Datasheet

Intel® Xeon® Processor E5-2400 v3 Product Family 25
Datasheet Volume One
Electrical Specifications
specifications equal to the FMB value in the foreseeable future. System designers
should meet the FMB values to ensure their systems will be compatible with future
processors.
2.8 Absolute Maximum and Minimum Ratings
Table 2-8 specifies absolute maximum and minimum ratings. At conditions outside
functional operation condition limits, but within absolute maximum and minimum
ratings, neither functionality nor long-term reliability can be expected. If a device is
returned to conditions within functional operation limits after having been subjected to
conditions outside these limits, but within the absolute maximum and minimum
ratings, the device may be functional, but with its lifetime degraded depending on
exposure to conditions exceeding the functional operation condition limits.
Although the processor contains protective circuitry to resist damage from Electro-
Static Discharge (ESD), precautions should always be taken to avoid high static
voltages or electric fields.
Notes:
1. For functional operation, all processor electrical, signal quality, mechanical, and thermal specifications must
be satisfied.
2. Overshoot and undershoot voltage guidelines for input, output, and I/O signals are outlined. Excessive
overshoot or undershoot on any signal will likely result in permanent damage to the processor.
2.8.1 Storage Condition Specifications
Environmental storage condition limits define the temperature and relative humidity
limits to which the device is exposed to while being stored in a Moisture Barrier Bag.
The specified storage conditions are for component level prior to board attach (see
notes in Table 2-9 for post board attach limits).
Table 2-9 specifies absolute maximum and minimum storage temperature limits which
represent the maximum or minimum device condition beyond which damage, latent or
otherwise, may occur. The table also specifies sustained storage temperature, relative
humidity, and time-duration limits. These limits specify the maximum or minimum
device storage conditions for a sustained period of time. At conditions outside sustained
limits, but within absolute maximum and minimum ratings, quality & reliability may be
affected.
Table 2-8. Processor Absolute Minimum and Maximum Ratings
Symbol Parameter Min Max Unit
V
CCIN
Integrated Voltage Regulator voltage with respect to V
SS
-0.3 1.98 V
V
CCD
Processor I/O supply voltage for DDR3 (standard voltage) with
respect to V
SS
-0.3 1.85 V
V
CCDL
Processor I/O supply voltage for DDR3L (Low Voltage) with
respect to V
SS
-0.3 1.7 V
V
CCIO_IN
Processor I/O voltage with respect to V
SS
-0.3 1.4 V
V
CCPECI
Processor PECI voltage with respect to V
SS
-0.3 1.4 V
Table 2-9. Storage Condition Ratings (Sheet 1 of 2)
Symbol Parameter Min Max Unit
T
absolute storage
The minimum/maximum device storage temperature beyond
which damage (latent or otherwise) may occur when
subjected to for any length of time.
-25 125 °C