Datasheet

Data Sheet 32 Rev. 1.1, 2011-06-06
TLE6251-3G
Application Information
11.2 ESD Robustness according to IEC61000-4-2
Test for ESD robustness according to IEC61000-4-2 “Gun test” (150 pF, 330 Ω) have been performed. The results
and test conditions are available in a separate test report.
11.3 Voltage Drop over the INH Output
Figure 17 INH output voltage drop versus output current (typical values only!)
Table 8 ESD Robustness according to IEC61000-4-2
Performed Test Result Unit Remarks
Electrostatic discharge voltage at pin
V
S
, CANH,
CANL and WK versus GND
≥ 9kV
1)
Positive pulse
1) ESD susceptibility “ESD GUN” according to “Gift ICT Evaluation of CAN Transceiver “Section 4.3. (IEC 61000-4-2:
2001-12) -Tested by external test house (IBEE Zwickau, EMC Testreport Nr. 07a-04-09 referenced to the TLE6251-2G).
Electrostatic discharge voltage at pin V
S
, CANH,
CANL and WK versus GND
≤ −9kV
1)
Negative pulse
Voltage Drop on the INH output pin
0,00
1,00
0,00 1,00 2,00 3,00 4,00 5,00
INH Output Current (mA)
Voltage Drop (V)
T
J
= 150°C
T
J
= 25°C
T
J
= -40°C