Datasheet
Data Sheet Rev. 1.4 7 2008-07-10
HITFET
BSP 75N
EMC-Characteristics
The following EMC-Characteristics outline the behavior of typical devices. They are not
part of any production test.
Table 1Test Conditions
Parameter Symbol Value Unit Remark
Temperature T
A
23 ±5 °C –
Supply Voltage V
S
13.5 V –
Load R
L
27 Ω ohmic
Operation mode PWM
DC
–
–
–
–
f
INx
=100Hz, D=0.5
ON / OFF
DUT specific V
IN
(’HIGH’)=5V
Fast electrical transients
acc. to ISO 7637
1)
The test pulses are applied at V
S
Test
1)
Pulse
1 -200V C C 500ms ; 10Ω
2 +200V C C 500ms ; 10Ω
3a -200V C C 100ms ; 50Ω
3b +200V C C 100ms ; 50Ω
4 -7V C C 0.01Ω
5 175V E(65V) E(75V) 400ms ; 2Ω
Definition of functional status
Class Content
C All functions of the device are performed as designed after exposure to
disturbance.
E One or more function of a device does not perform as designed after
exposure and can not be returned to proper operation without repairing
or replacing the device. The value after the character shows the limit.
Max.
Test
Level
Test Result
Pulse Cycle Time
and Generator
Impedance
OUT
x
stressed
ON OFF










