Datasheet
30 Datasheet
Electrical Specifications
Table 2-12. PWRGOOD Input and TAP Signal Group DC Specifications
Symbol Parameter Min Max Unit Notes
1, 2
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. All outputs are open drain.
V
HYS
Input Hysteresis 200 350 mV
3
3. V
HYS
represents the amount of hysteresis, nominally centered about 0.5 * V
TT
, for all TAP inputs.
V
T
+
Input low to high
threshold voltage
0.5 * (V
TT
+ V
HYS_MIN
) 0.5 * (V
TT
+ V
HYS_MAX
)V
4
4. The V
TT
referred to in these specifications refers to instantaneous V
TT
.
V
T
-
Input high to low
threshold voltage
0.5 * (V
TT
–
V
HYS_MAX
) 0.5 * (V
TT
– V
HYS_MIN
)V
4
V
OH
Output High Voltage N/A V
TT
V
4
I
OL
Output Low Current - 45 mA
5
5. The maximum output current is based on maximum current handling capability of the buffer and is not specified into the test
load.
I
LI
Input Leakage Current - ± 200 µA
6
6. Leakage to V
SS
with land held at V
TT
.
I
LO
Output Leakage
Current
-± 200µA
6
R
ON
Buffer On Resistance 7 12 Ω
Table 2-13. GTL+ Asynchronous Signal Group DC Specifications
Symbol Parameter Min Max Unit Notes
1
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
V
IL
Input Low Voltage 0.0 V
TT
/2 – (0.10 * V
TT
)-
2, 3
2. V
IL
is defined as the voltage range at a receiving agent that will be interpreted as a logical low value.
3. LINT0/INTR, LINT1/NMI, and FORCEPR# use GTLREF as a reference voltage. For these two signals,
V
IH
= GTLREF + (0.10 * VTT) and V
IL
= GTLREF – (0.10 * VTT).
V
IH
Input High Voltage V
TT
/2 + (0.10 * V
TT
)V
TT
-
3, 4, 5, 6
4. V
IH
is defined as the voltage range at a receiving agent that will be interpreted as a logical high value.
5. V
IH
and V
OH
may experience excursions above V
TT
.
6. The V
TT referred to in these specifications refers to instantaneous V
TT
.
V
OH
Output High Voltage 0.90*V
TT
V
TT
V
5, 6,
7
7. All outputs are open drain.
I
OL
Output Low Current —
V
TT
/[(0.50*R
TT_MIN
) +
R
ON_MIN
]
A
8
8. The maximum output current is based on maximum current handling capability of the buffer and is not specified into the test
load.
I
LI
Input Leakage Current N/A ± 200 µA
9
9. Leakage to V
SS
with land held at V
TT
.
I
LO
Output Leakage
Current
N/A ± 200 µA
10
10. Leakage to V
TT
with land held at 300 mV.
R
ON
Buffer On Resistance 8 12 Ω