Datasheet

Intel
®
X25-E SATA Solid State Drive
May 2009 Product Manual
Order Number: 319984-005US 21
Intel
®
X25-E SATA SSD
7.0 References
This document references standards defined by a variety of organizations. Use the
following list to identify the location of an organization’s standards information.
Table 15. Standards References
Date or
Rev. #
Title Location
July 2007 RoHS
Search for material data declaration sheets at http://
intel.pcnalert.com
July 2007 SFF-8144, 1.8” drive form factor http://www.sffcommittee.org
June 2007 Intel Matrix Storage Manager http://support.intel.com/support/chipsets/imsm/
February 2007 Serial ATA Revision 2.6 http://www.sata-io.org
May 2006
SFF-8223, 2.5" Drive w/Serial Attachment
Connector
http://www.sffcommittee.org
May 2005 SFF-8201, 2.5” drive form factor http://www.sffcommittee.org
April 2004 ATA-6 spec http://www.t13.org/project/d1410r3b-ATA-ATAPI-6.pdf
April 2004 ATA-7 Volume 1
http://www.t13.org/Documents/UploadedDocuments/
docs2007/D1532v1r4b-AT_Attachment_with_Packet_
Interface_-_7_Volume_1.pdf
1995
1996
1995
1995
1996
1994
International Electrotechnical Commission
EN 61000-
4-2 Electromagnetic compatibility (EMC)
Part 4: Testing and Measurement
Techniques - Section 2: Electrostatic
Discharge Immunity Test
4-3 Electromagnetic compatibility (EMC)
Part 4: Testing and Measurement
Techniques - Section 3: Radiated,
Radio Frequency, Electromagnetic
Field Immunity Test
4-4 Electromagnetic compatibility (EMC)
Part 4: Testing and Measurement
Techniques - Section 4: Electrical Fast
Transient/Burst Immunity Test
4-5 Electromagnetic compatibility (EMC)
Part 4: Testing and Measurement
Techniques - Section 5: Surge
Immunity Test
4-6 Electromagnetic compatibility (EMC)
Part 4: Testing and Measurement
Techniques - Section 6: Immunity to
Conducted Disturbances, Induced by
Radio-Frequency Fields
4-11 Electromagnetic compatibility (EMC)
Part 4: Testing and Measurement
Techniques - Section 11: Voltage Dips,
Short Interruptions and Voltage
Variations Immunity Tests
http://www.iec.ch