Datasheet

Data Sheet 24 Rev. 1.5, 2013-07-26
TLE7259-2GE
Application Information
7 Application Information
7.1 ESD Robustness according to IEC61000-4-2
Test for ESD robustness according to IEC61000-4-2 “Gun test” (150 pF, 330 Ω) have been performed. The results
and test conditions are available in a separate test report.
7.2 Pin Compatibility to other LIN Transceivers
The LIN Transceiver TLE7259-2GE is pin and function compatible to the Single LIN Transceivers like the
TLE7259G, the TLE7259-2GU and other single LIN Transceivers on the market. The TLE7259-2GE has no
V
IO
supply pin. Therefore the TLE7259-2GE needs a pull-up resistor to the external microcontroller supply. The
TLE7259-2GE can also be used on a PCB design for the Twin LIN TLE7269G. Since the TLE7269G doesn’t need
a pull-up resistor on the RxD pin, a pull-up resistor to the external microcontroller needs to be added to get the
same functionality.
Figure 14 Pin configuration TLE7259-2GE, TLE7259-2GU, TLE7259G and TLE7269G
Table 7 ESD Robustness according to IEC61000-4-2
Performed Test Result Unit Remarks
Electrostatic discharge voltage at pin V
S
, BUS versus GND ≥ 11 kV
1)
Positive pulse
1) ESD susceptibility “ESD GUN” according LIN EMC 1.3 Test Specification, Section 4.3. (IEC 61000-4-2) -Tested by external
test house.
Electrostatic discharge voltage at pin V
S
, BUS versus GND ≤ -11 kV
1)
Negative pulse
Electrostatic discharge voltage at pin WK versus GND
≥ 9kV
1)
Positive pulse
Electrostatic discharge voltage at pin WK versus GND
≤ -9 kV
1)
Negative pulse
RxD1
1
2
3
4
5
6
78
EN
WK
TxD1
INH1
V
S
BUS1
GND
TxD2
V
IO
RxD2
BUS2
W2O
INH2
9
10
11
12
13
14
RxD
1
2
3
45
6
7
8
EN
WK
TxD
INH
V
S
BUS
GND
TLE7259G
TLE7259-2GE
TLE7259-2GU
and other single LIN
transceivers
TLE7269G