Datasheet

Data Sheet 16 Rev. 1.5, 2013-07-26
TLE7259-2GE
General Product Characteristics
5 General Product Characteristics
5.1 Absolute Maximum Ratings
Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Note: Integrated protection functions are designed to prevent IC destruction under fault conditions described in the
data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are
not designed for continuous repetitive operation.
Table 3 Absolute Maximum Ratings Voltages, Currents and Temperatures
1)
All voltages with respect to ground; positive current flowing into pin;
(unless otherwise specified)
Pos. Parameter Symbol Limit Values Unit Remarks
Min. Max.
Voltages
5.1.1 Battery supply voltage V
S
-0.3 40 V LIN Spec 2.2A (Par. 11)
5.1.2 Bus and WK input voltage
versus GND
versus
V
S
V
BUS,G
V
BUS,Vs
-40
-40
40
40
V
V
–
5.1.3 Logic voltages at EN, TxD,
RxD
V
logic
-0.3 5.5 V –
5.1.4 INH Voltage
versus GND
versus
V
S
V
INH,G
V
INH, Vs
-0.3
-40
40
0.3
V
V
–
Currents
5.1.5 Output current at INH I
INH
-150 80 mA
2)
Temperatures
5.1.6 Junction temperature T
j
-40 150 °C–
5.1.7 Storage temperature
T
s
-55 150 °C–
ESD Resistivity
5.1.8 Electrostatic discharge
voltage at
V
S
, Bus, WK
versus GND
V
ESD
-6 6 kV Human Body Model
(100pF via 1.5 k
Ω)
3)
5.1.9 Electrostatic discharge
voltage all pins
V
ESD
-2 2 kV Human Body Model
(100pF via 1.5 k
Ω)
3)
1) Not subject to production test, specified by design
2) Output current is internally limited to -150 mA
3) ESD susceptibility HBM according to EIA / JESD 22-A 114