25
0
10
20
1 10 100 1000
0.0
0.5
1.0
1.5
0 1 2 3
0
10
20
30
40
50
I
RM
[A]
Q
r
[µC]
I
F
[A]
V
F
[V]
-di
F
/dt [A/µs]
t
rr
[ns]
t
fr
[µs]
Z
thJC
[k/W]
DSEI 12-06A
-di
F
/dt [A/µs]
T
VJ
= 150°C
100°C
25°C
typ.
max
T
VJ
= 100°C
V
R
= 50 V
T
VJ
= 100°C
V
R
= 350 V
I
F
= 14 A
28 A
14 A
7 A
typ.
max
Q
r
I
RM
I
F
= 14 A
28 A
14 A
7 A
T
VJ
= 100°C
V
R
= 350 V
typ.
max
t
fr
V
FR
T
VJ
= 125°C
I
F
= 14 A
I
F
= 14 A
28 A
14 A
7 A
Fig. 1 Forward current
versus voltage drop
Fig. 2 Recovery charge
versus -di
F
/dt
Fig. 3 Peak reverse current
versus -di
F
/dt
Fig. 4 Dynamic parameters versus
junction temperature
Fig. 5 Recovery time versus -di
F
/dt
Fig. 7 Transient thermal resistance junction to case
Fig. 6 Peak forward voltage
versus di
F
/dt