Datasheet

Intel® Solid-State Drive DC S3700 Series
5.5 Device Statistics
In addition to the SMART attribute structure, statistics pertaining to the operation and health of the
Intel SSD DC S3700 Series can be reported to the host on request through the Device Statistics log
as defined in the ATA specification.
The Device Statistics log is a read-only GPL/SMART log located at read log address 0x04 and is
accessible using READ LOG EXT, READ LOG DMA EXT or SMART READ LOG commands.
The following table lists the Device Statistics supported by the Intel SSD DC S3700 Series.
Table 20: Device Statistics Log
Page Offset Description
Equivalent SMART attribute
(if applicable)
0x00 -- List of Supported Pages --
0x01 – General Statistics
0x08
Power Cycle Count
0Ch
0x10 Power-On Hours 09h
0x18
Logical Sectors Written
E1h
0x20
Num Write Commands – incremented by one for
every host write
--
0x28
Logical Sectors Read
F2h
0x30
Num Read Commands – incremented by one for
every host read
--
0x04 – General Error Statistics
0x08 Num Reported Uncorrectable Errors BBh
0x10
Num Resets Between Command Acceptance and
Completion
--
0x05 – Temperature Statistics
0x00 Device Statistics Information Header --
0x08 Current Temperature --
0x10 Average Short Term Temperature --
0x18 Average Long Term Temperature --
0x20 Highest Temperature --
0x28 Lowest Temperature --
0x30 Highest Average Short Term Temperature --
0x38 Lowest Average Short Term Temperature --
0x40 Highest Average Long Term Temperature --
0x48 Lowest Average Long Term Temperature --
0x50 Time in Over-Temperature --
0x58 Specified Maximum Operating Temperature --
0x60 Time in Under-Temperature --
0x68 Specified Minimum Operating Temperature --
0x06 – Transport Statistics
0x08 Number of Hardware Resets --
0x10 Number of ASR Events --
0x18 Number of Interface CRC Errors --
0x07 – Solid State Device Statistics 0x08 Percentage Used Endurance Indicator
E9h
Note: This device statistic
counts from 1 to 150
January 2015 Product Specification
328171-010US 27