Datasheet

Intel® Solid-State Drive DC S3500 Series (M.2)
5.0 References
The following table identifies the standards information referenced in this document.
Table 13: Standards References
Date
Title
Location
2013 PCI Express M.2 Specification, Revision 1.0
http://www.pcisig.com/specifications/pciex
press/M.2_Specification/
July 2012
Solid-State Drive (SSD) Requirements and Endurance Test
Method (JESD219)
http://www.jedec.org/standards-document
s/results/jesd219
Sept 2010
Solid-State Drive (SSD) Requirements and Endurance Test
Method (JESD218)
http://www.jedec.org/standards-document
s/docs/jesd218/
June 2009 RoHS*
http://qdms.intel.com/
Click Search MDDS Database and search
for material description datasheet
August 2009 ACS-2-ATA/ATAPI Command Set 2 Specification http://www.t13.org/
June 2009
Serial ATA Revision 3.0
http://www.sata-io.org/
Dec 2008
VCCI
http://www.vcci.jp/vcci_e/
May 2006
SFF-8223, 2.5-inch Drive w/Serial Attachment Connector
http://www.sffcommittee.org/
May 2005 SFF-8201, 2.5-inch drive form factor http://www.sffcommittee.org/
1995
1996
1995
1995
1997
1994
International Electrotechnical Commission EN 61000
4-2 (Electrostatic discharge immunity test)
4-3 (Radiated, radio-frequency, electromagnetic field immunity
test)
4-4 (Electrical fast transient/burst immunity test)
4-5 (Surge immunity test)
4-6 (Immunity to conducted disturbances, induced by radio-
frequency fields)
4-11 (Voltage Variations, voltage dips, short interruptions and
voltage variations immunity tests)
http://www.iec.ch/
1995 ENV 50204
(Radiated electromagnetic field from digital radio telephones)
http://www.dbicorporation.com/radimmun.
htm/
Product Specification Addendum January 2015
14 331061-002US