Datasheet

TLE7269G
Application Information
Data Sheet 28 Rev. 1.2, 2007-11-13
7 Application Information
7.1 ESD Robustness according to IEC61000-4-2
Test for ESD robustness according to IEC61000-4-2 “Gun test” (150 pF, 330 Ω) have been performed. The results
and test conditions are available in a separate test report.
7.2 Pin Compatibility to the Single LIN Transceivers
The Twin LIN Transceiver TLE7269G is pin and function compatible to the Single LIN Transceivers like the
TLE7259G, the TLE7259-2GE and its derivative the TLE7259-2GU. The TLE7269G has a pin for the
V
IO
supply.
This supply pin is usually connected to the power supply of the external microcontroller. The TLE7259G and the
TLE7259-2GE/U don’t have a
V
IO
pin. In order to provide the same functions on the TLE7259G and TLE7259-
2GE/GU, these two LIN transceiver need an external pull-up resistor between the RxD pin and the microcontroller
supply.
Figure 16 Pin configuration TLE7269G and TLE7259G, TLE7259-2GE/GU
Table 8 ESD Robustness according to IEC61000-4-2
Performed Test Result Unit Remarks
Electrostatic discharge voltage at pin
V
S
, BUS1
and BUS2 versus GND
≥ +9 kV
1)
Positive pulse
1) ESD susceptibility “ESD GUN” according LIN EMC 1.3 Test Specification, Section 4.3. (IEC 61000-4-2) -Tested by external
test house (IBEE Zwickau, EMC Testreport Nr. 05-06-06).
Electrostatic discharge voltage at pin V
S
, BUS1
and BUS2 versus GND
≤ -9 kV
1)
Negative pulse
Electrostatic discharge voltage at pin WK versus
GND
≥ +8 kV
1)
Positive pulse
Electrostatic discharge voltage at pin WK versus
GND
≤ -8 kV
1)
Negative pulse
RxD1 1
2
3
4
5
6
78
EN
WK
TxD1
INH1
V
S
BUS1
GND
TxD2
V
IO
RxD2
BUS2
W2O
INH2
9
10
11
12
13
14
RxD
1
2
3
45
6
7
8
EN
WK
TxD
INH
V
S
BUS
GND
TLE7259G
TLE7259-2GE
TLE7259-2GU
and other single LIN
transceivers
TLE7269G