Intel Celeron Processor in the 478-Pin Package at 1.80 GHz Datasheet

Datasheet 45
Intel
®
Celeron
®
Processor in the 478-Pin Package
3.2.1.5 Determining if a System Meets the Over/Undershoot Specifications
The overshoot/undershoot specifications listed in the following tables specify the allowable
overshoot/undershoot for a single overshoot/undershoot event. However most systems will have
multiple overshoot and/or undershoot events that each have their own set of parameters (duration,
AF and magnitude). While each overshoot on its own may meet the overshoot specification, when
you add the total impact of all overshoot events, the system may fail. A guideline to ensure a
system passes the overshoot and undershoot specifications is shown below. Results from
simulation may also be evaluated by utilizing the Intel
®
Pentium
®
4 Processor in the 478-pin
Package Overshoot Checker through the use of time-voltage data files.
Ensure no signal ever exceeds VCC_MAX or 0.25 V OR
If only one overshoot/undershoot event magnitude occurs, ensure it meets the over/undershoot
specifications in the following tables OR
If multiple overshoots and/or multiple undershoots occur, measure the worst case pulse
duration for each magnitude and compare the results against the AF = 1 specifications. If all of
these worst case overshoot or undershoot events meet the specifications (measured time <
specifications) in the table (where AF=1), then the system passes.
Notes: The following notes apply to Table 22 through Table 25.
1. Absolute Maximum Overshoot magnitude of 2.3 V must never be exceeded.
2. Absolute Maximum Overshoot is measured relative to V
SS, Pulse Duration of overshoot is
measured relative to V
CC.
3. Absolute Maximum Undershoot and Pulse Duration of undershoot is measured relative to
V
CC.
4. Ringback below V
CC can not be subtracted from overshoots/undershoots.
5. Lesser undershoot does not allocate longer or larger overshoot.
6. OEMs are strongly encouraged to follow Intel provided layout guidelines.
7. All values specified by design characterization.