Datasheet

Processor Uncore Configuration Registers
234 Datasheet, Volume 2
4.9.7 MC_TEST_PAT_GCTR
Pattern Generator Control.
Device: 3
Function: 4
Offset: A8h
Access as a DWord
Bit Attr Default Description
31:29 RO 0 Reserved
28:24 RW 6
EXP_LOOP_CNT
Sets the length of the test, defined as 2^(EXP_LOOP_CNT).
23:22 RO 0 Reserved
21 RW 0
ERROR_COUNT_STALL
Masks all detected errors until cleared.
20 RW1S 0
STOP_TEST
Force exit from Loopback.Pattern.
19 RW 0
DRIVE_DC_ZERO
Drive 0 on lanes with PAT_DCD asserted.
18:14 RO 0 Reserved
13:12 RW 0
PATBUF_WD_SEL
Select word within pattern buffer to be written.
11 RO 0 Reserved
10:9 RW 0
PATBUF_SEL
Select which pattern buffer will be written when MC_TEST_PAT_BA is written.
8:6 RO 0 Reserved
5RW 0
IGN_REM_PARAM
Slave will ignore remote parameters transmitted in Loopback.Marker.
4RW 0
ENABLE_LFSR2
Use scrambled output of Pattern Buffer 2.
3RW 0
ENABLE_LFSR1
Use scrambled output of Pattern Buffer 1.
2RW 1
ENABLE_AUTOINV
Inversion pattern register will rotate automatically once per loop.
1RW 0
STOP_ON_ERROR
Exit Loopback.Pattern upon first detected error.
0RW1S 0
START_TEST
Initiate transition to Loopback.Pattern.