Datasheet

Intel® Xeon® Processor E5-2400 v3 Product Family 29
Datasheet Volume One
Electrical Specifications
2.9.3 Die Voltage Validation
V
CCIN
overshoot events at the processor must meet the specifications in Table 2-13
when measured across the VCCIN_SENSE and VSS_VCCIN_SENSE lands. Overshoot
events that are < 10 ns in duration may be ignored. These measurements of processor
die level overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.
2.9.3.1 V
CCIN
Overshoot Specifications
The processor can tolerate short transient overshoot events where V
CCIN
exceeds the
VID voltage when transitioning from a high-to-low current load condition. This
overshoot cannot exceed VID + V
OS_MAX
(V
OS_MAX
is the maximum allowable overshoot
above VID). These specifications apply to the processor die voltage as measured across
the VCCIN_SENSE and VSS_VCCIN_SENSE lands.
Figure 2-2. V
CCIN
Static and Transient Tolerance Loadlines
Table 2-13. V
CCIN
Overshoot Specifications
Symbol Parameter Max Units Figure Notes
V
OS_MAX
Magnitude of V
CCIN
overshoot above VID 75 mV 2-3
T
OS_MAX
Time duration of V
CCIN
overshoot above V
CCIN_MAX
value at the new
lighter load
25 μs 2-3