2012-08-21
4
SMBT3904...MMBT3904
Test circuits
Delay and rise time
EHN00061
275
10 k
+3.0 V
0
-0.5 V
<4.0 pF
C
+10.9 V
D = 2%300 ns
<1.0 ns
Ω
Ω
Storage and fall time
EHN00062
275
10
+3.0 V
0
-9.1
<4.0 pF
C
+10.9 V
D = 2%
1N916
<1.0
t
1
µs50010 t
1
Ω
Ω
V
k
ns
<<
