Datasheet

Datasheet 31
Electrical Specifications
NOTES:
1. V
OS
is the measured overshoot voltage.
2. T
OS
is the measured time duration above VID.
2.13.2 Die Voltage Validation
Core voltage (VCC) overshoot events at the processor must meet the specifications in
Table 2-17 when measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands
and across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Overshoot events that
are < 10 ns in duration may be ignored. These measurements of processor die level
overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.
Figure 2-4. V
CC
Overshoot Example Waveform
Example Overshoot Waveform
0 5 10 15 20 25
Time [us]
Voltage [V]
VID - 0.000
VID + 0.050
V
OS
T
OS
T
OS
: Overshoot time above VID
V
OS
: Overshoot above VID