Datasheet

Figure 4. V
CCIN
Static and Transient Tolerance Loadlines
Die Voltage Validation
Overshoot events at the processor must meet the specifications in Table 16 on page
35 when measured across the V
CCIN_SENSE
and V
SS_VCCIN_SENSE
lands. Overshoot
events that are < 10 ns in duration may be ignored. These measurements of
processor die level overshoot should be taken with a 100 MHz bandwidth limited
oscilloscope.
V
CCIN
Overshoot Specifications
The Intel
®
Xeon
®
processor E5-1600 and E5-2600 v3 product families can tolerate
short transient overshoot events where V
CCIN
exceeds the VID voltage when
transitioning from a high-to-low current load condition. This overshoot cannot exceed
VID + V
OS_MAX
(V
OS_MAX
is the maximum allowable overshoot above VID). These
specifications apply to the processor die voltage as measured across the V
CCIN_SENSE
and V
SS_VCCIN_SENSE
lands.
Table 16. V
CCIN
Overshoot Specifications
Symbol Parameter Min Max Units Figure Notes
V
OS_MAX
Magnitude of V
CCIN
overshoot above VID 50 mV Figure 5 on page 36
T
OS_MAX
Time duration of V
CCIN
overshoot above
V
CCIN_Max
value at the new lighter load
25 µs Figure 5 on page 36
2.9.2
Electrical Specifications—Intel
®
Xeon
®
Processor E5-1600 and E5-2600 v3 Product Families
Intel
®
Xeon
®
Processor E5-1600 and E5-2600 v3 Product Families, Volume 1 of 2, Electrical
September 2014 Datasheet
Order No.: 330783-001 35