Datasheet
IRFP4868PbF
7 www.irf.com © 2012 International Rectifier October 30, 2012
Fig 21. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs
Fig 22b. Unclamped Inductive Waveforms
Fig 22a. Unclamped Inductive Test Circuit
Fig 23a. Switching Time Test Circuit
Fig 23b. Switching Time Waveforms
Fig 24a. Gate Charge Test Circuit
Fig 24b. Gate Charge Waveform