Datasheet

Processor Uncore Configuration Registers
236 Datasheet, Volume 2
4.9.11 MC_TEST_EP_SCCTL
Memory test electrical parameter scan chain control register.
4.9.12 MC_TEST_EP_SCD
Memory test electrical parameter scan chain data register.
Device: 3
Function: 4
Offset: F8h
Access as a DWord
Bit Attr Default Description
31 RW1S 0
SCAN_READ
Perform a scan chain read.
30 RW1S 0
SCAN_WRITE
Perform a san chain write.
29:16 RO 0 Reserved
15:0 RW 0
SCAN_OFFSET
Shift count to perform upon next shift command.
Device: 3
Function: 4
Offset: FCh
Access as a DWord
Bit Attr Default Description
31:0 RW 0
DATA
Contains the data written to or read from the scan chain.