Datasheet

Rev. 0.3 / Dec. 2009 11
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
OUTPUT BUFFER LEVELS
OUTPUT AC TEST CONDITIONS
Notes:
1. The VDDQ of the device under test is referenced.
OUTPUT DC CURRENT DRIVE
Notes:
1. V
DDQ
= 1.7 V; V
OUT
= 1420 mV. (V
OUT
- V
DDQ
)/I
OH
must be less than 21 ohm for values of V
OUT
between V
DDQ
and
V
DDQ
- 280 mV.
2. V
DDQ
= 1.7 V; V
OUT
= 280 mV. V
OUT
/I
OL
must be less than 21 ohm for values of V
OUT
between 0 V and 280 mV.
3. The dc value of V
REF
applied to the receiving device is set to V
TT
4. The values of I
OH
(dc) and I
OL
(dc) are based on the conditions given in Notes 1 and 2. They are used to test device
drive current capability to ensure V
IH
min plus a noise margin and V
IL
max minus a noise margin are delivered to an
SSTL_18 receiver.
The actual current values are derived by shifting the desired driver operating point along a 21 ohm load line to define
a convenient driver current for measurement.
Symbol Parameter SSTL_18 Units Notes
V
OTR
Output Timing Measurement Reference Level 0.5 * V
DDQ
V1
Symbol Parameter SSTl_18 Units Notes
I
OH(dc)
Output Minimum Source DC Current - 13.4 mA 1, 3, 4
I
OL(dc)
Output Minimum Sink DC Current 13.4 mA 2, 3, 4