User Manual

Intel
®
X25-V SATA SSD
Intel
®
X25-V SATA Solid State Drive
Advanced Product Manual January 2010
10 Order Number: 322736-002US
Intel
®
X25-V SATA SSD
3.4.4 Electromagnetic Immunity
Electromagnetic Immunity tests assume the SSD is properly installed in the
representative host system. The drive will operate properly without errors or
degradation in performance when subjected to radio frequency (RF) environments
referenced in the international specifications noted in these following documents:
3.5 Reliability
Note: Please refer to sections 3.5.1 to 3.5.4 for more details on these reliability specifications.
Table 10. Electromagnetic Immunity and Compliance Specifications
Title Description
Region for which
conformity declared
IEC 60950-1 - 1st Edition Safety of Information Technology Equipment International
UL/CSA 60950-1 Edition Safety of Information Technology Equipment USA/Canada
EN 60950-1:2001 Safety of Information Technology Equipment European Union
cTick The EMC Framework (Radio Communication Act 1992) Australia
FCC, 47 CFR Part 15
Radio Frequency Devices - Subpart B - Unintentional
Radiators B
USA
ICES-003 Issue 4 - February 2004
Interface-Causing Equipment Standards - Digital Apparatus
B
Canada
BSMI CNS14348; CNS14266
Bureau of Standards, Metrology and Inspection, Ministry of
Economic Affairs Electromagnetic Compatibility
Taiwan
EN 55022 and 55024
EN 55022:2006 Information Technology Equipment - Radio
Disturbance Characteristics B;
EN 55024:1998 +A1:2001 +A2:2003 Information
Technology Equipment - Immunity Characteristics
European Union
CISPR 22:2005
Information Technology Equipment - Radio Disturbance
Characteristics B
International
EN61000
EN61000-3-2 Information Technology Equipment -
Harmonics Characteristics;EN61000-3-3 Information
Technology Equipment - Flicker Characteristics
European Union
VCCI CISPR22 B
Information Technology Equipment - Radio Disturbance
Characteristics
Japan
KCC
Framework Act on Telecommunications and Radio Waves
Act
Korea
Table 11. Reliability Specifications
Parameter Value
Nonrecoverable read errors 1 sector in 10
16
bits read, max
Mean Time between Failure (MTBF) 1,200,000 hours
Power On/Off Cycles 50,000 cycles
Minimum Useful Life 5 years
Insertion Cycles 250 cycles