Tested Memory

The Intel
®
Server Boards S5000PSL, S5000XSL, and S5000XVN, Intel
®
Server Board S5000PSLROMB RAID
Controller, and Intel
®
Storage System SSR212MC2
Overview of Memory Testing
1. Overview of Memory Testing
The following test processes are used to qualify Dual In-Line Memory Modules (DIMMs) for use with the
Intel
®
Server Boards S5000PSL, S5000XSL, and S5000XVN, the Intel
®
Server Board S5000PSLROMB
RAID Controller, and the Intel
®
Storage System SSR212MC2. Memory is a vital subsystem in a server.
Intel requires that strict guidelines be met before a DIMM vendor is added to the Tested Memory Report.
To be included on the list as a fully supported DIMM, the memory must undergo rigorous tests to ensure
that the product will perform the intended server product functions. Memory qualification for Intel server,
workstation and RAID controller products is performed both by Intel’s Memory Validation Lab (MVL) and
by an independent external test lab, Computer Memory Test Lab* (CMTL).
Note: This tested memory list applies to all product codes in the Intel
®
Server Board
S5000PSL/S5000XSL/S5000XVN family.
The Tested Memory Lists for Intel’s server boards, workstation boards, and RAID controller products
categorize memory modules as Advanced Tested. The Advanced Testing process includes a standard
paper qualification and then is followed by two levels of functional testing. DIMMs that have completed
and passed Advanced Testing are considered to be compatible with the product on which they were
tested, and with the test software and operating systems that was used during the test process.
Note: Memory qualification for main memory is done by testing identical memory modules in all DIMM
slots. Memory qualification does not include testing of mixed DIMM type and/or vendors. Mixing of DIMM
type and/or vendors is not recommended.
1.1 Paper Qualification
A paper qualification is performed to verify that the specifications of a given DIMM meet Intel’s memory
specifications for a given product. Specification criteria reviewed include: critical timings, electrical
characteristics, timing requirements, environmental requirements, and packaging requirements.
1.2 Functional Testing
After a given DIMM passes the standard paper qualification, functionality of the DIMM is then tested with
the intended Intel product. Two levels of functional testing are performed; standard and advanced.
Standard functional testing requires that the given DIMM and Intel product combination operate with no
failures for a period of no less than 24 hours for both minimum and maximum DIMM configurations.
Testing is performed using a Microsoft Windows* operating system and a custom test package. The test
systems operate with standard voltage and at room temperature.
1.3 Advanced Functional Testing
Advanced functional testing requires that the given DIMM and Intel product combination operate with no
failures for a period of no less than 24 hours for both minimum and maximum DIMM configurations.
Testing is performed with multiple operating systems and various custom test packages. Each test
configuration is tested with various voltage and temperature margin conditions.