Datasheet
Table Of Contents
- Description
- Features
- Ordering Information
- Key Parameters
- Speed Grade
- Address Table
- Pin Descriptions
- Input/Output Functional Descriptions
- Pin Assignments
- Registering Clock Driver Specifications
- On DIMM Thermal Sensor
- Functional Block Diagram
- 4GB, 512Mx72 Module(1Rank of x8)
- 8GB, 1Gx72 Module(1Rank of x4) - page1
- 8GB, 1Gx72 Module(1Rank of x4) - page2
- 8GB, 1Gx72 Module(2Rank of x8) - page1
- 8GB, 1Gx72(2Rank of x8) - page2
- 16GB, 2Gx72 Module(2Rank of x4) - page1
- 16GB, 2Gx72 Module(2Rank of x4) - page2
- 16GB, 2Gx72 Module(2Rank of x4) - page3
- 32GB, 4Gx72 Module(4Rank of x4) - page1
- 32GB, 4Gx72 Module(4Rank of x4) - page2
- 32GB, 4Gx72 Module(4Rank of x4) - page3
- 32GB, 4Gx72 Module(4Rank of x4) - page4
- 32GB, 4Gx72 Module(4Rank of x4) - page5
- Absolute Maximum Ratings
- AC & DC Operating Conditions
- AC & DC Input Measurement Levels
- Vref Tolerances
- AC and DC Logic Input Levels for Differential Signals
- Differential signal definition
- Differential swing requirements for clock (CK - CK) and strobe (DQS-DQS)
- note : Rising input differential signal shall become equal to or greater than VIHdiff(ac) level and Falling input differential signal shall become equal to or less than VIL(ac) level.
- Single-ended requirements for differential signals
- Differential Input Cross Point Voltage
- Slew Rate Definitions for Single-Ended Input Signals
- Slew Rate Definitions for Differential Input Signals
- AC & DC Output Measurement Levels
- Overshoot and Undershoot Specifications
- Refresh parameters by device density
- Standard Speed Bins
- Environmental Parameters
- IDD and IDDQ Specification Parameters and Test Conditions
- IDD Specifications (Tcase: 0 to 95oC)
- Module Dimensions
Rev. 1.0 / May. 2014 55
a) Burst Length: BL8 fixed by MRS: set MR0 A[1,0]=00B
b) Output Buffer Enable: set MR1 A[12] = 0B; set MR1 A[5,1] = 01B; RTT_Nom enable: set MR1 A[9,6,2] = 011B;
RTT_Wr enable: set MR2 A[10,9] = 10B
c) Precharge Power Down Mode: set MR0 A12=0B for Slow Exit or MR0 A12 = 1B for Fast Exit
d) Auto Self-Refresh (ASR): set MR2 A6 = 0B to disable
e) Self-Refresh Temperature Range (SRT): set MR2 A7 = 0B for normal or 1B for extended temperature range
f) Read Burst Type: Nibble Sequential, set MR0 A[3] = 0B
I
DD7
Operating Bank Interleave Read Current
CKE: High; External clock: On; tCK, nRC, nRAS, nRCD, NRRD, nFAW, CL: see Table 1; BL: 8
a),f)
; AL: CL-1; CS:
High between ACT and RDA; Command, Address, Bank Address Inputs: partially toggling according to Table
10; Data IO: read data burst with different data between one burst and the next one according to Table 10;
DM: stable at 0; Bank Activity: two times interleaved cycling through banks (0, 1,...7) with different address-
ing, wee Table 10; Output Buffer and RTT: Enabled in Mode Registers
b)
; ODT Signal: stable at 0; Pattern
Details: see Table 10.
Symbol Description