User’s Guide HP 8753E Network Analyzer HP Rut No.
Notice. The information contained in this document is subject to change without notice. Hewlett-Packard makes no warranty of any kind with regard to this material, including but not limited to, the implied warranties of merchantability and fitness for a particular purpose. Hewlett-Packard shall not be liable for errors contained herein or for incidental or consequential damages in connection with the furnishing, performance, or use of this material.
Certification Hewlett-Packard Company certifies that this product met its published specifications at the time of shipment from the factory. Hewlett-Packard further certifies that its calibration measurements are traceable to the United States National Institute of Standards and ‘lbchnology, to the extent allowed by the Institute’s calibration facility, and to the calibration facilities of other International Standards Organization members.
Maintenance Clean the cabinet, using a damp cloth only. Assistance Product maintenance agreements and other customer assktmm agremnmts are available for Hewlett-&hrd products Rw an@ assistance, wnmct gour nearest Hewlett-Rzchmd Saks and Service Om Shipment for Service If you are sending the instrument to Hewlett-Packard for service, ship the analyzer to the nearest HP service center for repair, including a description of any failed test and any error message.
‘Iktble O-1. Hewlett-Packard Sales and Service OfEces UNITED STATES Instrument Support Center Hewlett-Packard Company (800) 403-0801 EUROPEAN FIELD OPEEA!l’IONS Headquarters Hewlett-Packard S.A. 150, Route du Nantd’Avril 1217 Meyrin Z/Geneva &vi&&and (41 22) 780.8111 Great Britah Hewlett-Packard Ltd.
Safety Symbols The following safety symbols are used throughout this manual. Familiarize yourself with each of the symbols and its meaning before operating this instrument. Caution Caution denotes a hazard. It calls attention to a procedure that, if not correctly performed or adhered to, would result in damage to or destruction of the instrument. Do not proceed beyond a caution note until the indicated conditions are fully understood and met. Warning Rkning denotes a hazard.
General Safety Considerations Note This instrument has been designed and tested in accordance with IEC Publication 1010, Safety Requirements for Electronics Measuring Apparatus, and has been supplied in a safe condition. This instruction documentation contains information and warnings which must be followed by the user to ensure safe operation and to maintain the instrument in a safe condition.
Caution This product is designed for use in Installation Category II and Pollution Degree 2 per IEC 1010 and 664 respectively. Caution VENTILATION REQUIREMENTS: When instaIling the product in a cabinet, the convection into and out of the product must not be restricted. The ambient temperature (outside the cabinet) must be less than the maximum operating temperature of the product by 4O C for every 100 watts dissipated in the cabinet.
User’s Guide Overview n n n Chapter 1, “HP 8753E Description and Options, n describes features, functions, and available options. Chapter 2, “Making Measurements,” contains step-by-step procedures for making measurements or using particular functions. Chapter 3, “Making Mixer Measurements, n contains step-by-step procedures for making calibrated and error-corrected mixer measurements.
Network Analyzer Documentation Set The Installation and Quick Start Guide familiarizes you with the network analyzer’s front and rear panels, electrical and environmental operating requirements, as well as procedures for installing, configuring, and verifying the operation of the analyzer. The User’s Guide shows how to make measurements, explains commonly-used features, and tells you how to get the most performance from your analyzer. The Quick Reference Guide provides a summary of selected user features.
The HP BASIC Programming Examples Guide provides a tutorial introduction using BASIC programming examples to demonstrate the remote operation of the network analyzer. The System Vertication and ‘lkst Guide provides the system verification and performance tests and the Performance Test Record for your analyzer.
DECLARATION OF CONFORMITY According to ISO/IEC Guide 22 and EN 45014 Manufacturer’s Name: Hewlett-Packard Co. Manufacturer’s Address: Microwave Instruments Division 1400 Fountaingrove Parkway Santa Rosa, CA 95403-I 799 USA Hewlett-Packard Japan, Ltd.
Contents 1. HP 8753E Description and Options Where to Look for More Information . . . . . . . . . . . . . . . . . . . . . Analyzer Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Front Panel Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Analyzer Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Rear Panel Features and Connectors . . . . . . . . . . . . . . . . . . . . . Analyzer Options Available . . . . . . . . . . . . . . . . . . . . . . . . . .
Characterizing a Duplexer . . . . . . . . . . . . . . . . . . . . . . . . . . Required Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . Procedure for Characterizing a Duplexer . . . . . . . . . . . . . . . . . . Using Analyzer Display Markers . . . . . . . . . . . . . . . . . . . . . . . ‘Ib Use Continuous and Discrete Markers . . . . . . . . . . . . . . . . . . lb Activate Display Markers . . . . . . . . . . . . . . . . . . . . . . . . lb Move Marker Information off of the Grids . . . . .
Set Up the Lower Stopband Parameters . . . . . . . . . . . . . . . . . . Set Up the Passband Parameters . . . . . . . . . . . . . . . . . . . . . Set Up the Upper Stopband Parameters . . . . . . . . . . . . . . . . . . Calibrate and Measure . . . . . . . . . . . . . . . . . . . . . . . . . . . Measurements Using the Tuned Receiver Mode . . . . . . . . . . . . . . . . Typical test setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Tuned receiver mode in-depth description . . . . . . . . . . . .
LO to RF Isolation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . RF Feedthrough . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4. Printing, Plotting, and Saving Measurement Results Where to Look for More Information . . . . . . . . . . . . . . . . . . . . . Printing or Plotting Your Measurement Results . . . . . . . . . . . . . . . . . Configuring a Print Function . . . . . . . . . . . . . . . . . . . . . . . . . DeIIning a Print Function . . . . . . . . . . . . . . . . . . . . . .
What You Can Save to a Computer . . Saving an Instrument State . . . . . . . Saving Measurement Results . . . . . . ASCII Data Formats . . . . . . . . . CITIille . . . . . . . . . . . . . . S2P Data Format. . . . . . . . . . Re-Saving an Instrument State . . . . . Deleting a File . . . . . . . . . . . . . lb Delete an Instrument State File . . IbDeleteaIlFiles . . . . . . . . . . RenamingaFile . . . . . . . . . . . . RecallingaFile . . . . . . . . . . . . Formatting a Disk . . . . . . . . . . .
Deleting Frequency Segments . . . . . . . . . . . . . . . . . . . . . . Compensating for Directional Coupler Response . . . . . . . . . . . . . . . Using Sample-and-Sweep Correction Mode . . . . . . . . . . . . . . . . . . Using Continuous Correction Mode . . . . . . . . . . . . . . . . . . . . . lb Calibrate the Analyzer Receiver to Measure Absolute Power . . . . . . . Calibrating for Noninsertable Devices . . . . . . . . . . . . . . . . . . . . . Adapter Removal . . . . . . . . . . . . . . . . . . . . . .
IF Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Ratio Calculations . . . . . . . . . . . . . . . . . . . . . . . . . . . . Sampler/IF Correction . . . . . . . . . . . . . . . . . . . . . . . . . . Sweep-lb-Sweep Averaging . . . . . . . . . . . . . . . . . . . . . . . . Pre-Raw Data Arrays . . . . . . . . . . . . . . . . . . . . . . . . . . Raw Arrays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Vector Error-correction (Accuracy Enhancement) . . . . . . . . . . . .
Segment Menu. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Stepped Edit List Menu . . . . . . . . . . . . . . . . . . . . . . . . . Stepped Edit Subsweep Menu . . . . . . . . . . . . . . . . . . . . . . Swept List Frequency Sweep (Hz) . . . . . . . . . . . . . . . . . . . . . . Swept Edit List Menu . . . . . . . . . . . . . . . . . . . . . . . . . . Swept Edit Subsweep Menu . . . . . . . . . . . . . . . . . . . . . . . Setting Segment Power . . . . . . . . . . . . . . . . . . . . . . . . . .
Marker Function Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . Marker Search Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . lhrget Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Marker Mode Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . Polar Marker Menu . . . . . . . . . . . . . . . . . . . . . . . . . . Smith Marker Menu . . . . . . . . . . . . . . . . . . . . . . . . . . Measurement Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . .
TRL* Error Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . Isolation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Source match and load match . . . . . . . . . . . . . . . . . . . . . . Improving Raw Source Match and Load Match For TRL*/LRM* Calibration . . The TRL Calibration Procedure . . . . . . . . . . . . . . . . . . . . . . . Requirements for TRL Standards . . . . . . . . . . . . . . . . . . . . . Fabricating and defining calibration standards for TRL/LRM . . . . . . .
Compatible Sweep Types . . . . . . . . . . . . . . . . . . . . . . . . External Source Requirements . . . . . . . . . . . . . . . . . . . . . Capture Range. . . . . . . . . . . . . . . . . . . . . . . . . . . . . Locking onto a signal with a frequency modulation component . . . . . . Tuned Receiver Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . Frequency Offset Menu . . . . . . . . . . . . . . . . . . . . . . . . . . Primary Applications . . . . . . . . . . . . . . . . . . . . . . . . . . .
Range resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . Gating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setting the gate . . . . . . . . . . . . . . . . . . . . . . . . . . . . Selecting gate shape . . . . . . . . . . . . . . . . . . . . . . . . . . Transforming CW Time Measurements Into the Frequency Domain . . . . . . Forward Transform Measurements . . . . . . . . . . . . . . . . . . . . Interpreting the forward transform vertical axis . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-20 7-20 7-20 7-20 7-21 7-21 7-21 9. Key Definitions Where to Look for More Information . . . . . . . . . . . . . . . . . . . . . Guide Terms and Conventions . . . . . . . . . . . . . . . . . . . . . . . . Analyzer Functions . .
11-10 11-10 11-12 11-13 11-13 11-13 11-14 11-15 11-16 11-16 11-16 11-16 11-16 11-17 11-17 11-17 11-17 11-18 11-19 11-20 11-20 11-21 11-21 11-21 11-21 1 l-22 11-22 1 l-23 1 l-24 11-24 11-24 If the Peripheral Is a Plotter . . . . . . . . . . . . . . . . . . . . . . . . HPGLIB Compatible Printer (used as a plotter) . . . . . . . . . . . . . . . Pen Plotter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . If the Peripheral Is a Power Meter . . . . . . . . . . . . . . . . . . . . .
Example 4,851O 3-Term kequency List Cal Set F’iIe . . . . . . . . . . . . Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . The CITIfIIe Keyword Reference . . . . . . . . . . . . . . . . . . . . . . . A-5 A-6 A-7 B. Determining System Measurement Uncertainties Sources of Measurement Errors . . . . . . . . . . . . . . . . . . . . . . . . Sources of Systematic Errors . . . . . . . . . . . . . . . . . . . . . . . . Sources of Random Errors . . . . . . . . . . . . . . . . . . . . . .
Figures l-l. HP 8753E Front Panel . . . . . . . . . . . . . . . . . . . . . . . . . . . l-2. Analyzer Display (Single Channel, Cartesian Format) . . . . . . . . . . . . . l-3. HP 8753E Rear Panel . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-l. Basic Measurement Setup . . . . . . . . . . . . . . . . . . . . . . . . . 2-2. Example of Viewing Channels 1 and 2 Simultaneously . . . . . . . . . . . . 2-3. Example Dual Channel With Split Display On . . . . . . . . . . . . . . . . 2-4.
2-43. Sloping Limit Lines 2-44. Example Single Points’Lk’Line : 1 : 1 1 1 1 1 1 : : : : : 1 1 1 1 1 : 1 : 2-45. Example Stimulus Offset of Limit Lines . . . . . . . . . . . . . . . . . . . 2-46. Diagram of Gain Compression . . . . . . . . ,,:-i-,T,, . . . . . . . . . . . . . . . . Z-47. Gain Compression Using Linear Sweep and PZ&$!&( h2 :9g. . . . . . . . . 2-48. Gain Compression Using Power Sweep . . . . . . . . . . . . . . . . . . . 2-49. Gain and Reverse Isolation . . . . . . . . . . . . . . . . . . . .
4-2. Printing Two Measurements . . . . . . . . . . . . . . . . . . . . . . . . 4-3. Peripheral Connections to the Analyzer . . . . . . . . . . . . . . . . . . . 4-4. Plot Components Available through Definition . . . . . . . . . . . . . . . . 4-5. Line Types Available . . . . . . . . . . . . . . . . . . .cY / 1. . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-6. Locations of Pl and P2 in ~Z&U&.:.F~~~. :%.:%.A. . . . . . . . . . . . . . . . . .Mode . . . . . . . ..u.. . . . . . . . .:. .: . . . . . .
6-26. Effect of Smoothing on a Trace . . . . . . . . . . . . . . . . . . . . . . . 6-27. IF Bandwidth Reduction . . . . . . . . . . . . . . . . . . . . . . . . . . 6-28. Markers on Trace . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-29. Directivity 6-30. Source Match’ 1 1 1 : 1 1 1 1 : : : 1 1 : : 1 : : : : : : : 1 : : 1 1 1 1 1 6-31. Load Match . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-32. Sources of Error in a Reflection Measurement . . . . . . . . . . . . . . . .
6-79. Separating the Amplitude and Phase Components of Test-Device-Induced Modulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-80. Range of a Forward Transform Measurement . . . . . . . . . . . . . . . . 6-81. ParaIIel Port Input and Output Bus Pin Locations in GPIO Mode . . . . . . . 6-82. Amplifier Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-83. Swept Frequency Amplifier Measurement of Absolute Fundamental, 2nd and 3rd Harmonic Output Levels . . . . . . . .
%bles O-l. Hewlett-Packard Sales and Service Offices . . . . . . . . . . . . . . . . . . l-l. Comparing the HP 8753A/B/C/D l-2. ComparingtheHP8753DandHP8753k’ : : : 1 : : : 1 : 1 : 1 : 1 : : : : 2-l. Connector Care Quick Reference . . . . . . . . . . . . . . . . . . . . . . 2-2. Gate Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-l. Default Values for Printing Parameters . . . . . . . . . . . . . . . . . . . 4-2. Default Pen Numbers and Corresponding Colors . . . . . . . . . . . .
9-2. Softkey Locations . . . . . . . . . . . . . . . . . . 11-l. Keyboard Template Deilnition . . . . . . . . . . . . 11-2. Code Naming Convention . . . . . . . . . . . . . . 12-1. Memory Requirements of Calibration and Memory Trace 12-2. Sufhx Character Definitions . . . . . . . . . . . . . 12-3. Preset Conditions (1 of 5) . . . . . . . . . . . . . . 12-4. Power-on Conditions (versus Preset) . . . . . . . . . 12-5. Results of Power Loss to Non-Volatile Memory . . . . . . . . . . . . . . . . . Arrays . . .
1 HP 87533 Description and Options This chapter contains information on the following topics: n Analyzer overview n Analyzer description n Front panel features w Analyzer display I Rear panel features and connectors n Analyzer options available n Service and support options w Differences among the HP 8753 network analyzers Where to Look for More Information Additional information about many of the topics discussed in this chapter is located in the following areas: n Chapter 2, “Making Measuremen
Analyzer Description The HP 8753E is a high performance vector network analyzer for laboratory or production measurements of reflection and transmission parameters. It integrates a high resolution synthesized RF source, an S-parameter test set, and a four-channel three-input receiver to measure and display magnitude, phase, and group delay responses of active and passive RF networks.
n Accuracy q q Accuracy enhancement methods that range from normalizing data to complete one or two port vector error correction with up to 1601 measurement points, and TRL*/LRM*. (Vector error correction reduces the effects of system directivity, frequency response, source and load match, and crosstalk.) Power meter calibration that allows you to use an HP-IB compatible power meter to monitor and correct the analyzer’s output power at each data point.
Front Panel Features Caution Do not mistake the line switch for the disk eject button. See the figure below. If the line switch is mistakenly pushed, the instrument will be turned off, losing all settings and data that have not been saved. Y 14 Figure l-l. HP 8753E Front Panel F’igure l-l shows the location of the following front panel features and key function blocks. These features are described in more detail later in this chapter, and in Chapter 9, “Key Definitions n 1. LINE switch.
Note The @Ki) and @iGZ) keys retain a history of the last active channel. For example, if channel 2 has been enabled after channel 3, you can go back to channel 3 without pressing [Ghan’ twice.
8. The ENTBY block. This block includes the knob, the step &) @j keys, the number pad, and the backspace @ key. These allow you to enter numerical data and control the markers. You can use the numeric keypad to select digits, decimal points, and a minus sign for numerical entries. You must also select a units terminator to complete value inputs.
Analyzer Display oo-6 5 DATA DISPLAY AREA it 1 a 2 D pg64d Figure 1-2. Analyzer Display (Single Channel, Cartesian Format) The analyzer display shows various measurement information: n The grid where the analyzer plots the measurement data. n The currently selected measurement parameters. n The measurement data traces. Figure l-2 illustrates the locations of the different information labels described below.
2. Stimulus Stop Value. This value could be any one of the following: n The stop frequency of the source in frequency domain measurements. n The stop time in time domain measurements or CW sweeps. a The upper limit of a power sweep. When the stimulus is in center/span mode, the, s?an is shown in this space. The stimulus values can be blanked, as described under ~‘~~~~~‘~~~~~~~ Key” in Chapter 9, “Key Definitions.
H=2 Harmonic mode is on, and the second harmonic is being measured (harmonics Option 002 only). (See “Analyzer Options Available” later in this chapter.) H=3 Harmonic mode is on, and the third harmonic is being measured (harmonics Option 002 only). (See “Analyzer Options Available” later in this chapter.) Hld Hold sweep. (See :@&I$ in Chapter 9, “Key Definitions.“) Waiting for manual trigger. PC Power meter calibration is on.
8. Measured Input(s). This shows the S-parameter, input, or ratio of inputs currently measured, as selected using the LMeas) key. Also indicated in this area is the current display memory status. 9. Format. This is the display format that you selected using the (Format] key. 10. Scale/Div. This is the scale that you selected using the (Gig) key, in units appropriate to the current measurement. 11. Reference Level.
Rear Panel Features and Connectors 0 19 pg63e Figure 1-3. HP 8753E Bear Panel Figure l-3 illustrates the features and connectors of the rear panel, described below. Requirements for input signals to the rear panel connectors are provided in Chapter 7, “Specifications and Measurement Uncertanuies n 1. HP-Ill connector. This allows you to connect the analyzer to an external controller, compatible peripherals, and other instruments for an automated system.
10. EXTERNAL BEF‘ElUINCE INPUT. connector. This allows for a frequency reference signal input that can phase lock the analyzer to an external frequency standard for increased frequency accuracy. The analyzer automatically enables the external frequency reference feature when a signal is connected to this input. When the signal is removed, the analyzer automatically switches back to its internal frequency reference. 11. AUXILIABY INPUT connector.
Analyzer Options Available Option lD6, High Stability Frequency Reference Option lD5 offers kO.05 ppm temperature stability from 0 to 60 OC (referenced to 25 “C). Option 002, Harmonic Mode Provides measurement of second or third harmonics of the test device’s fundamental output signal. Frequency and power sweep are supported in this mode. Harmonic frequencies can be measured up to the maximum frequency of the receiver. However, the fundamental frequency may not be lower than 16 MHz.
Option lCP, Rack Mount Flange Kit With Handles Option 1CP is a rack mount kit containing a pair of flanges and the necessary hardware to mount the instrument with handles attached in an equipment rack with 482.6 mm (19 inches) spacing. Service and Support Options Hewlett-Packards offers many repair and calibration options for your analyzer. Contact the nearest Hewlett-Packard sales or service office for information on options available for your analyzer.
Differences among the HP 8753 Network Analyzers lhble l-l. Comparing the J3P 8753AIBKYD Feature 8763A 8753B 8758C 8768D Fully integrated measurement system (built-in test s&J No No No Ye8 lbst port power rfmge (dDm) 8758D Opt 011 No t Auto/manual power m selecting No Port power coupliug/uncoupling No No Internal disk drive No No Precision frequency reference (Option lD5) No No 300 kHz 300 kHz Ext. freq.
‘able 1-2. Comparing the HP 8753D and HP 8753E * 300 lcHz to 3 GHz, without option 006, or 30 lcHz to 6 GHz, with Option 006 t For this network analyze5 the feature is dependent on the test set being used.
2 Making Measurements This Chapter contains the following example procedures for making measurements or using particular functions: Basic measurement sequence and example 0 Setting frequency range 0 Setting source power w Analyzer display functions n Four-Parameter Display Mode w Analyzer marker functions n Magnitude and insertion phase response n Electrical length and phase distortion q Deviation from linear phase q Group delay n Limit testing n Gain compression w Gain and reverse isolation n Measurements
Principles of Microwave Connector Care Proper connector care and connection techniques are critical for accurate, repeatable measurements. Refer to the calibration kit documentation for connector care information. Prior to making connections to the network analyzer, carefully review the information about inspecting, cleaning and gaging connectors. Haying good connector care and connection techniques extends the life of these devices. In addition, you obtain the most accurate measurements.
Basic Measurement Sequence and Example Basic Measurement Sequence There are five basic steps when you are making a measurement. 1. Connect the device under test and any required test equipment. Caution Damage may result to the device under test if it is sensitive to the analyzer’s default output power level. To avoid damaging a sensitive DUT, be sure to set the output power appropriately before connecting the dut to the analyzer. 2. Choose the measurement parameters. 3.
4. ‘lb set the span to 30 MHz, press: &g(ziJm Note You could also press the @ and &TJ keys and enter the frequency range limits as start frequency and stop frequency values Setting the Source Power. 5. lb change the power level to -5 dRm, press: Note / _ You could also press ~~~~.~~~~~~~~ ~~~~~~:~,~~~~~ and select one of the power ranges to keep the power setting within the deGned range. Setting the Measurement. 6. ‘Ib change the number of measurement data points to 101, press: 7.
Caution Do not mistake the Iine switch for the disk eject button. See the figure below. If the Iine switch is mistakenly pushed, the instrument wiIi be turned off, losing ah settings and data that have not been saved. DISK EJECT BUTTON 1 LINE SWITCH’ Step 4. Measure the device under test. 11. Replace any standard used for error-correction with the device under test. 12. To measure the insertion loss of thebandpass filter, press: m(i5iJm Step 6. Output the measurement results. 13.
Using the Display Functions To View Both Primary Measurement Channels In some cases, you may want to view more than one measured parameter at a time. Simultaneous gain and phase measurements for example, are useful in evaluating stability in negative feedback amplifiers. You can easily make such measurements using the dual channel display. 1. To see channels 1 and 2 in the same grid, press: ” ,.:s’<$ :.< 2* ‘lb view the measurements separate graticules, press: Set ~~~~~~~~‘~~~~~ tothe 2X.
_ _ 3. To return to a single-graticule display, press:~~~~~~~;.,~~~~~~~,,, .,. . ,. . . ., , , , , . . . . . .,. ., . :. . . . . . . . i . . . .A .i . . . $8, . . . s. . . .i i. Note You can control the stimulus functions of the two channels independent of each other, by pressing LMenu) &@&& .kE @FE . ../ i To Save a Data Trace to the Display Memory _ ., _ ., ,. Press (j) ~~~~~~~~~~ to store the current active measurement data in the memory of the active channel.
To Divide Measurement Data by the Memory Trace You can use this feature for ratio comparison of two traces, for example, measurements of gain or attenuation. 1. You must have already stored a data trace to the active channel memory, as described in “To Save a Data Trace to the Display Memory.” . “’ :. 2. Press (Display)il. . ~~~~~~ .: i.i .:. to divide the data by the memory.
To Title the Active Channel Display . ii i 1. press (misplay) &&:: to access the title menu. ,. . . : i;: // $&$ ~.~./i 2. press,~~~~~~~ >> ;.:..:.<:.. ..c c...... .!;;:.;;::...iii q q ad enter the title you want for your measurement &splay. If you have a DIN keyboard attached to the analyzer, type the title you want from the keyboard. Then press (WI to enter the title into the analyzer. You can enter a title that has a maximum of 50 characters.
The display will appear as shown in F’igure 2-5. Channel 1 is in the upper left quadrant of the display, channel 2 is in the upper right quadrant, and channel 3 is in the lower half of the display. 17 Ssp 1 9 9 8 CHl L O G Sll CH2 521 . 5 dB/ R E F - 2 dB LOG 11:13:31 1 0 dB/ R E F -50 dB DUAL CHAN ON off - AUX CHAN ON off - 4 PARAM DISPLAYS Cot- SPLIT DISP 1x CENTR 134.000 MHz SPFIN 45.000 MHz CH3 s12 LOG I 1 0 dB/REF - 5 0 dB I START 111.500 MHz STOP 156.
This enables channel 4 and the screen now displays four separate grids as shown in Figure 2-6. Channel 4 is in the lower-right quadrant of the screen. 2 S e p 1 9 9 8 14:is: 5 7 CHI -31 LOG . 5 dB/ REF - 2 dB CH2 s21 LOG 1 0 dB/ R E F - 5 0 dB DUAL CHAN ON off - AUX CHAN ON off - PRnE PRm 4 PARAM DISPLAYS CA SPLIT DISP IX C E N T R 1 3 4 . 0 0 0 MHz SPFIN 4 5 . 0 0 0 M H z CENTR 134.
13. Press (Ghan] again. Observe that the LED is flashing, indicating that channel 3 is active. 14. Rotate the front panel control knob and notice that marker 2 still moves on all four channel traces. 15. To independently control the channel markers: **,, .:. .: . Press (Marker) ‘~~~~~~::::.~~, set ~jQ#$JR&~~- to UNCOUPLED. . . . ./ i . . ..i . . ;.; ; .. . . . . . i. i . . . . . ..i. i/. . . ii Rotate the front panel control knob. Marker 2 moves only on the channel 3 trace.
Required Equipment Characterizing a duplexer requires that the test signals between the analyzer (a 2-port instrument) and the duplexer (a 3-port device) are routed correctly. This example uses one of the following adapters to perform this function: n HP 8753E Option K36 duplexer test adapter n HP 8753E Option K39 3-port test adapter You must also have a set of calibration standards for performing a full 2-port calibration on your test set up. Procedure for Characterizing a Duplexer 1.
.: Press Lcal] .~~~~~~;~~~~.~. &@f& &+%Rf~ : .:. ..:::c. Note ..:.:.:.: “) ,, .:.:.:.:.. _ ,. ,.,..: _ _ .,. Make sure you connect the calibration standards to the Rx port of the test adapter (or a cable attached to it) for the FORWARD calibration, and the Antenna port for the REVERSE calibration. 12. When the calibration has been completed, save this state in the analyzer: 13. Connect the DUT to the test adapter. 14. Enable both auxiliary channels 3 and 4: . . .:: . z. / :+ ..;p . . . :. .
5 Au9 1 9 9 8 CHl CH2 s21 s12 LO8 LOG 1 0 dB/REF 1 0 dB/REF 13:10:11 - 4 0 dB - 4 0 dB Ref 1: FWD Sll
Using Analyzer Display Markers The analyzer markers provide numerical readout of trace data. You can control the marker search, the statistical functions, and the capability for quickly changing stimulus parameters with markers, from the (jMarker) key. Markers have a stimulus value (the x-axis value in a Cartesian format) and a response value (the y-axis value in a Cartesian format). In a polar or Smith chart format, the second part of a complex data pair is also provided as an auxiliary response value.
To Activate Display Markers lb switch on marker 1 and make it the active marker, press: (Iizzia .~..~~~~~ The active marker appears on the analyzer display as V. The active marker stimulus value is displayed in the active entry area. You can modify the stimulus value of the active marker, using the front panel knob or numerical keypad. All of the marker response and stimulus values are displayed in the upper right comer of the display. Figure 2-8.
!tb Move Marker Information off of the Grids If marker information obscures the display traces, you can turn off the softkey menu and move the marker information off of the display traces and into the softkey menu area. Pressing the backspace key @ performs this function. This is a toggle function of the backspace key. That is, pressing @ alternately hides and restores the current softkey menu. The softkey menu is also restored when you press any softkey or a hardkey which leads to a menu. 1.
4. Restore the softkey menu and move the marker information back onto the graticules: Press CEI The display will be similar to Figure 2-11. 2 S e p 1 9 9 8 12:09: 4 3 CHI L O G 5 dB.’ R E F - 2 dB Sll 4:-1.4066 dB 151.509 500 M H z CH2 521 LOG 10 dB/ REF -50 dB 4:-6X313 dB 1 5 1 . 5 0 9 5 0 0 MHz MARKIER I 2 PR”I 8g0 MHz PRm ‘ - 3 . 1 5 8 5 dB .97600 MHz CA I 8 dB MHz 3 CA I 4 CENTR 134.000 MHz SPAN 45.000 MHz CENTR 1 3 4 . 0 0 0 M H z S P A N 4 5 0 0 0 MHz ;;; E LOG4:-71.254 10dBdB/151.
and move marker 2 to any position that you want to measure in reference Figure 2-12. Marker 1 as the Reference Marker Example 4. ‘Ib change the reference marker to marker 2, press: lb Activate a Fixed Marker When a reference marker is tied, it does not rely on a current trace to maintain its fixed position.
Using the :~~~~~~~~~~~ Key to Activate a Fixed Reference Marker 1. To set the frequency value of a iixed marker that appears on the analyzer display, press: keypad. The marker is shown on the display as a small delta (A), smaller than the inactive marker triangles. 2. ‘RI set the response value (dl3) of a fixed marker, press: :J;, ;T; g)i: ~~~~“~~~~~:~~~. and turn the front panel knob, or enter a v&e from the front pane] :..:. ;..;;;,.;;~;;;..;~..~ ii i ..i i . . . . . . . . . .: F.. ,,...:::. keypad.
__ ., ,. _ ,. . , ,. Using the :.:,~~.~:~.~~~ i . . . . :<.s:. Key to Activate a Fixed Reference Marker Marker zero enters the position of the active marker as the A reference position. Alternatively, you can specify the fixed point with ;$$&E& i..i T . . . .L. . .~~~;~.~~~~~~~. Marker zero is canceled by switching delta mode off. 1. To place marker 1 at a point that you would like to reference, press: B and turn the front panel knob, or enter a value from the front panel keypad. 2.
‘lb Couple and Uncouple Display Markers At a preset state, the markers have the same stimuhrs values on each channel, but they can be uncoupled so that each channel has independent markers. 1. Press CMarker Fct”) :~:~~~:,~~~~~~~ Ed sele~ from the fonowing keys: ,., ,. . . . . . . ; . A. .%% ..... . s. _ / . u. : : Choose ~~~~~~~ ........... ....... :.:.../:..... .::::::.. L / if you wmt the analyzer to couple the maker staff values .. .:. for the display channels. ,. i_, : ., ; ,. .sy. .: .: .
2. Select the type of polar marker you want from the following choices: n . Choose .:/.:.. ;&X#“?!&% if you want to view the magnitude and the phase of the active marker. :. The magnitude values appear in units and the phase values appear in degrees. Choose ;.~~~~~~ if you witnt to view the logarithmic magnitude and the phase of the active marker. The magnitude values appear in dE? and the phase values appear in degrees. . . . . . . . . . . . . . . . . . . . .
The marker annotation tells that the complex impedance is capacitive in the bottom half of the Smith chart display and is inductive in the top half of the display. Choose .X&@I#& if you want the analyzer to show the linear magnitude and the phase of the reflection coefficient at the marker. ,/ n “.’ Choose ~~~~~~~~ if you want the analyzer to show the logarithmic magnitude and the phase of the reflection coefficient at the active marker.
Setting the Start Frequency 1. F’ress (mFctn) and turn the front panel knob, or enter a value from the front panel keypad to position the marker at the value that you want for the start frequency. 2. Press :.~~~~~~~~ to change the St& frequency value to the value of the active marker. / ., ,. / CENTER 3 1 es2 588 PtHl SPAN 13s 968.756 MHZ pg6232 Figure 2-18. Example of Setting the Staxt Frequency Using a Marker Setting the Stop Frequency 1.
Setting the Center Frequency 1. Press @GiFFXj and turn the front panel knob, or enter a value from the front panel keypad to position the marker at the value that you want for the center frequency. : *, ,, .Y%.. ::. 2. Press ~.~~~: to change the center frequency value to the value of the active marker. 1 i i i Figure 2-20.
Setting the Frequency Span You can set the span equal to the spacing between two markers. If you set the center frequency before you set the frequency span, you will have a better view of the area of interest. 1. 2. Turn the front panel knob, or enter a value from the front panel keypad to position the markers where you want the frequency span. _ .
Setting the Display Reference Viilue 1. Press (j.GLXGFctn_) and turn the front panel knob, or enter a value from the front panel keypad to position the marker at the value that you want for the analyzer display reference value. . . .< . ;:y;. .: ..-..:.. 2. Press ~~,~~~ ., . s. . . . . . i < . . . . .: .x.:i . . . . . . . (6 :x..:.. . ,. ,<.: .i to change the reference value to the value of the active marker. Figure 2-22.
Setting the Electrical Delay This feature adds phase delay to a variation in phase versus frequency, therefore it is only applicable for ratioed inputs. 2. Press (jjFctn) and turn the front panel knob, or enter a value from the front panel keypad to position the marker at a point of interest. _ .... 3. Press ~~~~~~~~ A:., :., .; . ,.,. . . , ‘. : .~ ~ :. ~.: .: ~: . :. : . .: .~.: ~ :~:. :. ~.
‘lb Search for a Specific Amplitude These functions place the marker at an amplitude-related point on the trace. If you switch on tracking, the analyzer searches every new trace for the target point. Searching for the Maximum Amplitude 1. Press CMarker Fct”, ,~~~;:~~~’ to acCeSS the marker search menu. ,/ .A. . . . . . . T. . ., , , , . ws/i ,. 2. Press ~~~~~:.~~ to move the active marker to the maximum point on the measurement trace. Figure 2-24.
Searching for the Minimum Amplitude 1. Press ($GiFFXFctnJ ;~~~~~~~: ii.i. . . . . i. ..T i.; ;. . ;. . .s . . ..: ./ i. . .to access the marker search menu. 2- Press $W#$f:,~&~~. to move the active marker to the minimum point on the measurement * r trace. G-II s ‘I PIA& I 1 14 I 85 I 1 1 HZ I I I 1 1 1 1 1 I I I I I I I I I t Figure 2-25.
Searching for a ‘beget Amplitude 1. Press (@i&X$ ~~~~~~~~ to access the marker search menu. /. ..d;:.::;- search ,.,:; ,. .: .for ’ :. :,v ,: . .: .: .: multiple ; .; ;. :.
Searching for a Bandwidth The analyzer can automatically calculate and display the -3 dB bandwidth (BW:), center frequency (CENT:), Q, and loss of the device under test at the center frequency. (Q stands for “quality factor,” defined as the ratio of a circuit’s resonant frequency to its bandwidth.) These values are shown in the marker data readout. 1. Press m and turn the front panel knob, or enter a value from the front panel keypad to place the marker at the center of the filter passband. : . %. .i/. ,. .
To Calculate the Statistics of the Measurement Data This function calculates the mean, standard deviation, and peak-to-peak values of the section of the displayed trace between the active marker and the delta reference. If there is no delta reference, the analyzer calculates the statistics for the entire trace. 1. press (Marker_) ~~:~~~~~~ :. :. :.:. . . s< :. c. ;. ~.:~.: . 1.: .: ~.: ~. ,. . . : . &&j@$:,$;. ; . . .:. .: . . . . . . . . . :.:. to m&e maker 1 a reference m&es. 2.
Measuring Magnitude and Insertion Phase Response The analyzer allows you to make two different measurements simultaneously. You can make these measurements in different formats for the same parameter. For example, you could measure both the magnitude and phase of transmission. You could also measure two different parameters (Sll and S&.
4. Reconnect your test device. 5. lb better view the measurement trace, press: . .,._.,.. ,.,./., . . . . . / . . . . . cm) &q?$f,, ,$&gg# 6. To locate the maximum amplitude of the device response, as shown in Figure 2-30, press: _ i _. . .,. ,. ._. .. ,. . . (jj) ~~~~~~~ ~~~~~:~~:.~~~ .. a%.; A. .:.A. i ./. CENTER 134 000 000 MHZ SPAN 50 000 000 MHZ Figure 2-30. Example Magnitude Response Measurement Results Measuring Insertion Phase Response 7.
The phase response shown in F’igure 2-32 is undersampled; that is, there is more than HO0 phase delay between frequency points If the A4 2 HO”, incorrect phase and delay information may result. Figure 2-32 shows an example of phase samples being with A+ less than MO0 and greater than MOO. RESPONSE \ UNDER SAMPLED REGION (INCORRECT PHASE AND DELAY) pb6125d Figure 2-32. Phase Samples Undersampling may arise when measuring devices with long electrical length.
Measuring Electrical Length and Phase Distortion Electrical Length The analyzer mathematically implements a function similar to the mechanical “line stretchers” of earlier analyzers. This feature simulates a variable length lossless transmission line, which you can add to or remove from the analyzer’s receiver input to compensate for interconnecting cables, etc. In this example, the electronic line stretcher measures the electrical length of a SAW filter.
3. Substitute a thru for the device and perform a response calibration by pressing: &g ~:~~~~~~~~; ~~~~~~~,, ;@Ji@. 4. Reconnect your test device. 5. To better view the measurement trace, press: ,. . (7) :&q#j : <&&$ Notice that in Figure 2-34 the SAW filter under test has considerable phase shift within only a 2 MHz span. Other filters may require a wider frequency span to see the effects of phase shift. The linearly changing phase is due to the device’s electrical length.
8. Press (-Ref) ~~~~~~~~~~ >,. >,. . . . . . . . . . . . . ..<.:., .: . . . i.i. i:<<
1. Follow the procedure in “Measuring Electrical Length.” 2. lb increase the scale resolution, press: (m) ~~~~~~, md turn the front panel knob, or enter a v&e from the front pmel .. keypad. .A. 3. To use the marker statistics to measure the maximum peak-to-peak deviation from linear phase, press: .:::::..::::::::.:~:.::. . : .: :,.:.,.:::..;:., .,.:. ” STAT&. i i i . . . . . . . . . . . . ,088 .‘. . . i.:.: 4. Activate and adjust the electrical delay to obtain a minimum peak-to-peak value.
3. lb activate a marker to measure the group delay at a particular frequency, press: (%ZQ and turn the front panel knob, or enter a value from the front panel keypad. Figure 2-37. Group Delay Example Measurement Group delay measurements may require a specific aperture (AF’) or frequency spacing between measurement points The phase shift between two adjacent frequency points must be less than 180°, otherwise incorrect group delay information may result. 4.
5. lb increase the effective group delay aperture, by increasing the number of measurement points over which the analyzer calculates the group delay, press: _ __ _ ~~~~~~~~G :,;#pggm.; (g Lxl] As the aperture is increased the “smoothness” of the trace improves markedly, but at the expense of measurement detail. 11 III CENTER 134 OBB 888 “HZ I 11 11 SPRN 2. mm BOB MHZ I aw000009 Figure 2-39.
lksting A Device with Limit Lines Limit testing is a measurement technique that compares measurement data to constraints that you define. Depending on the results of this comparison, the analyzer will indicate if your device either passes or fails the test. Limit testing is implemented by creating individual flat, sloping, and single point limit lines on the analyzer display. When combined, these lines can represent the performance parameters for your device under test.
4. Reconnect your test device. 5. To better view the measurement trace, press: ......... .: ““:.:...... .::.:: I-, @g@$f ....... ::... ..:: : !< S cale Re ... ;::f/,,,,, i.:. . . . ...;...1 :$?&% : .. Creating Flat Limit Lines In this example procedure, the following flat Iimit Iine values are set: Frequency Range ................................................................. Power Range 127 MHz to 140 MHz ..........................................................
5. To terminate the flat line segment by establishing a single point limit, press: Figure 2-41 shows the flat limit lines that you have just created with the following parameters: n n n stimulus from 127 MHz to 140 MHz upper limit of -21 dB lower limit of -27 dB Figure 2-41. Example Flat Limit Line 6.
Figure 2-42. Example Flat Limit Lines Creating a Sloping Limit Line This example procedure shows you how to make limits that test the shape factor of a SAW titer. The following limits are set: Frequency Bange ................................................................. Power Range 123MHzto125MHz.. ........................................................ -65dBto-26dB 144 MHz to 146 MHz .......................................................... -26 dB to -65 dEI 1.
3. ~9~~~~~~ (--2ooJ lxlJ :) : ,...:, .i . i. . . ..i..xi. . . . i . ~~@#g .‘ . i.L.:.. ..: ...i. :$J, :>. z ‘* ~~:i;, .w..; : ‘) z .* -< .~~~~,~~~,~~~. ~~~~~~.?~~~ . . . . . . . . . . . .. .. ../ . . . . .. i. . :;,. :. :., ~:.~. : . . . . . . . . . . . . . . . . . . . ,.~,.~, . . . . .:. ., ,. . ,. . :. :. . ;.: . .; . . ., .; . . . . .:. $W 4. lb establish the start frequency and limits for a sloping limit line that tests the high side of the l?lter, press: 5.
Creating Single Point Limits In this example procedure, the following limits are set: from -23 dB to -28.5 dB at 141 MHz from -23 dB to -28.5 dB at 126.5 MHz 1. ‘lb access the knits menu and activate the Iimit lines, press: 2. Figure 2-44.
Editing Limit Segments This example shows you how to edit the upper limit of a limit line. 1. To access the limits menu and activate the limit lines, press: 2. symbol (>) on the analyzer display to the segment you wish to modify, press: 3. To change the upper limit (for example, -20) of a limit line, press: Deleting Limit Segments 1. ‘lb access the limits menu and activate the limit lines, press: 2.
Bnnning a Limit Tkst 1. To access the limits menu and activate the limit lines, press: Reviewing the Limit Line Segments The limit table data that you have previously entered is shown on the analyzer display. 2. To verify that each segment in your limits table is correct, review the entries by pressing: 3. To modify an incorrect entry, refer to the “Editing Limit Segments” procedure, located earlier in this section. Activating the Limit Test 4.
Offsetting Limit Lines The limit offset functions allow you to adjust the limit lines to the frequency and output level of your device. For example, you could apply the stimulus offset feature for testing tunable filters. Or, you could apply the amplitude offset feature for testing variable attenuators, or passband ripple in filters with variable loss. This example shows you the offset feature and the limit test failure indications that can appear on the analyzer display. 1.
Measuring Gain Compression Gain compression occurs when the input power of an amplifier is increased to a level that reduces the gain of the amplifier and causes a nonlinear increase in output power. The point at which the gain is reduced by 1 dB is called the 1 dB compression point. The gain compression will vary with frequency, so it is necessary to find the worst case point of gain compression in the frequency band.
b. To uncouple the channel stimulus so that the channel power will be uncoupled, press: This will allow you to separately increase the power for channel 2 and channel 1, so that you can observe the gain compression on channel 2 while channel 1 remains unchanged. c. ‘lb display the ratio of channel 2 data to channel 1 data on the channel 2 display, press: This produces a trace that represents gain compression only. 7. ~~~~ and position the marker at appro~ately mid-sp~. .............................
14. To set the CW frequency before going into the power sweep mode, press: ./.::: :,.v . . . . . . ,. ; _ ; _ . . . . g) ::~~~~~~~~~~~ ~~~~:~~~ . . ~ ., :, , ,$* .. 15. Press LMenu) ~~~~~~~~~~ gaw,,;:; i.:. 16. Enter the start and stop power levels for the sweep. Now channel 1 is displaying a gain compression curve. (Do not pay attention to channel 2 at this time.) 17. ‘lb maintain the calibration for the CW frequency, press: _ :;,; ;;,:=; ‘j .yj:,;;; ;:: iy : “;;,J ~ .i : a ~:~~~~~~~6 ./ : : . ‘;. K . A.
CHl SZl 1 dB I og bin 2 dB/ MRG REF 19 01 dB 1 komresston - 9956 dB 1 3 2 dBm nREF=a PRm t CHZ B IPwr I og MRG ok 1 dB 5 dB/ R E F 0 dB 1 7 . 6 4 7 4 dB comd PRm t S T A R T - 2 5 . 0 dBm CW 1 .OOO 000 MHz STOP 0 . 0 dBm Figure 2-48.
Measuring Gain and Reverse Isolation Simultaneously Since an amplifier will have high gain in the forward direction and high isolation in the reverse direction, the gain (E&l) will be much greater than the reverse isolation (SH.). Therefore, the power you apply to the input of the amplifier for the forward measurement (SZl) should be considerably lower than the power you apply to the output for the reverse measurement (S~Z).
Note ‘lb obtain best accuracy, you should set the power levels prior to performing the calibration. However, the analyzer compensates for nominal power changes you make during a measurement, so that the error correction still remains approximately valid. In these cases, the Cor annunciator will change to CA. CHl PRm CHZ PRm Cot- START 1.000 0 0 0 MHz STOP 1 000 000 0 0 0 MHz Figure 2-49. Gain and Reverse Isolation 2.
Measurements Using the Swept List Mode When using a list frequency sweep, the HP 8753E has the ability to sweep arbitrary frequency segments, each containing a list of frequency points. Two different list frequency sweep modes can be selected: Stepped List Mode In this mode, the source steps to each defined frequency point, stopping while data is taken. This mode eliminates IF delay and allows frequency segments to overlap.
Observe the Characteristics of the Filter 1 CENTER 900.000 000 MHZ S-JAN 3uu.000 000 MHZ Figure 2-51. Characteristics of a Filter w Generally, the passband of a hlter exhibits low loss. A relatively low incident power may be needed to avoid overdriving the next stage of the DUT (if that stage contains an amplifier) or the network analyzer receiver. w Conversely, the stopband of a hlter generally exhibits high isolation.
Set Up the Lower Stopband Parameters 3. lb set up the segment for the lower stopband, press _ ; _ ., . @jg.. ;;$~S~ 1650_) m ___ . , . ., . ,. ,. :.;glF@q (88oJ IM_w ~~.,;~~~~~~~~~~,,; Lsll @ ,,.. . . :. . . . . . ./ . . . ./i :. .A .. w. . . . . . ..~ . . . i. .: .~ . . . 4. ‘Ib maximize the dynamic range in the stopband (increasing the incident power and narrowing the IF bandwidth), press 6. ‘RI specify a lower power level for the passband, press _ _ _ ., gfg#@: ..,; . . . . . . . . . . . . . . . . ., .
8. Tbmaximiz e the dynamic range in the stopband (increasing the incident power and narrowing the IF bandwidth), press: ~&j$& ;:.<. . . . :. ~~~~~~~~ Llo) Ixl) .i::.i..‘:::. g$#&gg ~#i& .>4 .l:. :. ;.; ;>. :?;: : (300_) Lxl] i..:..~ ~A. ,. . : c. .: :~.:.~~.:kG&’ .:; : .: . . . . . .A .: : . . . ,.: .: . . <:;. .,: : : .y . :. :. .: :.< (d~$r~~ g- Press iJk&~ ~~~~~~~~~~~~~h i i i./ i~.~.~.~ .~.~.~.~.~.~.~ .~.~. ~-.~.~.~.~. ~.~.~.~. ; .~.~./ Calibrate and Measure 1.
CENTER SPAN 900.000 000 MHZ 500 000 000 MHZ Filter Measurement Using Linear Sweep (Power: 0 dBm/lF BW: 3700 Hz) CENTER SPAN 900.000 000 MHZ SEGMENT I Power: +I 0 dBm IF BW: 1000 Hz I I 500.000 000 MHZ SEGMENT 3 Power: +lO dBm IF BW: 300 Hz SEGGNT 2 Power: -10 dBm IF BW: 3700 Hz pge51 e Figure 2-53.
Measurements Using the Tuned Receiver Mode In the tuned receiver mode, the analyzer’s receiver operates independently of any signal source. This mode is not phase-locked and functions in all sweep types. The analyzer tunes the receiver to a synthesized CW input signal at a precisely specified frequency. All phase lock routines are bypassed, increasing sweep speed significantly. The external source must be synthesized, and must drive the analyzer’s external frequency reference.
External Source Requirements An analyzer in tuned receiver mode can receive input signals into PORT 1, PORT 2, or R CHANNEL IN. Input power range specifications are provided in Chapter 7, (L Specifications and Measurement Uncertainties.
Tkst Sequencing Test sequencing allows you to automate repetitive tasks. As you make a measurement, the analyzer memorizes the keystrokes. Later you can repeat the entire sequence by pressing a single key. Because the sequence is defined with normal measurement keystrokes, you do not need additional programming expertise. Subroutines and limited decision-making increases the flexibility of test sequences.
Creating a Sequence 1. ‘lb enter the sequence creation mode, press: As shown in F’igure 2-55, a list of instructions appear on the analyzer display to help you create or edit a sequence. Only sequence seiect 6 IS SoYed 0 softkey to start when ,n*trument nmdifylng IS turned 0 sequence off pg697d Figure 2-55. ‘l&t Sequencing Help Instructions 2. ‘RI select a sequence position in which to store your sequence, press: This choice selects sequence position #l.
3. To create a test sequence, enter the parameters for the measurement that you wish to make. For this example, a SAW filter measurement is set up with the following parameters: The above keystrokes will create a displayed list as shown: Start of Sequence RECALLPRSTSTATE ~UIS: PMD s21 (R/R) LOG MAG CENTER 134 M/u SPAN 50 M/u SCALE/DIV AUTO SCALE 4.
Editing a Sequence Deleting Commands 1. To enter the creation/editing mode, press: Lse(Ll:~.:~~~~~~~~~~.:~~~~:: 2. ‘Ib select the particular test sequence you wish to modify (sequence 1 in this example), press: . ,. ; . . . . . . . . ., ., / _ ., ., .~~~~~‘~~~~~~, i../ . . . . . . . . . . . . . . . . ..A...... 3.
Modifying a Command 1. To enter the creation/editing mode, press: 2. To select the particular test sequence you wish to modify, (sequence 1 in this example), press: ~~~~~.:~~~~:~~~~~ . . . . . . . i. i i . . . . . A. .v.:.w The following list is the commands entered in “Creating a Sequence.’ Notice that for longer sequences, only a portion of the list can appear on the screen at one time. Start of Sequence RECALLPRSTSTATE Trans: FWD S21 (B/R) LOG MAG CENTER 134 M/u SPAN 50 M/u SCALE/DIV AUTO SCALE 3.
Changing the Sequence Title If you are storing sequences on a disk, you should replace the default titles (SEQl, SEQ2 . . . ). 1. To select a sequence that you want to retitle, press: , ,.: -: :. i”,,;*; J. .-p: . < <. :..:: .: :.: LseqJ ;;m&& ~~~~~~~~~~~~~~: . . . . . . ~.~ ~.~.~ ~.“.~ ~ ~.~ . .: ~ ~. and select the particular sequence softkey. The analyzer shows the available title characters. The current title is displayed in the upper-left corner of the screen. 2.
Storing a Sequence on a Disk 1. To format a disk, refer to Chapter 4, “Printing, Plotting, and Saving Measurement Results.” 2. To save a sequence to the internal disk, press: : ::; (,,, .* I .,q.; ... .:. ;:;.. .;~; . ,“’ : ,..~~.. ../__ ~~~~,~~~~~~~~:~~~~~~~N ad select the p&i&x sequence softkey. . . . . . . . . . . . . . . . . . .:. ..:: i: :.:..i.i...:::... . . . . : :. :. The disk drive access light should turn on briefly. When it goes out, the sequence has been saved.
Loading a Sequence from Disk For this procedure to work, the desired file must exist on the disk in the analyzer drive. 1. To view the first six sequences on the disk, press: n If the desired sequence is not among the Rrst six files, press: . ;,. _ .F / -‘. , , :‘““’ ;., . , i ; , CT.& ,j#i.#d:p m ~~~~~.~~~~~~~:~;~ until the desired me name appears, ::.>;. . , ., , , ,.,.: ,. , ,. ../ .I: T i. .,. . CT. . . :< :< . . . . . : .:>. . ‘. G. . . . . 2.
Cascading Multiple Example Sequences By cascading test sequences, you can create subprograms for a larger test sequence. You can also cascade sequences to extend the length of test sequences to greater than 200 lines In this example, you are shown two sequences that have been cascaded. You can do this by having the last command in sequence 1 call sequence position 2, regardless of the sequence title.
Loop Counter Example Sequence This example shows you the basic steps necessary for constructing a looping structure within a test sequence. A typical application of this loop counter structure is for repeating a specific measurement as you step through a series of CW frequencies or dc bias levels For an example application, see “Fixed IF Mixer Measurements” in Chapter 3. 1.
Generating Files in a Loop Counter Example Sequence This example shows how to increment the names of tiles that are generated by a sequence with a loop structure.
Start of Sequence FILE NAME DTCLOOP] PLOT NAME PLCLOOPI SINGLE SAVE FILE 0 PLOT DECR LOOP COUNTER IF LOOP COUNTER 0 THEN DO SEQUENCE 2 Sequence 1 initializes the loop counter and calls sequence 2. Sequence 2 repeats until the loop counter reaches 0. It takes a single sweep, saves the data file and plots the display. n The data file names generated by this sequence will be: DT00007.Dl through DT000001.Dl n The plot llle names generated by this sequence will be: PL00007.FP through PL00001.
This will create a displayed list for sequence 1, as shown: Start of Sequence RECALL FlEG 1 IF LIMIT TEST PASS THEN DO SEQUENCE2 IF LIMIT TEST FAIL THEN DO SEQUENCE3 2. lb create a sequence that stores the measurement data for a device that has passed the limit test, press: This will create a displayed list for sequence 2, as shown: Start of Sequence INTERNAL DISK DATA ARRAY ON FILENAME FILE0 SAVEFILE 3.
Measuring Swept Harmonics (Option 002 Only) The analyzer has the unique capability of measuring swept second and third harmonics as a function of frequency in a real-time manner. Figure 2-56 displays the absolute power of the fundamental and second harmonic in dBm. Figure 2-57 shows the second harmonic’s power level relative to the fundamental power in dBc Follow the steps listed below to perform these measurements. 1. Press t-1 I .... .:.::;.>>;.;.;/ :,:: cf p. .‘y.‘:::: $;, ,..
CHl B I CHZ START I og MRG I S dB/ I I -1 1 6 . 0 0 0 0 0 0 MHz I R E F 0 dB I STOP 1 7 . 6 7 4 2 I-xl I I 1 0 0 0 . 0 0 0 0 0 0 MHz Figure 2-57.
Measuring a Device in the Time Domain (Option 010 Only) The HP 8753E Option 010 allows you to measure the time domain response of a device. Time domain analysis is useful for isolating a device problem in time or in distance. Time and distance are related by the velocity factor of your device under test. The analyzer measures the frequency response of your device and uses an inverse Fourier transform to convert the data to the time domain.
2. ‘lb choose the measurement parameters, press: 3. Substitute a thru for the device under test and perform a frequency response correction. Refer to “Calibrating the Analyzer,” located at the beginning of this Chapter, for a detailed procedure. 4. Reconnect your device under test. 5.
8. To access the gate function menu, press: 9. To set the gate parameters, by entering the marker value, press: (?XJ (%iJJ, or turn the front panel knob to position the “T” center gate marker. 10. ‘RI set the gate span, press: : .i %pM+ (1.2) m or turn the front panel knob to position the “flag” gate markers. 11. RI activate the gating function to remove any unwanted responses, press: ##&$ ‘jg.g As shown in Figure 2-60, only response from the main path is displayed.
‘able 2-2. Gate Characteristics Gate Pas&and Eipple Sidelobe shape cntoff Gate Span Minimum zto.1 dEs -48dEt lA/Freq Span B.S/Freq Span Normal 50.1 dB -68 dB 2.8/Freq Span 6.6/Freq Span Wide fO.l dB -57 dB 4.4Freq Span 8.8Preq Span MaXimUIlI fO.O1 dB -70 dB 12.7Preq Span 26.4Freq Span LeVdS Gate spfm I NOTE: With 1601 frequency points, gating is available only in the bandpass mode. I The passband ripple and sidelobe levels are descriptive of the gate shape.
aw000024 Figure 2-62.
Reflection Response in Time Domain The time domain response of a reflection measurement is often compared with the time domain reflectometry (TDR) measurements. Like the TDR, the analyzer measures the size of the reflections versus time (or distance). Unlike the TDR, the time domain capability of the analyzer allows you to choose the frequency range over which you would like to make the measurement. 1. lb choose the measurement parameters, press: 2. Perform an SII l-port correction on PORT 1.
4. To better view the measurement trace, press: cz.$zq ~~~~~~~~ . . . . . . . . F’igure 2-64 shows the frequency domain reflection response of the cables under test. The complex ripple pattern is caused by reflections from the adapters interacting with each other. By transforming this data to the time domain, you can determine the magnitude of the reflections versus distance along the cable. Figure 2-64. Device Response in the Frequency Domain 5.
7. To enter the relative velocity of the cable under test, press: i ,; :. . ,. :.: : / .:> .<.~ ;~ ;<. Lcal] gg#q ;:~~~~:~~~~~~~~~~~ and enter a velocity factor for your cable under test. Note Most cables have a relative velocity of 0.66 (for polyethylene dielectrics) or 0.7 (for teflon dielectrics). If you would like the markers to read actual one-way distance rather than return trip distance, enter one-half the actual velocity factor.
Non-coaxial Measurements The capability of making non-coaxial measurements is available with the HP 8753 family of analyzers with TRL* (thru-reflect-line) or LRM* (line-reflect-match) calibration. For in-depth information on TRL*/LRM* calibration, refer to Chapter 6, “Application and Operation Concepts.
3 Making Mixer Measurements This chapter contains information and example procedures on the following topics: Measurement considerations . . . .
Measurement Considerations To ensure successful mixer measurements, the following measurement challenges must be taken into consideration: w Mixer Considerations . . . .
n In a down converter measurement where the ~~~,~~~~~~ softkey is selected, the notation on the analyzer’s setup diagram indicates that the analyzer’s source frequency is labeled RF, connecting to the mixer RF port, and the analyzer’s receiver frequency is labeled IF, connecting to the mixer IF port. Because the RF frequency can be greater or less than the,,,set LO frequency in this type of measurement, you can select either ~&%,,I*0 . . . . . . . . . . . . . . .or . ‘M”:% ;;J@;..
Frequency Offset Mode Operation Frequency offset measurements do not begin until all of the frequency offset mode parameters are set. These include the following: n n n n Start and Stop IF Frequencies Lo frequency Up Converter / Down Converter RF>Lo/RF
NETWORli A N A L Y Z E R pg624e Figure 3-3. B Channel External Connection 4. Measure the output power in the R channel by pressing: Observe the 13 to 16 dR offset in measured power. The actual input power level to the R channel input must be 0 dBm or less, -10 dRm typical, to avoid receiver saturation effects The minimum signal level must be greater than -35 dBm to provide sufficient signal for operation of the phaselock loop. 5.
Power Meter Calibration Mixer transmission measurements are generally configured as follows: measured output power (watts) /set input power (Watts) OR measured output power (d&n) - set input power (dBm) For this reason, the set input power must be accurately controlled in order to ensure measurement accuracy. The amplitude variation of the analyzer is specified at f 1 dB over any given source frequency.
Conversion Loss Using the Frequency Offset Mode Conversion loss is the measure of efficiency of a mixer. It is the ratio of side-band IF power to RF signal power, and is usually expressed in dB. (‘lb express ratios in dR, the dBm power in the denominator must be subtracted from the dBm power in the numerator.) The mixer translates the incoming signal, (RF), to a replica, (IF), displaced in frequency by the local oscillator, (Lo>.
11. lb perform a one sweep power meter calibration over the IF frequency range at 0 dBm, press: Because power meter calibration requires a longer sweep time,...yyou may want .“‘. .c. . to reduce the number of points before pressing ~~~;~~~~. After the power meter calibration is finished, return the number of points to its originaI value and the analyzer wilI automatically interpolate this calibration. Note 12.
15. To select the converter type and a high-side Lo measurement configuration, press: &&f&g : . ,. ., v. .;. :. ~6~,~~.~~~~. /. .~ /. ~ . . . . T., . : ;L?.: <: . . . . . . . . , , . . . &&Jal~ .i Notice in this high-side LO, down conversion configuration, the analyzer’s source is actuahy sweeping backwards, as shown in Figure 3-7. The measurement setup diagram is shown in Figure 3-8. 100 MHz 350 550 650 900 1 GHz pg6155d Figure 3-7.
18. ‘lb view the conversion loss in the best vertical resolution, press: Figure 3-9. Conversion Loss Example Measurement Conversion loss/gain = output power - input power In this measurement, you set the input power and measured the output power. Figure 3-9 shows the absolute loss through the mixer versus mixer output frequency. If the mixer under test contained built-in amplification, then the measurement results would have shown conversion gain.
High Dynamic Range Swept RF/IF Conversion Loss The HP 8753E’s frequency offset mode enables the testing of high dynamic range frequency converters (mixers), by tuning the analyzer’s high dynamic range receiver above or below its source, by a fixed offset. This capability allows the complete measurement of both pass and reject band mixer characteristics. ‘Ihe analyzer has a 35 dl3 dynamic range limitation on measurements made directly with its R (phaselock) channel.
NETWORK ANALYZER n HP-If? 500 TERMINATION 1. POWER METER I I pg628e Figure 3-10. Connections for Broad Band Power Meter Calibration 4. Select the HP 8753E as the system controller: 5. Set the power meter’s address: _"',",","'," ., : :~;,;, ;,_',;,;,',;,~ x: i 6. S&&the appropriate power meter by pressing ~~~~~~~~~~~~~: mtfl t,he comea mode] displayed (HP 436A or HP 438A/437) *.._........ :.:::::: 2;:;;:::;:::>;:::;w:n::..::: .;=* >;; number is 8.
9. Connect the measurement equipment as shown in Figure 3-11. pg625e Figure 3-11. Connections for Eeceiver Calibration 10. Set the following analyzer parameters: @jgg=p 11. To calibrate the B-channel over the IF range, press: Once completed, the analyzer should display 0 deem. 12. Make the connections shown in Figure 3-12. 13. Set the Lo source to the desired CW frequency and power level.
NETWORK ANALYZER 1 IO dB FILTER EXTERNAL LO SOURCE pg630e Figure 3-12. Connections for a High Dynamic Range Swept IF Conversion Loss Measurement 14. To set the frequency offset mode LO frequency, press: 15. To select the converter type and low-side Lo measurement configuration, press: In this low-side Lo, down converter measurement, the analyzer’s source frequency range wiII be offset higher than the receiver frequency range.
START 100 000 000 MHZ STOP 1 000 000 ocin MHZ Figure 3-13.
Fixed IF Mixer Measurements A fixed IF can be produced by using both a swept RF and LO that are offset by a certain frequency. With proper filtering, only this offset frequency will be present at the IF port of the mixer. This measurement requires two external RF sources as stimuli. Figure 3-15 shows the hardware configuration for the fixed IF conversion loss measurement.
tdETWORK A N A L Y Z E R EXT REFERENCE OUT EXT REFERENCE IN 10 dB EXTERNAL RF SOURCE 6 dB EXTERNAL LO SOURCE pg631e Figure 3-14. Connections for a Response Calibration 4. Press the following keys on the analyzer to create sequence 1: Note To enter the following sequence commands that require titling, an external keyboard may be used for convenience. Performing a Response Calibration _ LMeas) ~~~~~~~~~, a . .. (jjj&Q ~~~~ ~~~ ~~~~~,~~ . . .~.~;~;. . . . . . . . . . . . .i . _. . . . . . . . . . . .
bOmpting the User to Co~etct a Mixer to the l&t Set Up &gg . i.... _. . . . . . . .A. ~ .~~~~~~~~~~~ .Y. .A;.. .-. . . . . . . . . . . . . . . . . . . . . . <. . . . . . . . z. i i . __ ::x . . . . . . . . . . . . . . . . . ., . . . . . . . iPAVSE C Initializing a Loop Counter Value to 26 LsefL) ~~~~~~~~~6~~~ nmxiigN WiG .i.-. . . . -. . . . :.A.
CaUing the Next Measurement Sequence SEQUENCESEQl Start of Sequence RECALL PRST STATE SYSTEM CONTROLLER TUNED RECEIVER EDITLIST ADD CUFREQ lOOM/u NUMBER OF POINTS 26x1 DONE DONE LIST FREQ B TITLE POW:LEVGDBM PERIPHERAL HPIB ADDR 19x1 TITLETO PERIPHERAL TITLE FREQ:MODE CW;CW 1OOMHZ TITLE TO PERIPHERAL CALIBRATE: RESPONSE CAL STANDARD DONECAL CLASS TITLE CONNECT MIXER PAUSE LOOP COUNTER 26x1 SCALE/DIV 2x1 REFERENCE POSITION 0x1 REFERENCE VALUE -20x1 MANUAL TRG ON POINT TITLE FREQ:MODECW;CU5OOMHZ;:FREQ:CW:STE
TITLE FREQ:MODECW;CW 6OOMHZ;:FREQ:CW:STEP 100MHZ TITLETO PERIPHERAL DO SEQUENCE SEQUENCE2 Sequence 2 Setup The following sequence makes a series of measurements until all 26 CW measurements are made and the loop counter value is equal to zero. This sequence includes: taking data incrementing the source frequencies w decrementing the loop counter n labeling the screen n n 1.
. . . . . ./. .%. . press m ~~~~~~~~~~~~‘~~ ~~~~~~~~~~~~‘-I~~~, and the analyzer m display the . . . . . . . . . . ; .; . . . . . . .: .:. . . . . . . . . . i: :.: ii . A. i; :. :.~. ;. i . . . . . . . following sequence commands: SEQUENCESEQ2 Start of Sequence WAITx .1x1 MANUALTRG ONPOINT TITLE FREQ:CWUP PERIPHERAL HPIB ADDR 19x1 TITLETO PERIPHERAL PERIPHERAL HPIB ADDR 21x1 TITLETO PERIPHERAL DECR LOOP COUNTER IFLOOP COUNTERoOTHENDO SEQUENCE2 TITLE MEASUREMENT COMPLETED 2.
START 100.000 000 MHZ S T O P 1 0 0 . 0 0 0 000 M H Z Figure 3-16. Example Fixed IF Mixer Measurement The displayed trace represents the conversion loss of the mixer at 26 points. Each point corresponds to one of the 26 different sets of RF and LO frequencies that were used to create the same tied IF frequency.
Phase or Group Delay Measurements For information on group delay principles, refer to “Group Delay Principles” in Chapter 6. The accuracy of this measurement depends on the quality of the mixer that is being used for calibration and how well this mixer has been characterized. The following measurement must be performed with a broadband calibration mixer that has a known group delay.
550 MHz LOW PASS FILTER 10 d8 10 dB REFERENCE MIXER CONVERTER CALIBRATION MIXER h EXTERNAL LO SOURCE pg633e Figure 3-17. Counections for a Group Delay Measurement 5. To set the frequency offset mode LO frequency from the analyzer, press: _. ,. ,_ .,.,.,. .,. .,. ..,..,.. i_..._ .. _ . . ~~~~~ ~~~~~~::~, m @JpJ _____ 6. To select the converter type and a high-side LO measurement configuration, press: 7. ‘lb select the format type, press: , . . . ... . . . . . . . . . (jz;) DELAY :. . . . . . . . .
8. To make a response error-correction, press: 9. Replace the “calibration” mixer with the device under test. If measuring group delay, set the delay equal to the “calibration” mixer delay (for example -0.6 ns) by pressing: 10. Scale the data for best vertical resolution. Ctll * PRm Cor Del Smo Hld Ofs -CENTER .300 000 000 GHz SPAN .lOO 000 000 GHz Figure 3-18. Group Delay Measurement Example The displayed measurement trace shows the device under test delay, relative to the “calibration” mixer.
Amplitude and Phase Tracking Using the same measurement setup as in “Phase or Group Delay Measurements,” you can determine how well two mixers track each other in terms of amplitude and phase. 1. Repeat steps 1 through 8 of the previous “Group Delay Measurements” section with the following exception: In step 7, select w $&I2 i . . . . . i..; / . 2. @ce the analyzer ha displayed the meauementres&s, pressIDioplay)~~~~~~. 3. Replace the calibration mixer with the mixer under test.
Conversion Compression Using the Frequency Offset Mode Conversion compression is a measure of the maximum RF input signal level, where the mixer provides linear operation. The conversion loss is the ratio of the IF output level to the RF input level. This value remains constant over a specified input power range. When the input power level exceeds a certain maximum, the constant ratio between IF and RF power levels will begin to change.
Caution ‘Lb prevent connector damage, use an adapter (HP part number 1250-1462) as a connector saver for R CHANNEL IN. NETWORK ANALYZER pg634e Figure 3-20. Connections for the First Portion of Conversion Compression Measurement 5. lb view the absolute input power to the analyzer’s R channel, press: o :~~~~~~~~ se& 6.
Caution To prevent connector damage, use an adapter (HP part number 1250-1462) as a connector saver for R CHANNEL IN. NETWORK ANALYZER IO dB MIXER UNDER TEST 3 dB EXTERNAL LO SOURCE pg635e Figure 3-21. Connections for the Second Portion of Conversion Compression Measurement 8. To set the frequency offset mode Lo frequency, press: 9. To select the converter type, press: 10.
The measurements setup diagram is shown in Figure 3-22. FREO OFFS ON off LO MENU DOWN CONVERTER UP CONVERTER RF > LO I RF < LO VIEW MEASURE RETURN NETWORK ANALYZER CW: BOO MHz CW. 200 MHz 600 MHz 13 dBm pg636e Figure 3-22. Measurement Setup Diagram Shown on Analyzer Display 11. To view the mixer’s output power as a function of its input power, press: ;_ ; . , .;_.;*i/i i.;.<. I-- __. ;.__.~ ~~~~~ ,. . . . ../:. . : . .s. . . . ~. L~.. . .~ i As. %.>.:; Iii. ..A. .>;z ..A . .i . . . . 12.
Figure 3-23.
Isolation Example Measurements Isolation is the measure of signal leakage in a mixer. Feedthrough is specificalIy the forward signal leakage to the IF port. High isolation means that the amount of leakage or feedthrough between the mixer’s ports is very small. Isolation measurements do not use the frequency offset mode. Figure 3-24 illustrates the signal flow in a mixer. RF Feedthrough IF Feedthrough pg6105d Figure 3-24.
NETWOi?K A N A L Y Z E P Note A full 2 port calibration will increase the accuracy of isolation measurements. Refer to Chapter 5, “Optinking Measurement Results.” 6. Make the connections as shown in Figure 3-26. NETWORK ANALYZER T RF LO IF 5orl LOAD Figure 3-26. Connections for a Mixer Isolation Measurement 7. Tb adjust the display scale, press: The measurement results show the mixer’s LO to RF isolation.
I I I I I I I I I Figure 3-27. Example Mixer ID to RF Isolation Measurement RF Feedthrough The procedure and equipment configuration necessary for this measurement are very similar to those above, with the addition of an external source to drive the mixer’s LC port as we measure the mixer’s RF feedthrough. RF feedthrough measurements do not use the frequency offset mode. 1. Select the CW Lo frequency and source power from the front panel of the external source.
NETWORK ANALYZER / pg637e Figure 3-28. Connections for a Response Calibration ., . ,. / _ _ _ . . . . ,’ Ji., . . . . . 6. Perfom a response calibration by pressing Lcal) ~~~~~~~~~~ ~~~~~~~~ ;-. i:.: ;. ,.~.:~~~~~~.:., . , , . . :; : . . . . . . . . . . . . . . . . . . . . . . . . . . . 7. Make the connections as shown in Figure 3-29. NETWORK ANALYZER @ EXTERNAL SOURCE pg639e Figure 3-29. Connections for a Mixer RF Feedthrough Measurement 8. Connect the external LO source to the mixer’s LO port. 9.
START 10 000 000 MHZ STOP 3 000.000 000 MHZ Figure 3-30. Example Mixer RF Feedthrough Measurement You can measure the IF to RF isolation in a similar manner, but with the following modifications: n n Use the analyzer source as the IF signal drive. View the leakage signal at the RF port.
Printing, Plotting, and Saving Measurement Results This chapter contains instructions for the following tasks: w Printing or plotting your measurement results 0 Conl@ring a print function •I Defining a print function 0 Printing one measurement per page 0 Printing multiple measurements per page 0 Printing time 0 Configuring a plot function q De&ring a plot function 0 Plotting one measurement per page using a pen plotter 0 Plotting multiple measurements per page using a pen plotter 0 Plotting time q Plotting
Where to Look for More Information Additional information about many of the topics discussed in this chapter is located in the following areas: n Chapter 2, “Making Measurements, n contains step-by-step procedures for making measurements or using particular functions. E Chapter 8, “Menu Maps, n shows softkey menu relationships. m Chapter 9, “Key Definitions,” describes all the front panel keys, softkeys, and their corresponding HP-IB commands.
Printing or Plotting Your Measurement Results You can print your measurement results to the following peripherals: w printers with HP-IB interfaces n printers with parallel interfaces w printers with serial interfaces You can plot your measurement results to the following peripherals: w HPGL compatible printers with HP-IB interfaces HPGL compatible printers with parallel interfaces w plotters with HP-IB interfaces w plotters with parallel interfaces w plotters with serial interfaces n Refer to the “Compati
0 &&&$ (except for HP D&J&, 540 ad De&J& @iOC) . ...<..: ,.,..,.... ::.:.......:...<.: . i /.i./. ...~~~~~~~~~ :: .:. :.:. : i. ;i. . ., . .. (printers that conform to the ESUP2 printer control language) //,. ,.,.; “i ‘.‘, , , •I ., . ;.#$!‘#j#@ .:. . . . . . . . . :;.T.T .:.T. . (for use with the HP DeskJet 540 and DeskJet85OC) q &le&hg ‘~~~~.- converts 100 dpi rater information to 300 dpi raster format. Note ..>;.:..:::..: /:::: %i...S...
. Choose :&$& .. .:. ;. . ~: . :~. . ,~., .: .: if your printer has a serial (RS-232) interface, and then configure the print function as follows: ;,.: :. , : a. fiess ~~~:;~~~~~~~:. ad enter the printer’s : ..~~~....:....:.,.,.:.,.:.:.,.:~ ,,,,,,,......: ..:.,<<<.,.;>z . . . . l...~~:..~~.,.,..l~.‘.:.. baud rate, fo~owed by a). b. ‘Ib select the transmission control method that is compatible with your printer, press ~~~~,~~~~~:~, (transmit control - handshaking protocol) until the correct method appears.
If Yim Are Using a Color Printer 2. If you want to modify the print colors, select the print element and then choose an available color. Note You can set all the print elements to black to create a hardcopy in black and white. Since the media color is white or clear, you could set a print element to white if you do not want that element to appear on your hardcopy. To Reset the Printing Parameters to Default Values ‘lhble 4-1.
Printing Multiple Measurements Per Page 1. Configure and define the print function, as explained in “Conliguring a Print Function” and “Defining a Print Function” located earlier in this chapter. 2. . . ., _ Press@ ~~~~~~~~~~ ad then press.&@'&$&# mtfl the softkey label appears a / i _ i ;:;; ii ;;;;; ;: ~~~~~~~~. i..: 3. i.. Press~~~,,~~~~~~~~~~~~ito ,.. .,, ,. ..: ,.,,. ::..:..:.::l:.:::... ..::..: ..:.. . . . ..I.::.:. .:::
a. Enter the HP-IB address of the printer (default is 01), followed by @). I i i/ 7; . : b. press LLocal) and .~~~~~~~~~~; if there is no external control& come&d to ,. the HP-IB bus. ., :.v.: :, : / :. . . . .!:. : ii c. Press LLocal) and :#N!@&&$ ,,CQ#&&$ if there is an external controller connected to the HP-IB bus. . Choose ~~~~ if your printer has a parallel (centroics) %............i i . ....A.... :i./.. . ..... interface, ad then conawe the print function as follows: q ._. . :_. . ./ *.i;l,. i. .
If Yim Are Plotting to a Pen Plotter and then @ii. &g. Mti, .: . . . . . i. ., ;:.:< < .<. : 2. Configure the analyzer for one of the following plotter interfaces: ‘:,. ‘,: ; .c<: :. . : <>+,; z;.;. ., I:” ,. n Choose;.i . .~~~~~~~~~~~~~~. . . . . . ~., ;~;. ;~;~:.~ . ,. ;: : . if your plotter has an HP-IB interface, and then conllgure the plot function as follows: a. Enter the HP-IB address of the plotter (default is 05), followed by (ZJ .
If You Are Plotting to a Disk Drive Caution Do not mistake the line switch for the disk eject button. See the llgure below. If the line switch is mistakenly pushed, the instrument will be turned off, losing all settings and data that have not been saved. DISK EJECT BUTTON L LINE SWITCH’ . . . .. .. .. .. .. .. .. .. .. ... ... ... .. . . . . . . . . . .. .. .. .. .. .., ._. . . Choose ‘~~~~~~~~ if you if you will plot to the analyzer internal disk drive. ... .... ... ... ........ ..... ..
Defining a Plot Function Note The plot definition is set to default values whenever the power is cycled. However, you can save the plot definition by saving the instrument state. Choosing Display Elements 2. Choose which of the following measurement display elements that you want to appear on your plot: q Choose ~~~~,~~~~~~~~ if you wmt the measurement data trace to appear on your p1ot. q q $ z <: ,: ; : :z; ., , .y , s. y . . . . Choose :~~~~~~~~~~~ B,.:‘> : .:< < . .:::. .& , . . . . . s. . ; . . . .
Note me peripheral ignores &$$&&& ::. . . . . i: ii: . . . :
Selecting Line Types 5. Press Hk%kI& . : ; .-I: ;..and select each plot element line type that you want to modify. ..“zmg ###$~.:>s: q Select .!!+@!xiA.~ /. : . .: to modify the line type for the data trace. Then enter the new Iine type (see Figure 4-5), followed by @. 0 Select ~~~~~~~~~~~~~. . >. h. ~ . . . . . . ,. :. :. . .,. ;: vi; , , ,. ;. .:. : :. +:<.:s.>:. I::.. to modify the line type for the memory trace. Then enter the new line type (see F’igure 4-5), followed by @. ‘lhble 4-4.
Choosing Scale 6. press ~&&&&& mtd the selection appears that you want. ,. ,. . _. .; _ _ ,. q Choose ~~~~,~,~~~~~~~~~:~;;,if you want the normal scale selection . . . . . . . . . . . i.... i. . ;. ;.;. . .A. w; . . . . . . . . . ..i. i for plott~g. lJ-& includes space for all display annotations such as marker values and stimulus values. The entire analyzer display fits within the defined boundaries of Pl and P2 on the plotter, while maintaining the exact same aspect ratio as the display. :Bi:,~,~ .
To Reset the Plotting Parameters to Default Values ‘lhble 4-5. Plotting Parameter Default Values Marker I- I 7 I Plotting One Measurement Per Page Using a Pen Plotter 1. Configure and define the plot, as explained in “Configuring a Plot Function” and “Defining a Plot Function” located earlier in this chapter. 0 If you d&r& the ~~~~~~~:~~~~.:. press ~~~~~~~~~~:~~~~~ after the message .... ...i..~~....................... . . .. .w.. ..../:........ .:. .:....::..::: .._............................
Plotting Multiple Measurements Per Page Using a Pen Plotter 1. Configure and dehne the plot, as explained in “Configuring a Plot Function” and “DeGning a Plot Function” located earlier in this chapter. 3. Choose the quadrant where you want your displayed measurement to appear on the hardcopy. The following quadrants are available: q ,~~~~~~~;~ ” :. ... f-J ~~:~~~~~~ ,: . . . . .I+.: q ;~~~~,~;;;~~~~~ . ‘. i..i.ii . ...i. .i . . .: .r. ..... .. A i ii . . . . i i..... .A . . . s..s. /.. . . . . . . . . .
4-l 8 Printing, Plotting, and Saving Measurement Results
Plotting a Measurement to Disk The plot llles that you generate from the analyzer, contain the HPGL representation of the measurement display. The files will not contain any setup or formfeed commands. 1. Configure the analyzer to plot to disk. a. Press LLocal) .~~~~~~~~~~~.: J+g#pEB PORT &i! . .i b- Press I-) ~.~~~~~~~,~~;, .._............... i i .A. . . Land select the &Sk &he that you m plot to. The analyzer assigns the first available default lilename for the displayed directory.
To Output the Plot Files n n You can plot the files to a plotter from a personal computer. You can output your plot files to an HPGL compatible printer, by following the sequence in “Outputting Plot Files from a PC to an HPGL Compatible Printer” located later in this chapter. w You can run a program that plots all of the files, with the root filename of PLOT, to an HPGL compatible printer.
Using AmiPro ‘Ib view plot files in AmiPro, perform the following steps: 1. Prom the FILE pull-down menu, select IMPORT PICTURE. 2. In the dialog box, change the file Type selection to HPGL. This automatically changes the flle suflix in the filename box to *.PIT. Note The network analyzer does not use the sutllx *. PIT, so you may want to change the flename filter to * . * or some other pattern that will allow you to locate the files you wish to import. 3. Click OK to import the tile. 4.
Using Freelance ‘Ib view plot files in Freelance, perform the following steps: 1. From the FILE pull-down menu, select IMPORT. 2. Set the file type in the dialog box to HGL. Note The network analyzer does not use the sulllx *.HGL, so you may want to change the tllename filter to *. * or some other pattern that will allow you to locate the llles you wish to import. 3. Click OK to import the file. n You will notice that when the trace is displayed, the text annotation will be illegible.
Outputting Plot Files from a PC to an HPGL Compatible Printer To output the plot files to an HPGL compatible printer, you can use the HPGL initialization sequence linked in a series as follows: Step 1. Store the HPGL initialization sequence in a hle named hpglinit. Step 2. Store the exit HPGL mode and form feed sequence in a file named exithpgl. Step 3. Send the HPGL initialization sequence to the printer. Step 4. Send the plot file to the printer. Step 5.
Step 2. Store the exit HPGL mode and form feed sequence. 1. Create a test file by typing in each character as shown in the left hand column of l%ble 4-7. Do not insert spaces or linefeeds. 2. Name the file exithpgl. ‘lbble 4-7. HPGL ‘I&t File Commands I Command Remark I Step 3. Send the HPGL initialization sequence to the printer. Step 4. Send the plot llle to the printer. Step 6. Send the exit HPGL mode and form feed sequence to the printer.
Outputting Multiple Plots to a Single Page Using a Printer Refer to the “Plotting Multiple Measurements Per Page Using a Disk Drive, n located earlier in this chapter, for the naming conventions for plot files that you want printed on the same page. You can use the following batch file to automate the plot hle printing. This batch file must be saved as “do-plot.bat.
Plotting Multiple Measurements Per Page From Disk The following procedures show you how to store plot files on a LIF formatted disk.
6. Define the next measurement plot that you will be saving to disk. 7- Press (GJJ ~~~$!~~. ,. , . :. .i . : . The analyzer will assign PLOTOOFP because you renamed the last file saved. 8. Press cm) and turn the front panel knob to highlight the name of the hle that you just saved. .,. ., .,. . . . . . . ,. . ,.,.,._ >;< (#~;&.*~ ES. ,. .,_;/ _.,... 9. press i~~~~~~~~~~ $#&&$~~,J~~ and turn the front panel knob to place the r pointer :. i:,.:,~.:. :.: .~,.:.: ,.: , ,. :.:.:.~.:p. :.:.:.:.~:.~ ~. :.:.~.:.
To Plot Measurements in Page Quadrants 1. Deilne the plot, as explained in “Defining the Plot Function” located earlier in this chapter. 3. Choose the quadrant where you want your displayed measurement .f:’.. .,.. ‘/”appear ;/ /.. . . .,.. . . . .+..to . C .-i on the hardcopy. The selected quadrant appears in the brackets under S$Ig#IJlJ&. . . . ... . ~. .~.~. i./ Pg&5e Figure 4-11. Plot Quadrants 4. Press ~~~~~. me an.&yzer assigns the first av,&able default flenme for the sele&ed quadrant.
Titling the Displayed Measurement You can create a title that is printed or plotted with your measurement result. __, ,. ,. ,.: :. . .:~ . , 1. press I-) ~$&#@~ /&&$ to access the title menu. . : : . . . . ..: ;: . .A: .....i. . :.~. . ; ; ;. . 3. Turn the front panel knob to move the arrow pointer to the first character of the title. 5. Repeat the previous two steps to enter the rest of the characters in your title. You can enter a title that has a maximum of 50 characters. Press ~~~~~~~~~~.
Confqjuring the Analyzer to Produce a Time Stamp You can set a clock, and then activate it, if you want the time and date to appear on your hardcopies. 2. 3. press &$‘:&& ad enter the current ..:,. :.:::....:;;>>n:; ,,,,. :,ji ,.,.... ye= (four digits), followed by press ~~~~~~~ a& enter the -ent month of the yeq followed . . . . . . . . . . . . . . . . ...,.. . . . . . . .;..: i;. ;. ;. ;. ( ml. X 1 ) . 4. Press .$I@ .;>. .:~. ~x: :x.‘&# x . A.
3. Repeat the previous two steps until you have created hardcopies for all the desired pages of listed values. If you are printing the list of measurement data points, each page contains 30 lines of data. The number of pages is determined by the number of measurement points that you have selected under the LMenu) key. If You Want the Entire List of Values Choose $&8X UC to print all pages of the listed values.
Solving Problems with Printing or Plotting If you encounter a problem when you are printing or plotting, check the following list for possible causes: n Look in the analyzer display message area. The analyzer may show a message that will identify the problem. Refer to the “Error Messages” chapter if a message appears.
Saving and Recalling Instrument States Places Where Ybu Can Save analyzer internal memory floppy disk using the analyzer’s internal disk drive n floppy disk using an external disk drive w IBM compatible personal computer using HP-IB mnemonics n n What You Can Save to the Analyzer’s Internal Memory The number of registers that the analyzer allows you to save depends on the size of associated error-correction sets, and memory traces.
What You Can Save to a Computer Instrument states can be saved to and recalled from an external computer (system controller) using HP-IB mnemonics. For more information about the specific analyzer settings that can be saved, refer to the output commands located in the “Command Reference” chapter of the HP 8753E Network Analyzer Programmer’s Guide.
Saving an Instrument State l- Press [m) ~$&EtX’DJTiX and select one of the storage devices: :, ; “’ ,. . . . . . ; , . . : : 0 ~~~~~~~~ i /i . ;a . . . . ..i.... :.: .: . /*: . ‘:. ;. . . .: . ., :.,// 0 ~~~~~~~~~:,;; . > i /.i .i :: . . . . . . . ..... i. j. . . . . . . . : :.:.: q i~~$I!%#&& . . . I%!%.:, connect an external disk drive to the analyzer’s HP-IB connector, and configure as follows: ., ., ,. a. press (Local) #&$~ .$&f&@~ and enter the drive where you &Sk is located, .i. T. . . A. . i.i >.
Saving Measurement Results Instrument states combined with measurements results can only be saved :,.: . .:. . . :. . :. . . ..q.ito .:disk. ., :. : ,.: .;:. : : ,.: .: : :. -: ::Files .:; *:,. . ;., that contain data-only, and the various save options available under the l%IQ#I# ~~~~~#WlJ key, are also only valid for disk saves. The analyzer stores data in arrays along the processing flow of numerical data, from IF detection to display.
t --+SWEEP/SWEEP-) R A W D A T A AVERAG I NG ARRAYS --) E R R O R CORPECTION jgTJ!q I GATING (OPT 010) I I S M O O T H I N G I + DATA ARRAYS + TRACE MATH - +, TRANSFORM ( O P T OIOJ I I + FoRMAT + ARRAYS pb6lOld Figure 4-12. Data Processing Flow Diagram Note If the analyzer has an active two-port measurement calibration, all four S-parameters will be saved with the measurement results All four S-parameters may be viewed if the raw data array has been saved. 1.
f. Press m and select one of the following: : ;,:p .‘);. .:<. .:’ .VB . . . . . . .: ,: :: 0 Choose ‘:~~~~~~~~ to allow the analyzer to control peripherals directly. .: : .: . . . .: ._.,.,. _ 0 Choose ~~~~~~~ to allow the computer controfler to be involved h a :i:. . . . i. ;.m. i . : . .;:. z.: .: . ., , , .,w . :. peripheral access operations. q Choose :~~~~~~~~ to allow yowself to control the analyzer Over HP-IB and also :
ASCII Data Formats CITIFile (Common Instrumentation Transfer and Interchange flle) is an ASCII data format that is useful when exchanging data between different computers and instruments. CITIhles are always saved when the ASCII format has been selected as shown below: .,. : ) . . . . . . . ~. . . . . .:.:. . :.:.:<.:.:. / : . ,. :.:. ,/. i i ..... ; If ~~~~~~~~..“~~ or ,~~~~~~~~~~,, ;i . . . . . &: ..::.z . . . . . . . . ’ or ;~~~~~..;,~~~~~:~~ is s&y&d, ., ,.,_,,,.; , .,. __ _.,..
The template for component data fiIes is as follows: ! comment line t ...
Re-Saving an Instrument State If you re-save a Gle, the analyzer overwrites the existing file contents. Note You cannot re-save a file that contains data only. You must create a new file. ‘lb Delete an Instrument State File q Press the QD &) keys or the front panel knob to highl&ht the name of the file that you want to delete. ii .: . -<.+‘:.?, ‘, ‘:““‘:,‘.~:,~i ::ccw*, ;: y!j i’- ___..,.; ;,_;;_.,; ,, Press ~~,~~~~~~~~~~~: ~~~~~~~~ ,=,I to delete a of the ties that m&e up the . . . .../ . ../,. . . .
Renaming a File 2. Choose from the following storage devices: >:< .:. . . :. :: ;pi i”x <>. <$..:p. . . . . . . . . . . . 0 !.~~~~.:~~~~~ . . . .:.<2. : <\.; : : .,/, i. . .L .:. : : . ;. : .A. .w; . ,. , ;,.; q .~~~~~~~~~ :: :., :..,.: ,., . : .~..:-:...... .:: .<.L:~.. .....v.:.:.<.,:. .: .:,. ..7:.; .,.,:.,:.“. ,/ .,: ,.:,.:,~ 0 ~:~~~~~~~~~ ; t. . ..:.:.:~ ...~.:.; .~.~ ,. ;.;...:x;: i... c .. .I....;>...<: ,., ;.,.:.;.:.: :x 3.
Formatting a Disk 2. Choose the type of format you want: Solving Problems with Saving or Recalling Files If you encounter a problem when you are storing flies to disk, or the analyzer internal memory, check the following list for possible causes: w Look in the analyzer display message area. The analyzer may show a message that will identify the problem. Refer to the “Error Messages” chapter if you view a message. n Make sure that you are NCYI using a single-sided floppy disk in the analyzer disk drive.
5 Optimizing Measurement Results This chapter describes techniques and analyzer functions that help you achieve the best measurement results.
Where to Look for More Information Additional information about many of the topics discussed in this chapter is located in the following areas: w Chapter 2, YMaking Measurements,” contains step-by-step procedures for making measurements or using particular functions. n Chapter 4, “Printing, Plotting, and Saving Measurement Results,” contains instructions for saving to disk or to the analyzer internal memory, and printing and plotting displayed measurements.
Frequency Drift Minute changes in frequency accuracy and stability can occur as a result of temperature and aging (on the order of parts per million). If you require greater frequency accuracy, do the following: w Override the internal crystal with a high-stability external source, frequency standard, or (if your analyzer is equipped with Option lD5) use the internal frequency standard.
Measurement Error-Correction The accuracy of network analysis is greatly influenced by factors external to the network analyzer. Components of the measurement setup, such as interconnecting cables and adapters, introduce variations in magnitude and phase that can mask the actual response of the device under test. Error-correction is an accuracy enhancement procedure that removes systematic errors (repeatable measurement variations) in the test setup.
‘I&ble 5-2. Purpose and Use of Different Error-Correction Procedures ca-rection Procednre Corresponding Measurement Transmission or reflection measurement when the highest accuracy is not required. Response Errors Carmeted Stamkrd DWiCeS Frequency response. Thru for transmission, open or short for reflection. Transmission of high insertion loss Frequency response plus devices or reflection of high return isolation in transmission or loss devices. Not as accurate as djrectivity in reflection.
Calibration Standards The quality of the error-correction is limited by two factors: (1) the difference between the model of the calibration standards and the actual electrical characteristics of those standards, and (2) the condition of the calibration standards. lb make the highest quality measurement calibration, follow the suggestions below: H Use the correct standard model. n Inspect the calibration standards n Clean the calibration standards, H Gauge the calibration standards.
Note The Preset State of the instrument can be yd@.ued so that . . . ...“..” _ . . . in@polated eflor-co~e&ion is on or off. Press (22) ~~~~~~~~~~~~~. ::~~~~~~~~~~ / , . / . . , . . . L. . i . . . . . . . . . . . . . . s. : ., ,., . : .: C..i . . . . s.Ms.; ; .i .A. . w . . . . . . . . . . . . .:;. . .i ii. . A.:. . . A. . -: : : ; : 1:1 : i . . . . . : :;, ., .*:. . . . ~ . : .i ,‘=~;,:, .I . ~ ~ :~~~~~~~~~~. .;;gJ&g& ,&f&p ~&q-&y to configure the preset &.tate of .:. ;.m; i . . . . . . . . L..l. . . . .
Procedures for Error-Correcting Your Measurements This section has example procedures or information on the following topics: n frequency response correction n frequency response and isolation correction n one-port reflection correction n full two-port correction n TRL*/LRM* correction n modifying calibration kit standards n power meter measurement calibration procedure Note 6-8 If you are making measurements on uncoupled measurement channels, you must make a correction for each channel.
Frequency Response Error-Corrections You can remove the frequency response of the test setup for the following measurements: reflection measurements w transmission measurements n combined reflection and transmission measurements n Response Error-Correction for Reflection Measurements 1. Press w). 2. Select the type of measurement you want to make. q If you want to make a reflection measurement on PORT 1 (in the forward direction, Sil), leave the instrument default setting.
NETWORK ANALYZER I SHORT OPEN SHORT TEST POPT CABLES OPEN FOR S, 1 RESPONSE pq610e Figure 5-1. Standard Connections for a Response Error-Correction for Reflection Measurement q To measure the standard when the displayed trace has settled, press: If the calibration kit you selected has a choice between male and female calibration standards, remember to select the sex that applies to the test port and not the standard.
Response Error-Correction for Transmission Measurements 1. Press LPresetJ. 2. Select the type of measurement you want to make. q If you want to make a transmission measurement in the forward direction (&), press: q If you want to make a transmission measurement in the reverse direction (&a), press: 3. Set any other measurement parameters that you want for the device measurement: power, number of points, IF bandwidth. 4. To select a response correction, press: 5.
Note Do not use an open or short standard for a transmission response correction, Note You can save or store the measurement correction to use for later measurements. Refer to the ‘Printing, Plotting, and Saving Measurement Results” chapter for procedures. 7. This completes the response correction for transmission measurements. You can connect and measure your device under test.
Note You can save or store the measurement correction to use for later measurements. Refer to the “Printing, Plotting, and Saving Measurement Results” chapter for procedures. 7. This completes the receiver calibration for transmission measurements. You can connect and measure your device under test.
Frequency Response and Isolation Error-Corrections removes frequency response of the test setup removes isolation in transmission measurements w removes directivity in reflection measurements n n You can make a response and isolation correction for the following measurements: w reflection measurements N transmission measurements n combined reflection and transmission measurements Response and Isolation Error-Correction for Reflection Measurements Although you can perform a response and isolation correctio
NETWORK ANALYZER F O R S,, R E S P O N S E F O R S22 R E S P O N S E SHORT F O R OPEN S,, ,SOLATlON b LOAD LOAD pg612e Figure 5-4. Standard Connections for a Response and Isolation Error-Correction for Reflection Measurements 8. To measure the standard, press: If the calibration kit you selected has a choice between male and female calibration standards, remember to select the sex that applies to the test port and not the standard.
Response and Isolation Error-Correction for Transmission Measurements This procedure is intended for measurements that have a measurement range of greater than 9 0 dB. 1. Press IpresetJ. 2. Select the type of measurement you want to make. q If you want to make a transmission measurement in the forward direction (&I), press: q If you want to make a transmission measurement in the reverse direction (E&2), press: 3.
FOR RESPONSE POSSIBLE ADAPTERS FOR ISOLATION LOAD LOAD pg613e Figure 5-5. Standard Connections for a Response and Isolation Error-Correction for Transmission Measurements Note If you will be measuring highly reflective devices, such as filters, use the test device, connected to the reference plane and terminated with a load, for the isolation standard. 10. ‘Ib help remove crosstalk noise, set the analyzer as follows: .“:.: .,(.:.:., , , /. , , ., ,., . -‘E>. a.
One-Port Reflection Error-Correction H removes directivity errors of the test setup n removes source match errors of the test setup w removes frequency response of the test setup You can perform a l-port correction for either an S11 or an S22 measurement. The only difference between the two procedures is the measurement parameter that you select. Note This is the recommended error-correction process for all reflection measurements, when full two-port correction is not used. 1. Press w). 2.
NETWORK ANALYZER PORl ES OPEN SHORT LOAG OPEN SHORT LOAD FOR S,, FOP Sz2 pgE14e Figure 5-6. Standard Connections for a One Port Reflection Error-Correction 8. To measure the standard, when the displayed trace has settled, press: ./ g#& :. . Note If the calibration kit that you selected has a choice between male or female calibration standards, remember to select the sex that applies to the test port and not the standard.
Note You can save or store the error-correction to use for later measurements. Refer to the “Printing, Plotting, and Saving Measurement Results” chapter for procedures. 14. This completes the one-port correction for reflection measurements. You can connect and measure your device under test.
Full Two-Port Error-Correction removes directivity errors of the test setup in forward and reverse directions removes source match errors of the test setup in forward and reverse directions w removes load match errors of the test setup in forward and reverse directions n removes isolation errors of the test setup in forward and reverse directions (optional) n removes frequency response of the test setup in forward and reverse directions n n Note This is the most accurate error-correction procedure.
6. To measure the standard, when the displayed trace has settled, press: The analyzer displays WAIT -, MEXWFlING CAL STANDARD during the standard measurement. . ;, The analyzer underlines the @!?Zl& softkey after it measures the standard. 7. Disconnect the open, and connect a short circuit to PORT 1. 8. To measure the device, when the displayed trace has settled, press: * ,. The analyzer measures the short circuit and underlines the ;.$~@B?softkey .h. 9.
T&L* and T&M* Error-Correction The HP 8753E analyzer has the capability of making calibrations using the TRL*/LRM* method. TRL Error-Correction .; 1. You must have a TRL calibration kit defined and saved in the :$&$%@$.T.. as shown in : . . . . . . . . . / >;. . ;. ;. . . .T. .T... . . . . ... . . ) “Modifying Calibration Kit Standards, n located later in this section. 2. 3. lb measure the “TRL THRU,” connect the “zero length” transmission line between the two test ports. 4.
11. Connect a load to PORT 2, and press: 12. Connect the load to PORT 1, and press: 13. You may repeat any of the steps above. There is no requirement to go in the order of steps. When the analyzer detects that you have made all the necessary the ,. . . .; measurements, . ._ . . . . . . . . : : ;.;. message he m show PRESS ‘DONE’ IF FINISHED WITH CAL. press ~.~~~~:~~~~‘. . i . A . . . . :. . . . . .: :.i ./; . . . ;. . . . . ~~..i ~ T . A. i.
8. Press ~~~~~~~~,, ~~~~~~~~~~o~~ to acCeSS the Loads menu. When the displayed -.. i.:..l. //..:....m ..:s...:: . ; ~ :< :. . , ,/ :. :; .._. :. : s< < <.,<. . . . . . *. 9 .
Ihble 5-3. Typical Calibration Kit Standard and Corresponding Number Default Typical Standard Type Staadard Number short (m) 1 open (ml 2 broadband load 3 delaykhru 4 sliding load 5 lowband load 6 short (f) 7 open Ul 8 5. Press/, ., “P”’the underlined softkey. For example, if you selected (iJ (xl) in the previous step, :.S@@T. :./ ;.;,. ,. S.i i: should be the underlined softkey. Note Do not press a softkey that is not underlined unless you want to change the “type” of standard. 6.
Saving the modilkd calibration constants If you made modifications to any of the standard detlnitions, follow the remaining steps in this procedure to assign a kit label, and store them in the non-volatile memory. The new set of standard dehnitions will be available under W$I$I&J&~,. until you save another user kit. :. / 13. Press (GJ &$&~~~. .,~~~.~~.~~ . . . . . . . . . . . . . ;#f#$& ~&@?$I&%~:,, i .: . i.I. ._ .~i I i ........_...... i i.;. .
4. To deftne the THRWLINE standard, press: 5. lb de6ne the LINE/MATCH standard, press: _ /,. , . . I. I ~ “”:F. . . . . . ;~~;~~~~~~~~~ @ Lxl) . . . ; .:i.>. : :;. .: i./. . . . . . i . . . . . L i:. ~~;,. . . . . ,‘_’ ~~~~~~ ~~~~~~~~~.~.~ :~~~~~.~,;~~~~~~ I.osJ @-J .: .: : : :. .i .i. ; . .i . .T i . . . . . . . . . . .v. : :. : ,/. . . . . . /. ,. ,. . . ,. ,...../,.;,. ~ ~ ~ ., ~.,i~ . . . . . . ,. . .;. .; ; ; ;. .;. . .T. . .L. ,~~~~~~~~~~~,; T ;, . .A. . . .../... . . . . . . . : 1 ./. ;. ;. .: .
Iabel the Classes Note ‘lb enter the following label titles, an external keyboard may be used for convenience. 13. fiess ~~~~s~.,; ggg#g fg&p* : :. :.: :ii :. : .:< :<<
4. ‘lb define the THRUAJNE standard, press: 5. To define the LINE/MATCH standard, press: 6. For the purposes of this example, change the name of the standard by ;;;;...> pressing .;..:.. x;;..;,. ‘;I- c. Ti. ~,.z,.<~‘:e 5 p “‘p . . A .; . . .~.;~:. .~.i .: ~:: . m.= i :;:.: :. . ’if a previous title exiSts, and then modify the name to “MATCH”. 7.
Iabel the Classes Note ‘lb enter the following label titles, an external keyboard may be used for convenience. . .: : i. :. . 13. Press ~:~~~~~~ gg#gg. .#ffjm. i. < /.‘i.“. i/ 14. Change the label of the “TRL REFLECT” class to “TRMSHORT.” .,.,::;,,,., :I ,,.,.,.,... .,.,., _. _ .~,,. ., .:.....::...:: .......:.::, .. ..:. ::. r . . . . ,, . . . . . 15. Change the label of the “TRL LINE OR MATCH” class to “TRIMLOAD.
Entering the Power Sensor Calibration Data Entering the power sensor calibration data compensates for the frequency response of the power sensor, thus ensuring the accuracy of power meter calibration. 1. Make sure that your analyzer and power meter are configured. Refer to the “Compatible Peripherals” chapter for configuration procedures. The analyzer shows the notation EMPTY, if you have not entered any segment information. 3. To create thelirst segment, press: 4.
Deleting Frequency Segments :) : . ;., .,: ., ~ .: ,. ,. . i ,:x~,: MY=? y ,.<$W2.Y?< .z.,:y;;;;;.:’ .i I- Access the “Segment Modify Menu” by pressing @ :Pm ~~~?~~~~~~~~~~~, . . ./ . .si.i /.. . .%A ,. , . . .:,. . . . . . ._. . . . . . . . . .: . .: . :. .; .:;. , . . .,., ,. , , , : .: . .i a.. ..&l&i .: . ., :. :. : ;,. . ,. :. : .: ., ., :.:.:. “‘:. , . ,. ,. ,. ,. ,.; I,~~~~~~~~~~~~~~~~:~~ (or ~~~~~~~~~~~-~~~~~ B.; , depending on where the segment is .;.: i/ P:~<::. : :. ;.;.; ./,. , , , .A?.
Using Sample-and-Sweep Correction Mode You can use the sample-and-sweep mode to correct the analyzer output power and update the power meter correction data table, during the initial measurement sweep. Because the analyzer measures the actual power at each frequency point during the initial sweep, the initial sweep time is significant. However, in this mode of operation the analyzer does not require the power meter for subsequent sweeps.
Note Because power meter calibration requires a longer sweep time, you may want to reduce the number of points before pressing :~~;-c~~~~~~. After the power meter calibration is Gnashed, return the number of points to its original value and the analyzer will automatically interpolate this calibration. Some accuracy will be lost for the interpolated points. The analyzer will use the data table for subsequent sweeps to correct the output power level at each measurement point.
3. Press (ZiJ /~~~~~ and enter the test port power level that you want the analyzer to maintain at the input to your test device. Compensate for the power loss of the power splitter or directional coupler in the setup. 4. If you want the analyzer to make more than one power measurement at each frequency data point, press ~~~~~~~.~~~~~” o Ixl) (where n = the number of desired .: . . .c .i i/ . . . . . L.3 .:. . .I? iterations). 5.
Calibrating for Noninsertable Devices A test device having the same sex connector on both the input and output cannot be connected directly into a transmission test configuration. Therefore, the device is considered to be noninsertable, and one of the following calibration methods must be performed: n adapter removal n matched adapters w modify the cal kit thru definition NETWORK ANALYZER REFERENCE PORT 1 Figure 5-10.
Adapter Removal The adapter removal technique provides a means to accurately measure noninsertable devices. The following adapters are needed: w Adapter Al, which mates with port 1 of the device, must be installed on test set port 1. n n Adapter A2, which mates with port 2 of the device, must be installed on test set port 2. Adapter A3 must match the connectors on the test device. The effects of this adapter will be completely removed with this calibration technique.
Perform the Z-port Error Corrections 1. Connect adapter A3 to adapter A2 on port 2. (See Figure 5-12.) N E T W O R K ANAL’IZER REFERENCE PORT 1 REFERENCE pg647e Figure 5-12. ‘lko-Port Cal Set 1 2. Perform the 2-port error correction using calibration standards appropriate for the connector type at port 1. Note When using adapter removal calibration, you must save calibration sets to the internal disk, not to internal memory. Caution Do not mistake the Iine switch for the disk eject button.
4. Connect adapter A3 to adapter Al on port 1. (See F’igure 5-13.) NETWORK ANALYZER REFERENCE PORT 2 Figure 5-13. Two-Port Cd Set 2 5. Perform the 2-port error correction using calibration standards appropriate for the connector type at port 2. 6. Save the results to disk. Name the fSle “PORTB.” 7. Determine the electrical delay of adapter A3 by performing steps 1 through 7 of “Modify the Cal Kit Thru Definition.
Note In the following two steps, calibration data is recalled, not instrument states. 10. kom the disk . . . . . . . idirectory, choose the file associated with the port 1 error correction, then press ~~~:~~~~~~~~.. .;;s’ 11. When this isPI’... complete, ‘-‘~+‘~::.$2 +;:I’ . choose the hle for the port 2 error correction and press ~~~“::9 ;&%&~$fggg 12- When complete, press ~~~‘. 13. Enter the value of the electrical delay of adapter A3. 15.
If unexpected phase variations are observed, this indicates that the elec&ical delay of the adapter was not specified witbin a quarter wavelength over the frequency range of interest. ‘lb correct this, recall both cal: .; .sets, ; .: . :. j .: . . . . . since . . . . . ., . .: the data was previously stored to disk, change the adapter &lay, ad press ~~~~~~ .:..::: . . . . . ..i : - Example Program The following is an example program for performing these same operations over HP-IB: adaptrm.
MAtched Adapters With this method, you use two precision matched adapters which are “equal. n lb be equal, the adapters must have the same match, ZO, insertion loss, and electrical delay. The adapters in most HP calibration kits have matched electrical length, even if the physical lengths appear different. NON-INSERTABLE DEWCE 1. TRANSMISSIOf4 CAL USING ADAPTER A 2 REFLECTION CAL USING ADAPTEP R LENGTH OF ADAPTERS MUST BE EQJAl 3. MEASURE DUT USING ADAPTER 6. pg6136d Figure 5-15.
Modify the Cal Kit Thru Deilnition With this method it is only necessary to use adapter B. The calibration kit thru definition is modified to compensate for the adapter and then saved as a user kit. However, the electrical delay of the adapter must hrst be found. 1. Perform a l-port calibration on PORT 2. 2. Connect adapter B to the test port. 3. Add a short to the open end of the B adapter. 4. Measure the delay of the adapter by pressing (G) %&AY. 5. Divide the resulting delay measurement by 2. 6.
Making Accurate Measurements of Electrically Long Devices A device with a long electrical delay, such as a long length of cable or a SAW lllter, presents some unusual measurement problems to a network analyzer operating in swept frequency mode. Often the measured response is dependent on the analyzer’s sweep time, and incorrect data may be obtained. At faster sweep rates, the magnitude of the response may seem to drop and look distorted, while at slower sweep rates it looks correct.
Decreasing the Time Delay The other way to reduce AF’ is by decreasing the time delay, AT. Since AT is a property of the device that is being measured, it cannot literally be decreased. However, what can be decreased is the difference in delay times between the paths to the R channel and the B channel. These times can be equalized by adding a length of cable to the R channel which has approximately the same delay as the device under test.
Increasing Sweep Speed You can increase the analyzer sweep speed by avoiding the use of some features that require computational time for implementation and updating, such as bandwidth marker tracking. You can also increase the sweep speed by making adjustments to the measurement settings.
3. Then switch to stepped list mode: n n If there is no difference between the measurements in either list mode, then use the swept list mode. If the memory trace indicates that there is more attenuation in swept list mode, it may be due to IF delay. You can usually remedy this problem by increasing the sweep time. Note IF bandwidths of 30 to 10 Hz cause the sweep (or that segment of the sweep) to be stepped, thus eliminating IF delay.
lb Widen the System Bandwidth 1. press LAvg) j:;$*+;#r. i A..:;. .: . 2. Set the IF bandwidth to change the sweep time. The following table shows the relative increase in sweep time as you decrease system bandwidth. 1 3000 1 I loo0 I 0.128 0.254 I I 1 Preset condition, CFlGHz, Span-= 1OOIvlHz; includes retrace time. ‘lb Reduce the Averaging Fktor By reducing the averaging factor (number of sweeps) or switching off averaging, you can increase the analyzer’s measurement speed.
The analyzer sweep time does not change proportionally with the number of points, but as indicated below. 201 0.106 401 0.181 801 0.330 1601 0.633 1 Preset condition, CF- lGHz, Span= lOOMHz, Correction oip; includes retrace time. Measurement speed can be improved by selecting the widest IF BW setting of 6OOOHz. lb Set the Sweep Type Different sweep speeds are associated with the following three types of non-power sweeps. Choose the sweep type that is most appropriate for your application. 2.
To Activate Chop Sweep Mode You can use the chop sweep mode to make two measurements at the same time. For example, the analyzer can measure A/R and B/R simultaneously. You can activate the chop mode by pressing preset) or by the following the sequence below. For more information, refer to “Alternate and Chop Sweep Modes” in Chapter 6. To Use External Calibration Offloading the error correction process to an external PC increases throughput on the network analyzer.
4.
Increasing Dynamic Range Dynamic range is the difference between the analyzer’s maximum allowable input level and minimum measurable power. For a measurement to be valid, input signals must be within these boundaries.
Reducing Trace Noise You can use two analyzer functions to help reduce the effect of noise on the data trace: n n activate measurement averaging reduce system bandwidth To Activate Averaging The noise is reduced with each new sweep as the effective averaging factor increments. 2. Enter a value followed by (XJ. Refer to the “Application and Operation Concepts” chapter for more information on averaging.
Reducing Recall Time ‘lb reduce time during recall and frequency changes, the raw offset function and the spur avoidance function off. ‘RI turn these functions off, press [system) : .;“W :<: i dcan .<.:
Understanding Spur Avoidance In the 400 MHz to 3 GHz range, where the source signal is created by heterodyning two higher frequency oscillators, unwanted spurious mixing products from the source may be present at the output. These spurs can become apparent in iilter measurements when filters have greater than 80 dB rejection.
6 Application and Operation Concepts This chapter provides conceptual information on the following primary operations and applications that are achievable with the HP 8753E network analyzer.
HP 8753E System Operation Network analyzers measure the reflection and transmission characteristics of devices and networks. A network analyzer test system consists of the following: n source n signal-separation devices n receiver n display The analyzer applies a signal that is transmitted through the test device, or reflected from its input, and then compares it with the incident signal generated by the swept RF source.
The Built-In ‘I&t Set The HP 8753E features a built-in test set that provides connections to the test device, as well as to the signal-separation devices. The signal separation devices are needed to separate the incident signal from the transmitted and reflected signals. The incident signal is applied to the R channel input through a jumper cable on the front panel.
Data Processing The analyzer’s receiver converts the R, A, and B input signals into useful measurement information. This conversion occurs in two main steps: n n The swept high frequency input signals are translated to llxed low frequency IF signals, using analog sampling or mixing techniques. (Refer to the HP 8753E Network Anuliyxer Semrice Guide for more details on the theory of operation.) The IF signals are converted into digital data by an analog to digital converter (ADC).
While only a single flow path is shown, two identical paths are available, corresponding to channel 1 and channel 2. When the channels are uncoupled, each channel is processed and controlled independently. Data point definition: A “data point” or “point” is a single piece of data representing a measurement at a single stimulus value. Most data processing operations are performed point-by-point; some involve more than one point.
Pre-Raw Data Arrays These data arrays store the results of ail the preceding data processing operations. (Up to this point, all processing is performed real-time with the sweep by the IF processor. The remaining operations are not necessarily synchronized with the sweep, and are performed by the main processor.) When full 2-port error correction is on, the raw arrays contain all four S-parameter required for accuracy enhancement. When the channels are ,.:““, ‘,. : ’ measurements ,. . . ..: :.: . . : :. . .
Transform (Option 010 Only) This transform converts frequency domain information into the time domain when it is activated. The results resemble time domain reflectometry (TDR) or impulse-response measurements The transform uses the chirp-Z inverse fast Fourier transform (FFI’) algorithm to accomplish the conversion. The windowing operation, if enabled, is performed on the frequency domain data just before the transform.
Active Channel Keys The analyzer has four channels for making measurements. Channels 1 and 2 are the primary channels and channels 3 and 4 are the auxihary channels. The primary channels can have different stimulus values (see “Uncoupling Stimulus Values Between Primary Channels,” below) but the auxiliary channels always have the same stimulus values as their primary channels. That is, if channel 1 is set for a center frequency of 200 MHz and a span of 50 MHz, channel 3 will have the same stimulus values.
Enabling Auxiliary Channels Once a full two-port calibration is active, the auxiliary channels can be enabled. ‘Ib enable channel 3 or 4, press: 1. @&X1) or lchan] 2. @z&iq-- Once enabled, an auxiliary channel can be made active by pressing [than) twice (for channel 3), or twice [than), (for channel 4). The active channel is indicated by an amber LED adjacent to the corresponding channel key. If the LED is steadily on, it indicates that primary channel 1 or 2 is active.
Before you can modify a function, you must activate the particular function by pressing the corresponding front panel key or softkey. Then you can modify the value directly with the knob, the step keys, or the digits keys and a terminator. If no other functions are activated, the knob moves the active marker. hg64ey Figure 6-4. Entry Block Units Terminator The units terminator keys are the four keys in the right cohunn of the keypad.
y [ Entry Off] You can use this key to clear and turn off the active entry area, as well as any displayed prompts, error messages, or warnings. Use this function to clear the display before printing or plotting. This key also helps prevent changing active values accidentally by moving the knob.
Stimulus Functions STIMULUS W pg61 17d Figure 6-5.
Stimulus Menu The (Menu) key provides access to the stimulus menu, which consists of softkeys that activate stimulus functions or provide access to additional menus. These softkeys are used to define and control all stimulus functions other than start, stop, center, and span. The following softkeys are located within the stimulus menu: n 3%~ . *. i /. : provides access to the power menu. n ~~~~;~~~~,,itUowsyou to specify the sweep time. : n ~~~~~~~~; proHdes access to the trigger i ........_..............
The Power Menu The power menu is used to define and control analyzer power. It consists of the following softkeys: i .:. i, ., ., :. :. : ., ,. ,. ,. ,.,,; _ , ., ., ., ., ,. ,. ,. . . . . . . . . . . . . n :~~~~~:~~~~-~~~ allows you to select power rages automatically or manually. / ;:. ....,. . :?..A...,,,,,,,,,,,.:.:.::: ...../L.~~~;..;::~.~...~-- ............../......................./... :.:. . . . . . ,. / . ~~~~~~~ b b.. , ,. . . . . . . :. .:. :. .:. .<<<<.
Note After measurement calibration, you can change the power within a range and still maintain nearly full accuracy. In some cases better accuracy can be achieved by changing the power within a range. It can be useful to set different power levels for calibration and measurement to minimize the effects of sampler compression or noise floor. If you decide to switch power ranges, the calibration is no longer valid and accuracy is no longer specified.
Power Coupling Options There are two methods you can use to couple and uncouple power levels with the HP 87533: n channel coupling n port coupling By uncoupling the primary channel powers, you effectively have two separate sources. Uncoupling the test ports allows you to have different power levels on each port. Channel coupling ~~~~~~~~~~~~~~ toggles between coupled and uncoupled primary &me1 power. With :.i<.>>>>.<<.#.; i..,...,,,.;;..;...;;.;;;;;;; ;:::.:2 ......../T . .. . . . . . . . . . . . . . .
Sweep Time softkey selects sweep time as the active entry and shows whether the . ‘. .i .<-Z4!$~ .: . >:<.w automatic or manual mode is active. The following explains the difference between automatic and manual sweep time: me ~~:~~~ ::*i:= n Manual sweep time. As long as the selected sweep speed is within the capability of the instrument, it will remain hxed, regardless of changes to other measurement parameters.
n time domain (Option 010 Only) Use ‘lhble 6-l to determine the minimum cycle time for the listed measurement parameters. The values listed represent the minimum time required for a CW time measurement with averaging off. ‘12l.ble 6-1. Minimum Cycle Time (in seconds) Number of Points 6.16 IF Bandwidth 6oooHz 3700 Hz aoooIIz 11 0.0025 0.0041 0.0055 51 0.0125 0.0191 0.0256 101 0.0250 0.0379 0.0505 201 0.0500 0.0754 0.1006 401 0.1000 0.1504 0.2006 801 0.2000 0.3004 0.
Trigger Menu The trigger menu is used to select the type and number of groups for the sweep trigger. The following is a description of the softkeys located within this menu: ; ., ., ., _ _ _ . . _ YB@!; freezes the data trace on the display, and the analyzer stops sweeping and taking data. The notation “Hid” is displayed at the left of the graticule. If the 1 indicator is on at the left side of the display, trigger a new sweep with ‘2$&3&A$. . ,.,.,_. _./, .
Source Attenuator Switch Protection The programmable step attenuator of the source can be switched between port 1 and port 2 when the test port power is uncoupled, or between channel 1 and channel 2 when the channel power is uncoupled. To avoid premature wear of the attenuator, measurement configurations requiring continuous switching between different power ranges are not allowed.
Channel Stimulus Coupling ‘. . . . . . . .,‘.: :. ’ .) , /.~~~~~~~~~~.;~~~:~~~; : . ./., . . .*..; . ,. .i. . . ./. : .:I:.:.: :.: . A. toggles the primary channel coupling of stimulus values. With .&@#$&R~#~~~~.~~~ (the preset condition), both primary channels have the same stimulus values. (The inactive primary channel and its auxiliary channel takes on the stimulus values of the active primary channel.
Sweep Type Menu The following softkeys are located within the sweep type menu. Among them are the five sweep types available. , ~~~~~~~~.~ flows list frequencies to be entered or mo&fied using the e&t list menu md e&t . , ,. . . ...; ...~. . . . ~,..~. ... . ~. ~d~ . s .......:.: ,. . . /_.
Logarithmic Frequency Sweep (Hz) . . . . . _ ., ., ., . ., _ _ ,. The :Q,@$~ :: i. softkey activates a logarithmic frequency sweep mode. The source is stepped in logarithmic increments and the data is displayed on a logarithmic graticule. This is slower than a continuous sweep with the same number of points, and the entered sweep time may therefore be changed automatically. For frequency spans of less than two octaves, the sweep type automatically reverts to linear sweep.
Stepped Edit Subsweep Menu Using the .< .X&g? i.. or &&i, softkey within the edit list menu wiIl display the edit subsweep menu. This menu lets you select measurement frequencies arbitrarily. Using this menu it is possible to define the exact frequencies to be measured on a point-by-point basis. For example, the sweep could include 100 points in a narrow passband, 100 points across a broad stop band, and 50 points across the third harmonic response. The total sweep is defined with a list of subsweeps.
Swept List Frequency Sweep (Hz) : ... .:. . . . .i.;: / .i i i. me :;~~~~.~~~;::~~~~~~ softkey a&iv&es a swept l&t frequency sweep, one of two fist ./......... .// ..l.. frequency sweep modes. The swept list mode allows the analyzer to sweep a list of arbitrary frequency points which are defined and modified in a way similar to the stepped list mode. However, this mode takes data while swe&ng through the defined frequency points, increasing throughput by up to 6 times over a stepped sweep.
The power settings for all segments are restricted to a single power range. This prevents the attenuator from switching to different settings mid-sweep. Select the power range and then edit the list table to specify the segment powers. If the power range is selected after the list has been defined, the list settings may be affected. When analyzer port power is uncoupled, the segment power level can be set independently for each port.
Power Sweep (dBm) . , . ,._ _*,. ,.; *,. . . . 1.. The ~~~~~.~~ softkey turns on a power sweep mode that is used to characterize power-sensitive circuits In this mode, power is swept at a single frequency, from a start power value to a stop power value, selected using the m and &YJ keys and the entry block. This feature is convenient for such measurements as gain compression.or ,&GC (automatic gain control) slope. lb set the frequency of the power sweep, use $I# ..%RE& . . . . . . . . . . . . . . i.
Response Functions pgE118d Figure 6-7. Response Function Block The following response function block keys are used to define and control the following functions of the act& &anml. n IMeabJ: measurement parameters n m: data format n n @ZKFJ LDispla~: display functions .
S-Parameters The (Meas) key provides access to the S-parameter menu which contains softkeys that can be used to select the parameters or inputs that define the type of measurement being performed. Understanding S-Parameters S-parameters (scattering parameters) are a convention used to characterize the way a device modifies signal flow. A brief explanation of the S-parameters of a two-port device is provided here. For additional details refer to Hewlett-Packard Application Notes A/N 95-l and A/N 154.
S-parameters are exactly equivalent to the more common description terms below, requiring only that the measurements be taken with a.ll test device ports properly terminated. Deilnition LL z a1 !!A a2 h a2 !bt set Description Direction a2 = 0 Input reflection coefficient FWD ap - 0 Forward @in FWD a1 = 0 Reverse gain REV a1 =o Output reflection coefficient REV The S-Parameter Menu The S-parameter menu allows you to del?ne the input ports and test set direction for S-parameter measurements.
pg640d Figure 6-9. Reflection Impedance and Admittance Conversions In a transmission measurement, the data can be converted to its equivalent series impedance or admittance using the model and equations shown in F’igure 6-10. pg64ld Figure 6-10. Transmission Impedance and Admittance Conversions Note Avoid the use of Smith chart, SWR, and delay formats for display of Z and Y conversions, as these formats are not easily interpreted.
The Format Menu The @GGZ) key provides access to the format menu. This menu allows you to select the appropriate display format for the measured data. The following list identifies which formats are available by means of which softkeys: / .““‘: ~.:; * .: .: ., . :~~~.,:..~~~. . ;Jggg . i . . L.. . . . . . . . . . . . . . . . . ::~~~~~~~~~ The analyzer automatically changes the units of measurement to correspond with the displayed format.
pgm 84-C Figure 6-11. Log Magnitude Format Phase Format . . . . . . . . . . , ,. The $!?K . : softkey displays a Cartesian format of the phase portion of the data, measured in degrees This format displays the phase shift versus frequency. Figure 6-12 illustrates the phase response of the same IIlter in a phase-only format. pg6170-c Figure 6-12. Phase Format Group Delay Format ._ . ; ,., /./ ;,. The ~~~~~; softkey selects the group delay format, with marker values given in seconds.
15 CHl S,, ‘- delay 10 ns, Jun 1994 15:05:13 REF 0 s J 16 \ I STFlRT 75.000 000 MHz STOP 175 000 000 MHz Figure 6-13. Group Delay Format Smith Chart Format I: :. : . . . . .:<<::
(4 04 pgm 76-C Figure 6-14. Standard and Inverse Smith Chart Formats Polar Format me ~~~ &aey displays a polar format (see Figure 6-45). Each poht on the polar format corresponds to a particular value of both magnitude and phase. Quantities are read vectorally: the magnitude at any point is determined by its displacement from the center (which has zero value), and the phase by the angle counterclockwise from the positive x-axis.
Linear Magnitude Format The i~~~:~.~:~~~~ softkey displays the linear magnitude format (see F’igure 6-16). This is a Cartesian format used for unitless measurements such as reflection coefficient magnitude p or transmission coefficient magnitude T, and for linear measurement units. It is used for display of conversion parameters and time domain transform data. pg5174-c Figure 6-16. Linear Magnitude Format SWR Format ;. . . I .
Real Format The iX$&L: . i. softkey displays only the real (resistive) portion of the measured data on a Cartesian format (see Figure 6-18). This is similar to the linear magnitude format, but can show both positive and negative values. It is primarily used for analyzing responses in the time domain, and also to display an auxiliary input voltage signal for service purposes. pgf3173_c Figure 6-18. ReaJ Format Ima@naryFormat me ~~~.
Group Delay Principles For many networks, the amount of insertion phase is not as important as the linearity of the phase shift over a range of frequencies The analyzer can measure this linearity and express it in two different ways: directly, as deviation from linear phase, or as group delay, a derived value. Group delay is the measurement of signal transmission time through a test device. It is dehned as the derivative of the phase characteristic with respect to frequency.
result in the group delay data. These errors can be significant for long delay devices. You can verify that A$ is ~180“ by increasing the number of points or narrowing the frequency span (or both) until the group delay data no longer changes. AfMXtUW A * Frequency w 7-T PhSe 0 --) Jf a - - - 1 - - i JO *2--- - - --f pgBl.so_c Figure 6-21.
Group delay measurements can be made on linear frequency, log frequency, or list frequency sweep types (not in CW or power sweep). Group delay aperture varies depending on the frequency spacing and point density, therefore the aperture is not constant in log and list frequency sweep modes. In list frequency mode, extra frequency points can be deiined to ensure the desired aperture. To obtain a readout of aperture..values at different points on the trace, turn on a marker.
Scale Reference Menu The @GiZGTj key provides access to the scale reference menu. Softkeys within this menu can be used to define the scale in which measured data is to be displayed, as well as simulate phase offset and electrical delay. The following softkeys are located within the scale reference menu. Electrical Delay The ~T~~~~~~~ softkey adjusts the electrical delay to balance the phase of the test _ __ _ /.A . . . . . . . \. .i . . . .; . . . . . . ;. ;. . ;. . . ;a;. . v . . I.I. ../ device.
Display Menu The CDisplay) key provides access to the display menu, which enables auxiliary channels 3 and 4, controls the memory math functions, and leads to other menus associated with display functions. The analyzer has four available memory traces, one per channel. Memory traces are totally channel dependent: channel 1 cannot access the channel 2 memory trace or vice versa. Memory traces can be saved with instrument states: one memory trace can be saved per channel per saved instrument state.
Dual Channel Mode ** .:v.:. <: :. ;.; . . “;:. . ,.: ~ ,/ii : . ’ With ~~~~~~~.~ set to ON and /.:.$P&IT. : .: . ...DISP set to 1X, the two traces are overlaid on a single graticule (see Figure 6-23a) ./ ) ... ;. / n With . ,.EQH$%%A# set to ON and ~&&ET i . N. DISP set to 2X or 4X, the measurement data is . ,. . . . . . . . . . . . . : : : ., displayed on two half-screen graticules, one above the other, (see Figure 6-2313). Current parameters for the two displays are annotated separately.
Note 644 Auxiliary channels 3 and 4 are permanently coupled by stimulus to primary channels 1 and 2 respectively. Decoupling the primary channels’ stimulus from each other does not affect the stimulus coupling between the auxiliary channels and their primary channels.
However, there are two coniigurations that may not appear to function “properly”. 1. Channel 1 requires one attenuation value and channel 2 requires a different value. Since one attenuator is used for both testports, this would cause the attenuator to continuously switch power ranges. 2. With Option 007 (mechanical transfer switch), channel 1 is driving one test port and channel 2 is driving the other test port. This would cause the test port transfer switch to continually cycle.
able 6-2. Customizing the Display Channel Position Softkey _ _ _ . :, :, ~~:: : .: . : : ~: : ‘. ’ ~.~~~~~~~~~~:givesyou options foramnging the display of the channels. Pressci], . . . :. .:. : . . . .: . : : ..:;:./... . A. .w;;>; ....A. s. . ;. . L. i . . . . . ....A/. . . . ..w. ..i >;:3 ~~~~~~~~~~~~~, to use ~~~~~~~~16~:;. ~.:~ ~.:~ ~ .:.:~ ,.~: :~,:.~. . .:.:.,.;~ ~. :.:.:.:.:.:.~ ~ ~:.~:.:.:.:~ ..... . ........_i....._i.. . . . .A. . w;.;:. : ...As.;: : . ...../::::.. i..i/ i .: ;;>.i>.
relationship between the keys and the channels. For example, beneath the four-grid display, [CHAN l] and [MEAS] Sll are shown in yellow. Notice that in the four-grid graphic, Chl is also yellow, indicating that the keys in yellow apply to channel 1. _ . . . . . . . . . . . .. . . /. Fressing ~~~~~~~P i i . ,., , , , opens a screen which lists the hardkeys and softkeys associated with the auxiliary channels and setting up multiple-channel, multiple-grid displays.
Memory Math F’unctions Two trace math operations are implemented: (Note that normalization is .~~~~~~ not ‘~~~~-~..) Memory traces are saved and recalled .i ;.: ..:. TT .:. ;:+<.. ./ and trace math is done immediately after error-correction. This means that any data processing done after error-correction, including parameter conversion, time domain transformation (Option OlO), scaling, etc, can be performed on the memory trace.
Setting Default Colors ., _ _ To set all the display elements to the factory-defined default colors, press ~~~~~~~~~~~~~~. _. . . Note ~#&&$I does not reset or change colors to the default color values. However, cycling power to the instrument will reset the colors to the default color values. Blanking the Display .,. . . . . .),. ., Pressing ~~~~~~~~~~ . _. . . . . : . ;. : :. . :. . \/ii : . . . ii switches off the analyzer display while leaving the instrument in its current measurement state.
To,. * .,change ,. ;,. theThcolor of a :display . :.: .-:.:. ” elements, press the softkey for that element (such as ..:g@_ ,. .,+&$$&:>* en press fE&@$ and turn the analyzer front panel knob; use the step keys or the .: numeric keypad, until the desired color appears. If you change the text or background intensity to the point where the display is unreadable, you can the recover a readable display by turning off the analyzer and then turning it back on.
Averaging Menu The (XjJ key is used to access three different noise reduction techniques: sweep-to-sweep averaging, display smoothing, and variable IF bandwidth. All of these can be used simultaneously. Averaging and smoothing can be set independently for each channel, and the IF bandwidth can be set independently if the stimulus is uncoupled.
Smoothing Smoothing (similar to video filtering) averages the formatted active channel data over a portion of the displayed trace. Smoothing computes each displayed data point based on one sweep only, using a moving average of several adjacent data points for the current sweep. The smoothing aperture is a percent of the swept stimulus span, up to a maximum of 20%. Rather than lowering the noise floor, smoothing ilnds the mid-value of the data.
Figure 6-27. IF Bandwidth Reduction Hints Another capability that can be used for effective noise reduction is the marker statistics function, which computes the average value of part or all of the formatted trace. If your instrument is equipped with Option 085 (High Power System), another way of increasing dynamic range is to increase the input power to the test device using a booster amplifier.
Markers The marker_) key displays a movable active marker on the screen and provides access to a series of menus to control up to five display markers for each channel. Markers are used to obtain numerical readings of measured values. They also provide capabilities for reducing measurement time by changing stimulus parameters, searching the trace for specific values, or statistically analyzing part or all of the trace.
With the use of a reference marker, a delta marker mode is available that displays both the stimulus and response values of the active marker relative to the reference. Any of the five markers or a ilxed point can be designated as the delta reference marker. If the delta reference is one of the five markers, its stimulus value can be controlled by the user and its response value is the value of the trace at that stimulus value.
If the format is changed while a fixed marker is on, the fixed marker values become invalid. For example, if the value offset is set to 10 dl3 with a log magnitude format, and the format is then changed to phase, the value offset becomes 10 degrees.
Measurement Calibration Measurement calibration is an accuracy enhancement procedure that effectively removes the system errors that cause uncertainty in measuring a test device. It measures known standard devices, and uses the results of these measurements to characterize the system.
What Causes Measurement Errors? Network analysis measurement errors can be separated into systematic, random, and drift errors. Correctable systematic errors are the repeatable errors that the system can measure. These are errors due to mismatch and leakage in the test setup, isolation between the reference and test signal paths, and system frequency response. The system cannot measure and correct for the non-repeatable random and drift errors.
directivity is independent of the characteristics of the test device and it usually produces the major ambiguity in measurements of low reflection devices. Source Match Source match is defined as the vector sum of signals appearing at the analyzer receiver input due to the impedance mismatch at the test device looking back into the source, as well as to adapter and cable mismatches and losses.
lncldent I Match TransmItted Figure 6-31. Load Match The error contributed by load match is dependent on the relationship between the actual output impedance of the test device and the effective match of the return port (port 2). It is a factor in all transmission measurements and in reflection measurements of two-port devices. The interaction between load match and source match is less significant when the test device insertion loss is greater than about 6 dD.
Characterizing Microwave Systematic Errors One-Port Error Model In a measurement of the reflection coefficient (magnitude and phase) of a test device, the measured data differs from the actual, no matter how carefully the measurement is made. Directivity, source match, and reflection signal path frequency response (tracking) are the major sources of error (see Figure 6-32). Measured Data pg649d Figure 6-32.
pg65ld L Figure 6-34. Effective Directivity EDF Since the measurement system test port is never exactly the characteristic impedance (50 ohms), some of the reflected signal bounces off the test port, or other impedance transitions further down the line, and back to the unknown, adding to the original incident signal (I). This effect causes the magnitude and phase of the incident signal to vary as a function of &A and frequency.
ERF F r e q u e n c y T r a c k i n g L 0 ,E 11 EDF '11M SF 11 '1lA pg653d Figure 6-36. Reflection Tracking Em These three errors are mathematically related to the actual data, &A, and measured data, &M, by the following equation: (SllA&W) “~4 = EDF + (1 - EsF$~A) If the value of these three “E” errors and the measured test device response were known for each frequency, the above equation could be solved for S11A to obtain the actual test device response.
Actual Directlvity Tof L o a d (r,) Measured Directivity Before Correctlo” CD,) ‘\ ‘--Efiechve Directlvity After CorrectIon (DA- D, = -I-,) pb6112d Figure 6-38. Measured Effective Directivity Next, a short circuit termination whose response is known to a very high degree is used to establish another condition (see F’igure 6-39). V s II,,,, 5 = EDF+ ,lA=11180' (-~)(ERF) ____ ~-EsF(-~) J pg656d Figure 6-39. Short Circuit Termination The open circuit gives the third independent condition.
IIM = EDF+ l-ESF(lL@fc) pb6i 13d Figure 6-40. Open Circuit ?Lkrmina.tion This completes the calibration procedure for one port devices.
Device Measurement Now the unknown is measured to obtain a value for the measured response, E&J, at each frequency (see Figure 6-41). s '~IA(~RF) i1M = E DF+ mA pg658d Figure 6-41. Measured SI 1 This is the one-port error model equation solved for S 11A.
M E A S U R E M E N T ERRQRS Unknown L pg659d Figure 6-42. Bhjor Sources of Error The transmission coefficient is measured by taking the ratio of the incident signal (I) and the transmitted signal (‘I) (see F’igure 6-43). Ideally, (I) consists only of power delivered by the source, and (T) consists only of power emerging at the test device output. (1) ) CT) * Forward S2,M ‘ZIA’ (+ !T) + (I) Reverse ?2M 0-1 ‘12A ETF S,2M S12A = E TR ETR pg660d Figure 6-43.
PORT PORT ‘5 c 0) 0 souRcE~iLEs3 - (Ti s?,~ ‘3 lrsll 1rELF4\_LoAo MATCH A MATCH ERF 512 pg661d Figure 6-44. Load Match Em The measured value, SLIM, consists of signal components that vary as a function of the relationship between Esr and &A as well as ELF and f&2& so the input and output reflection coefficients of the test device must be measured and stored for use in the &IA error-correction computation.
Isolation - X E F I I I I I I PORT 1 PORT 2 pg662d L Figure 6-45.
FORWARD I I I I 1 RF IN - l l s I SF U IlM 21A 1 EDF\r E s I ERF 5 IIA I ‘22A I I A s I 12A PORT 1 I I REVERSE 1 E /F I I ETF s I I 21M b 1 I T I I 1 E LF I I I I I PORT 2 s 21A I I I ‘22M ERR l I ESR I ‘12M . ELF! I E TR E XR dEDP I I I I I I 1 1 ’ 12A I l 1 RF IN I . I pg663d Figure 6-46. Full Two-Port Error Model F’igure 6-47 shows the full two-port error model equations for all four S-parameters of a two-port device.
S22A = pg6128d Figure 6-47. Full Two-Port Emor Model Equations In addition to the errors removed by accuracy enhancement, other systematic errors exist due to limitations of dynamic accuracy, test set switch repeatability, and test cable stability. These, combined with random errors, also contribute to total system measurement uncertainty. Therefore, after accuracy enhancement procedures are performed, residual measurement uncertainties remain.
Calibration Considerations Measurement Parameters Calibration procedures are parameter-specific, rather than channel-specific When a parameter is selected, the instrument checks the available calibration data, and uses the data found for that parameter. For example, if a transmission response calibration is performed for B/R, and an S11 l-port calibration for A/R, the analyzer retains both calibration sets and corrects whichever parameter is displayed.
The Calibration Standards During measurement calibration, the analyzer measures actual, well-defined standards and mathematically compares the results with ideal “models” of those standards. The differences are separated into error terms which are later removed during error-correction. Most of the differences are due to systematic errors-repeatable errors introduced by the analyzer, test set, and cables-which are correctable.
Electrical Offset Some standards have reference planes that are electrically offset from the mating plane of the test port. These devices will show a phase shift with respect to frequency. ‘lhble 6-4 shows which reference devices exhibit an electrical offset phase shift.
Lm COP *d--b_ t 7 mm or Type-N Male Short (No Offset) 7 mm or Type-N Male Open W Ql.7~J 3.5 mm Type-N Female, Male or Female Ofiet Short 3.5 mm Male or Female C@et Open Type-N Female, pgei 85-C Figure 6-48.
How Effective Is Accuracy Enhancement? The uncorrected performance of the analyzer is sufficient for many measurements However, the vector accuracy enhancement procedures described in Chapter 5, “Optinking Measurement Results, n will provide a much higher level of accuracy. Figure 6-49 through Figure 6-51 illustrate the improvements that can be made in measurement accuracy by using a more complete calibration routine. Figure 6-49a shows a measurement in log magnitude format with a response calibration only.
pg6167-c Figure 6-50. Response versus S11 l-Port CMibration on Smith Chart F’igure 6-51 shows the response of a device in a log magnitude format, using a response calibration in Figure 6-51a and a full two-port calibration in Figure 6-51b. pg681d Figure 6-51.
Correcting for Measurement Errors The Local] key provides access to the correction menu which leads to a series of menus that implement the error-correction concepts described in this section. Accuracy enhancement (error-correction) is performed as a calibration step before you measure a test device. When the (ETJ key is pressed, the correction menu is displayed.
Interpolated Error-correction You can activate the interpolated error-correction feature with the ~~~~~~:~~~ .i i i . _. . . . . . . . . . . . ~~&3$: i /..//./. softkey. This feature allows you to select a subset of the frequency range or a different number of points without recalibration. When interpolation is on, the system errors for the newly selected frequencies are calculated from the system errors of the original calibration. System performance is unspecified when using interpolated error-correction.
The Calibrate Menu There are twelve different error terms for a two-port measurement that can be corrected by accuracy enhancement in the analyzer. These are directivity, source match, load match, isolation, reflection tracking, and transmission tracking, each in both the forward and reverse direction. The analyzer has several different measurement calibration routines to characterize one or more of the systematic error terms and remove their effects from the measured data.
TRL*/LRM* Two-Port Calibration ., _ ., ., ., ,. , The mL”/LRM’ two-port calibration, activated by pressing the ~~~~~~,~~~~~. softkey within the calibrate menu, provides the ability to make calibrations using the TRL or LRM method. For more information, refer to “TRL*/LRM* Calibration,” located later in this section.
Restarting a Calibration If you interrupt a calibration to go to another menu, such as averaging, you can continue the ii ., . c&brationby pressing& ~,~~.~.~~~~~ softkey in the co~e&ionmenu. Cal Kit Menu The cal kit menu provides access to a series of menus used to specify the characteristics of calibration standards. The following softkeys are located within the cal kit menu: The Select Cal Kit Menu ,,;.? : "' i.
Modifying Calibration Kits Modifying calibration kits is necessary only if unusual standards (such as in TRL*) are used or the very highest accuracy is required. Unless a calibration kit model is provided with the calibration devices used, a solid understanding of error-correction and the system error model are absolutely essential to making modifications. You may use modifications to a predefined calibration kit by modifying the kit and saving it as a user kit.
4. Store the modified calibration kit. For a step by step procedure on how to modify calibration kits, refer to “Modifying Calibration Kit Standards” located in Chapter 5, “Cptimizing Measurement Results. n Modify Calibration Kit Menu . ., _/ _ ,. _ 'I'& ~~~~~~~~~~~~~ softkey h the cd kit menu provides access to the modify cabration kit . . . . '. . : ~.~:. . .~. .~ :.P menu.
Detie Standard Menus Standard dellnition is the process of mathematically modeling the electrical characteristics (delay, attenuation, and impedance) of each calibration standard. These electrical characteristics (coefficients) can be mathematically derived from the physical dimensions and material of each calibration standard, or from its actual measured response. The parameters of the standards can be listed in lhble 6-5. TIhble 6-5.
Each standard must be identified as one of five “types”: open, short, load, delay/thru, or arbitrary impedance. After a standard number is entered, selection of the standard type will present one of five menus for entering the electrical characteristics (model coefficients) corresponding to that standard type, such as &&. These menus are tailored to the current type, so that only characteristics applicable to the standard type can be modified.
:..: .. .A. ..‘. ,i.;;:. ..,, :p..<<,:p G(” ..,,cc,, . ~~~~~~~~~~~~ dehes i the standard type to be a load, but with a arbitrary :;;.:..:;;;..~;...:.;......~~~.~~.~~~.........;;;~~:::.;;;~;~;..:~ .....:..:::hii; .....A.. .>;.iii .r>..A.. >:: .A.. .i .....i/i impedance (different from system ZO). ~~~~~~~~~~~~ &-~wsyou to specifythe(arbitrary)impedance i......:,........,. :. . i:....: ..T :,7;..... ,. .... ..i......., ,..i ..c. . . . . i ...A. . . .ii i . . . . . . . ohms. :,..:." i:,,; ,.
: ;,.*'p..;;..'..:'~ ',,;. ../ .'". .~~~~~~~:~~~~~~. T .,. . . . . .: .A. . s . . . . . . . /.::.. . . . . allows you to specify energy loss, due to skin effect, along a one-way length of coax offset. The value of loss is entered as ohms/nanosecond (or Giga ohms/second) at 1 GHz. (Such losses are negligible in waveguide, so enter 0 as the loss offset.) ~&‘?lW&~;~@~. . i _. . . . . ;. . / allows you to specify the characteristic impedance of the coax offset.
‘Ihble 6-6. Slamlard Class Assignments Calibration Kit Iabel: Disk File Name: The number of standard classes required depends on the type of calibration being performed, and is identical to the number of error terms corrected. A response calibration requires only one class, and the standards for that class may include an open, or short, or thru. A l-port calibration requires three classes. A full 2-port calibration requires 10 classes, not including two for isolation.
Each class can be given a user-definable label as described under label class menus. Standards are assigned to a class simply by entering the standard’s reference number (established while defining a standard) under a particular class. The following is a description of the softkeys located within the specify class menu: w &f& L.:. . /. . ; ;?z; allows you to enter the standard numbers for the first class required for an SI1 l-port calibration. (For default calibration kits, this is the open.) . ‘$@8 .i /. .
Label Class Menu The label class menus are used to dellne meaningful labels for the calibration classes. These then become softkey labels during a measurement calibration. Labels can be up to ten characters long. Label Kit Menu . . . . .. ;. This .:::U#l#L%JtT .i ~.~.~. ~. i i //.. softkey within the modify cal kit menu, provides access to this menu. It is identical to the label class menu and the label standard menu described above. It allows deilnition of a label up to eight characters long.
TRL%RM* Calibration The HP 8753E RF network analyzer has the capability of making calibrations using the “TRL” (thru-reflect-line) method.
How !CRL*/LRM* Calibration Works The TRL*/LRM* calibration used in the HP 8753E relies on the characteristic impedance of simple transmission lines rather than on a set of discrete impedance standards. Since transmission lines are relatively easy to fabricate (in a microstrip, for example), the impedance of these lines can be determined from the physical dimensions and substrate’s dielectric constant. TRL* Error Model [SAI Error Adapter * 8 Error Terms pm 2cd Figure 6-52.
In total, ten measurements are made, resulting in ten independent equations. However, the TRL error model has only eight error terms to solve for. The characteristic impedance of the line standard becomes the measurement reference and, therefore, has to be assumed ideal (or known and defined precisely). At this point, the forward and reverse directivity (Enr and Enn), transmission tracking (Err and Em), and reflection tracking (Em and ERR) terms may be derived from the TRL error terms.
Source match and load match A TRL calibration assmes a perfectly balanced test set architecture as shown by the term which represents both the forward source match (Esr) and reverse load match (ELR), and by the cz2 term which represents both the reverse source match (Esu) and forward load match (ELF). However, in any switching test set, the source and load match terms are not equal because the transfer switch presents a different terminating impedance as it is changed between port 1 and port 2.
NETWORK ANALYZER BIAS TEE BIAS TEE i_:#j-+-p 0 1 0 dB ATTENUATOR FIXTURE 1 0 dB ATTENUATOR pg640e Figure 6-54. Typical Measurement Set up If the device measurement requires bias, it will be necessary to add external bias tees between the iixed attenuators and the fixture.
The TRL Calibration Procedure Requirements for TRL Standards When building a set of TRL standards for a microstrip or fixture environment, the requirements for each of these standard types must be satisfied. Types THRU (Zero length) Requirements q No loss. Characteristic impedance (ZO ) need not be known. q &?I= S12= 1 LO0 0 s11= s22 = THRU (Non-zero length) q q q REFLECT q q q q LINE/MATCH WW q q q q q q q LINE/MATCH (WCH) 0 ZO of the thru must be the same as the line.
Fabricating and defining calibration standards for TRL/LRM When calibrating a network analyzer, the actual calibration standards must have known physical characteristics For the reflect standard, these characteristics include the offset in electrical delay (seconds) and the loss (ohms/second of delay). The characteristic impedance, $@@@: Z@., is not used in the calculations in that it is determined by the line standard. The reflection coefficient magnitude should optimally be 1.
For microstrip and other fabricated standards, the velocity factor is significant. In those cases, the phase calculation must be divided by that factor. For example, if the dielectric constant for a substrate is 10, and the corresponding “effective” dielectric constant for microstrip is 6.5, then the “effective” velocity factor equals 0.39 (1 + square root of 6.5). Using the first equation with a velocity factor of 0.39, the initial length to test would be 1.95 cm.
Another reason for showing this example is to point out the potential problem in calibrating at low frequencies using TRL. For example, one-quarter wavelength is Length (cm) = where: 7500 x VF fc fc = center frequency Thus, at 50 MHz, Length (cm) = 7500 = 150 cm or 1.5 m 50 (MHz) Such a line standard would not only be difficult to fabricate, but its long term stability and usability would be questionable as well.
/..../.;,.,.,.,.,.,.,.,. ,.;. . . . ...~. . . . .;. ,.,.,.,.,. ~_.... . ..:..- ~~~,;~~~~~~~~~~~~: i .;: i.. “../;: :. :. : .i.,;%l .; ; ,-d:.: is selected when the desired measurement impedance differs from the impedance of the line standard. This requires a knowledge of the exact value of the Z0 of the line. The system reference impedance is set using B”J$:G$fl~ .: . : . : :. . under the calibration menu. Fe actual impedance of the line is set by entering the real part of the line impedance as the ,. .
Power Meter Calibration ‘I& p~~~~~~;‘:~.~ softkey with the come-$ion menu, leads to a series of menus associated with power meter calibration. An HP-IB-compatible power meter can monitor and correct RF source power to achieve leveled power at the test port. During a power meter calibration, the power meter samples the power at each measurement point across the frequency band of interest. The analyzer then constructs a correction data table to correct the power output of the source. The correction table . :.
Loss of Power Meter Calibration Data The power meter calibration data will be lost by committing any of the following actions: Turning power off. ‘Inming off the instrument efases the power meter calibration table. changing sweep type. If the sweep type is changed (linear, log, list, CW, power) while power meter calibration is on, the calibration data will be lost. However, calibration data is retained if you change the sweep type while power meter calibration is off. Chaugiug frequency.
NETWORK ANALYZER 6’ \ POWER SENSOR pg617e Figure 6-55. ‘I&t Setup for Continuous Sample Mode Sample-and-Sweep Mode (One Sweep) _ ., . ; , . , . You cm use the ~~~~~~~: softkey to a&iv& the ~ple-~&sweep mode. ‘lJ& m comea d .L..<<. the analyzer output power and update the power meter calibration data table during the initial measurement sweep. In this mode of operation, the analyzer does not require the power meter for subsequent sweeps.
NETWORK ANALYZER POWER METER POWER SENSOR 01 C O N N E C T F O R I N I T I A L S W E E P 02 C O N N E C T F O R S U B S E Q U E N T S W E E P S pg616e Figure 6-56. ‘I&t Setup for Sample-and-Sweep Mode Power Loss Correction List If a directional coupler or power splitter is used to sample the RF power output of the analyzer, the RF signal going to the power meter may be different than that going to the test device. A directional coupler will attenuate the RF signal by its specified coupling factor.
SpeedandAccuracy The speed and accuracy of a power meter calibration vary depending on the test setup and the measurement parameters. For example, number of points, number of readings, if the power is less than -20 dBm, continuous versus sample and sweep mode. Accuracy is improved if you set the source power such that it is approximately correct at the measurement port. Power meter calibration should then be turned on. With number of readings = 2, very accurate measurements are achieved.
Notes On Accuracy The accuracy values in ‘Iable 6-7 were derived by combining the accuracy of the power meter and linearity of the analyzer’s internal source, as well as the mismatch uncertainty associated with the test set and the power sensor. Power meter calibration measures the source power output (at the measurement port) at a single stimulus point, and compares it to the calibrated power you selected.
Alternate and Chop Sweep Modes .. /.,./_.. . ,.;., ._..: ./ ,/., ;. ;. .;, . . : <.< r-.’ or ,j&“&&>;.: ~&;j$ softkey titl&, the Come,-&on More you can select the ~~~~~~~~~~~.~,. . .A .: . ,. ,. , :. . ;. .; /; . . . . . . . . . . . . ././. ., . ~ . . . . . . . :. . . . .,. menu to activate either one or the other sweep modes. For information about sweep types, refer to “Sweep Type Menu,” located earlier in this chapter. Alternate “~“L’: :~: :. . . - :. ,:, , . ‘: , , .: ,. ~~~~~.;.~A1~~~~~~~.
Calibrating for Noninsertable Devices A test device having the same sex connector on both the input and output cannot be connected directly into a transmission test configuration. Therefore, the device is considered to be rwninsertuble, and one of the following calibration methods must be performed.
Using the Instrument State Functions m INSTRUMENT STATE- R - L - - - T - - S . . HP-15 S T A T U S pg61 19d Figure 6-58. Instrument State Function Block The instrument state function block keys provide control of channel-independent system functions. The following keys are described in this chapter: n (System): Limit lines and limit testing, time domain operation, and instrument modes. w m): HP-IB controller modes, instrument addresses, and the use of the parallel port. w LSep]: Test sequencing.
HP-IB Menu This section contains information on the following topics: n local key n HP-IB controller modes n instrument addresses n using the parallel port This key is allows you to return the analyzer to local (front panel) operation from remote (computer controlled) operation. This key will also abort a test sequence or hardcopy print/plot. In this local mode, with a controller still connected on HP-IB, you can operate the analyzer manually (locally) from the front panel.
HP-IB STATUS Indicators When the analyzer is connected to other instruments over HP-IB, the HP-IB STATUS indicators in the instrument state function block light up to display the current status of the analyzer. R = remote operation L = listen mode T = talk mode S = service request (SRQ) asserted by the analyzer System Controller Mode me ~~~~~~~~~~~~~: softkey activates the system controller mode. men in this mode, i ;:... . :~:.&.:. .?. . :
Most of the HP-IB addresses are set at the factory and need not be modified for normal system operation. The standard factory-set addresses for instruments that may be part of the system are as follows: Instrument BP-IB Address (decimal) Analyzer 16 Plotter 05 Printer 01 External Disk Drive 00 Controller 21 Power Meter 13 The address displayed in this menu for each peripheral device must match the address set on the device itself.
The System Menu The @ZGT] key provides access to the system menu. This menu leads to additional menus which control various aspects of the analyzer system. The following softkeys are located within the system menu: w i&&;&&a allows you to produce me stamps on plots and printouts. n ~c~~~~~ ::,J$&@ provides access to tests&, raw offs&, ad spur avoidance fun&ions. . : :.:.: .: :.: . , L .,., . . . ,;>., .z. b J;;X#ZV:m .,. . . . . I. :>
Limits are checked only at the actual measured data points. It is possible for a device to be out of specification without a limit test failure indication if the point density is insufficient. Be sure to specify a high enough number of measurement points in the stimulus menu. Limit lines are displayed only on Cartesian formats. In polar and Smith chart formats, limit testing of one value is available: the value tested depends on the marker mode and is the magnitude or the first value in a complex pair.
Phase iimit values can be specified between +500° and -500’. Limit values above + 180° and below -18OO are mapped into the range of -180° to + 180° to correspond with the range of phase data values. Offset Limits Menu This menu allows the complete limit set to be offset in either stimulus value or amplitude value. This is useful for changing the limits to correspond with a change in the test setup, or for device specifications that differ in stimulus or amplitude.
Knowing the Instrument Modes There are five major instrument modes of the analyzer: H network analyzer mode n external source mode n tuned receiver mode n frequency offset operation n harmonic mode operation (Option 002) Network Analyzer Mode This is the standard mode of operation for the analyzer, and is active after you press w or switch on the AC power. This mode uses the analyzer’s internal source. External Source Mode This mode allows the analyzer to phase lock to an external CW signal.
n The frequency of the incoming signal should be within -0.5 to +5.0 MHz of the selected frequency or the analyzer will not be able to phase lock to it. CW Frequency Range in External Source Mode. 300 kHz to 3 GHz (6 GHz for Option 006) Compatible Sweep Types. The external source mode will only function in CW time sweep. If the instrument is in any other sweep type when external source is activated, the warning message CHANGED TO CW TIME MODE will appear on the display. External Source Requirements.
Frequency Offset Menu If you press [=I ~~~~~~~~~~’ ~~~~~~~~~,“‘~~~ , the andyzer flows phase-locked operation with a frequency offset between the internal source and receiver. This feature is used in swept RF mixer measurements and has an upper frequency limit equal to that of the analyzer being used. This feature allows you to set the RF source to a tied offset frequency above or below the receiver (as required in a mixer test, using a swept RF/IF and fixed LO).
SYNTHESIZED SIGNAL GENERATOR 6 dB ATTENUATOR I MIXER pg61 13d Figure 6-60. Typical ‘l&t Setup for a Frequency Offset Measurement Frequency Offset In-Depth Description The source and receiver operate at two different frequencies in frequency offset operation. The difference between the source and receiver frequencies is the Lo frequency that you specify. The two user-defined variables in frequency offset are the receiver frequency, and the offset (LC) frequency.
Receiver and Source Requirements. Refer to Chapter 7, “Specifications and Measurement Uncertainties. n IF Input: R always; and port 1 or port 2 for a ratio measurement. Display Annotations. The analyzer shows the annotation of s when the frequency offset mode is on. The annotation of? indicates that the source frequency is approximately 10 MHz away from the sum of the IF and Lo frequencies that you requested.
Harmonic Operation (Option 002 only) The a.naJyzer's harmonic menu cm be accessed by pressing Csyltem) ,~~~~~~~~::. i i .._.......~..~..........~....... The harmonic measurement mode allows you to measure the second or third harmonic as the analyzer’s source sweeps fundamental frequencies above 16 MHz. The analyzer can make harmonic measurements in any sweep type. l&pical Test Setup NETWORK ANALYZER L-J DEVICE UNDER TEST pg67e Figure 6-61.
Coupling Power Between Channels 1 and 2 the fundamental on channel 1 and the harmonic on channel 2. D2/Dl to D2 ratios the two, showing the fundamental and the relative power of the measured ,. : harmonic . . . . . . ., ., . ,.: _; *in ,. ,..;,s_. ,. ..%dBc .. . ...: .(. . . . . You must uncouple channels 1 ad 2 for this measurement, using the :gfJwm ~~.~~.~~i~~~. s&key set to OFF to allow alternating sweeps.
Time Domain Operation (Option 010) With Option 010, the analyzer can transform frequency domain data to the time domain or time domain data to the frequency domain. In normal operation, the analyzer measures the characteristics of a test device as a function of frequency. Using a mathematical technique (the inverse Fourier transform), the analyzer transforms frequency domain information into the time domain, with time as the horizontal display axis.
Time domain low pass impulse mode simulates the time domain response of an impulse input (like the bandpass mode). Both low pass modes yield better time domain resolution for a given frequency span than does the bandpass mode. In addition, when using the low pass modes, you can determine the type of discontinuity. However, these modes have certain limitations that are defined in “Time domain low pass, n later in this section.
from the reference plane (where the calibration standards are connected) to the discontinuity and back: 18.2 nanoseconds. The distance shown (5.45 meters) is based on the assumption that the signal travels at the speed of light. The signal travels slower than the speed of light in most media (e.g. coax cables). This slower velocity (relative to light) can be compensated for by adjusting the analyzer relative velocity factor. This procedure is described later in this section under “Time domain bandpass.
NETWORK ANALYZER LOAD ADAPTER III I I I I II pg643e Figure 6-63. A Reflection Measurement of Two Cables The ripples in reflection coefficient versus frequency in the frequency domain measurement are caused by the reflections at each connector “beating” against each other. One at a time, loosen the connectors at each end of the cable and observe the response in both the frequency domain and the time domain.
‘I&ble 6-10. Time Domain Reflection Formats Format LlN MAG REAL LOGMAG SWR Parameter Reflection Coefficient (unitless) (0 < p< 1) Reflection Cbdicient (unitless) (- 1 < p< 1) Retnm Loss (dB) Standing Wave Ratio (unitless) Transmission Measurements Using Bandpass Mode The bandpass mode can also transform transmission measurements to the time domain. For example, this mode can provide information about a surface acoustic wave (SAW) filter that is not apparent in the frequency domain.
Time domain low pass This mode is used to simulate a traditional time domain reflectometry (TDR) measurement. It provides information to determine the type of discontinuity (resistive, capacitive, or inductive) that is present. Low pass provides the best resolution for a given bandwidth in the frequency domain. It may be used to give either the step or impulse response of the test device.
Minimum allowable stop frequencies. The lowest analyzer measurement frequency is 30 kHz, therefore for each value of n there is a minimum allowable stop frequency that can be used. That is, the minimum stop frequency = n x 30 kHz.
ELEMENT STEP RESPONSE IMPULSE RESPONSE / OPEN UNITY REFLECTION SHORT UNITY REFLECTION ‘L UNIT‘I R E F L E C T I O N , -180” RESISTOR U N I T Y R E F L E C T I O N , -180’ A R >ZO POSITIVE LEVEL SHIFT ‘A RES I STOR R
CHl COV 511 hp 5 mU/REF Re G U 1 ' - 4 . 8 3 2 rnU CHI 56!5 ns I I I I I I I I I Cur CHl (a) Crimped Cable (Capacitlvej ill m Re 5 mU/REF 0 " 1: 2.9207 4 MARKER 1 2.456 “5 ?U, 41 mm CTAPT mu 3 ll!i6 ns 0 s (b) STOP 1 Frayed Cable 0 "5 (Inductive) pg6123d Figure 6-67. Low Pass Step Measurements of Common Cable Faults (Real Format) Transmission Measurements In Time Domain Low Pass Measuring small signal transient response using low pass step.
pgBlQ6-c Figure 6-68. Time Domain Low Pass Measurement of an Amplifier Small Signal Transient Response Interpreting the low pass step transmission response horizontal axis. The low pass transmission measurement horizontal axis displays the average transit time through the test device over the frequency range used in the measurement. The response of the thru connection used in the calibration is a step that reaches 50% unit height at approximately time = 0.
THRU LINE FIBER OPTIC CABLE (a) Comparing Transmission Paths through a Power Divider (b) Measuring Pulse Dispersion on a 1.5 km Fiber Optic Cable Figure 6-69. Transmission Measurements Using Low Pass Impulse Mode Time Domain Concepts Masking Masking occurs when a discontinuity (fault) closest to the reference plane affects the response of each subsequent discontinuity. This happens because the energy reflected from the first discontinuity never reaches subsequent discontinuities.
t i i WI STMaT-5 “a i ijiii i i i I STOP I n. (b) Short Circuit at the End of a 3 dB Pad (a) Short Circuit pg5194_c Figure 6-70. Masking Example Windowing The analyzer provides a windowing feature that makes time domain measurements more useful for isolating and identifying individual responses Windowing is needed because of the abrupt transitions in a frequency domain measurement at the start and stop frequencies.
To select a window, press ($GG) ~~~~~~;~~E~; .%HMW. A menu is presented that allows the selection of three window types (see ‘lhble 6-12). able 6-12. Impulse Width, Sidelobe Level, and Windowing Values Window Type ImpnlSe Sidelobe Level Low Pass llUpUlSC3 Width (50%) SkP Sidelobe Level SbP mseThe (10 - 90%) Minimum -13dB O.bO/Freq Span -21 dJ3 0.45IFreq Span Normal -44dB 0.
WINDOW LOW PASS IMPULSE MINIMUM NORMAL MAXIMUM ‘-J’- J pb664d Figure 6-72. The Effects of Windowing on the Time Domain Responses of a Short Circuit mge In the time domain, range is defined as the length in time that a measurement can be made without encountering a repetition of the response, called aliasing. A time domain response repeats at regular intervals because the frequency domain data is taken at discrete frequency points, rather than continuously over the frequency band.
To increase the time domain measurement range,first increase the number of points, but remember that as the number of points increases, the sweep speed decreases. Decreasing the frequency span also increases range, but reduces resolution. Resolution Two different resolution terms are used in the time domain: n response resolution n range resolution Response resolution.
CHl S T A R T 5 7 0 ps S T O P 2 . 5 0 5 ns pg682d Figure 6-73. Response Resolution While increasing the frequency span increases the response resolution, keep the following points in mind: w The time domain response noise floor is directly related to the frequency domain data noise floor. Because of this, if the frequency domain data points are taken at or below the measurement noise floor, the time domain measurement noise floor is degraded.
Gating Gating provides the flexibility of selectively removing time domain responses. The remaining time domain responses can then be transformed back to the frequency domain. For reflection (or fault location) measurements, use this feature to remove the effects of unwanted discontinuities in the time domain. You can then view the frequency response of the remaining discontinuities. In a transmission measurement, you can remove the effects of multiple transmission paths.
CHI A/R log MAG 10 dB/ REF -70 dB I Gd Hid CHl START-7 S T O P 7 ns ns pgE121d Figure 6-76. Gate Shape Selecting gate shape. The four gate shapes available are listed in lhble 6-13. Each gate has a different passband flatness, cutoff rate, and sidelobe levels. ‘able 6-13. Gate Characteristics Gate Passband Ripple Sidelobe Levels cntoff saspe Minimnm Gate span Gate Span Minimum fO.10 dJ3 -48dB 1.4IFreq Span Z.S/Freq Span Nod l 0.01 dB -68 dE3 Z.S/Freq Span 6.6/l%eq Span Wide fO.
Forward Transform Measurements This is an example of a measurement using the Fourier transform in the forward direction, from the time domain to the frequency domain (see Figure 6-77): I I , 1 i i i iiiii t t i i i i i i i i i 1 (a) CW Time (b) Transform to Frequency Domain pg6laQ~c Figure 6-77. Ampltier Gain Measurement Interpreting the forward transform vertical axis. With the log magnitude format selected, the vertical axis displays dE9.
Figure 6-78. Combined Effects of Amplitude and Phase Modulation Using the demodulation capabilities of the analyzer, it is possible to view the amplitude or the phase component of the modulation separately. The window menu includes the following softkeys to control the demodulation feature: ~~~~~;~~~~~ .i:i. :. ic.......... iiiii.............L.:...: . I.... is the normal preset state, h which both the mpl&& ad phase components ~~~~~~ . . . . . . .:. , ., .;/,- ., . , . A ~~~ .......
Forward transform range. In the forward transform (from CW time to the frequency domain), range is delIned as the frequency span that can be displayed before aiiasing occurs, and is similar to range as defined for time domain measurements. In the range formula, substitute time span for frequency span.
Wst Sequencing Test sequencing is an analyzer function that allows you to automate repetitive tasks. You can create a sequence as you are making a measurement. Then when you want to make that same measurement again, you can recall the sequence and the analyzer will repeat the previous keystrokes.
Commands That Require a Clean Sweep Many front panel commands disrupt the sweep in progress. For example, changing the channel or measurement type. When the analyzer does execute a disruptive command in a sequence, some instrument functions are inhibited until a complete sweep is taken. This applies to the following functions: n autoscale n data + memory Forward Stepping In Edit Mode In the sequence modify mode, you can step through the selected sequence list, where the analyzer executes each step.
The Sequencing Menu Pressing the Lse(L) key accesses the Sequencing menu. This menu leads to a series of menus that aRow you to create and control sequences, Gosub Sequence Command The ~.~~~~~~~~~~ :: :. .: i: _.. . . . . . . . . . . . . softkey, located in the Sequencing menu, activates a feature that allows the sequence to branch off to another sequence, then return to the original sequence. For example, you could perform an amplifier measurement in the following manner: 1.
Pin assignments: n n n n pin 1 is the data strobe pin 16 selects the printer pin 17 resets the printer pins 18-25 are ground Electrical specifications for ‘ITL high: n n volts(H) = 2.7 volts (V) current = 20 microamps @A) Electrical specifications for ‘ITL low: n n volts(L) = 0.4 volts (v) current = 0.2 milliamps (mA) 4 3 2 1 0 PARALLEL IN E[TS b 0 1 2 3 i 4 1 5 I 6 I 7 PARALLEL OUT BITS pg6129d Figure 6-81.
‘lTL Out Menu ;: .., .i. z. I. // I. ;:<“”<. .“’)( (.““”~y: me cw$ ;. .:Y.fz:,.; . ,. . . . . JiTJT: softkey provides access to the ‘ITL out menu. This menu allows you to choose between the following output parameters of the ‘ITL output signal: The TTL output signals are sent to the sequencing BNC rear panel output. Sequencing Special Functions Menu ,.,.... _. il..,.,.,,_,i_i 'I'h&menu isaccessedbypressingthe .,..l..,__ _._ _ _ _..... ,.. _ _ ~~~~.~~~~~~~,,..softkeyin the Sequencingmenu.
Loop counter decision making The analyzer has a numeric register called a loop counter. The value of this register can be set by a sequence, and it can be incremented or decremented each time a sequence repeats itself. ; _ ., _ / / ; ,. . Li .:.: ~. ~. ~. ~. ~. .~ .~ .A. . s. s. . . . w; iii.i . : A;; .% . A. .i to another sequence if the stated condition is true. When entered into the sequence, these commands require you to enter the destination sequence.
,. , _ _ ., ,. _ ,. . :. . ;. _.,_ _ .,;_ ‘I’he ‘~~~~;:~~~~~~~,;~ sequencing .._.................................... .,.,...A..;,..... .>A:.:<~: co-and (in the Sequencing Special m&ions ::::: menu) sends the HP-GL command string to the analyzer’s HP-GL address. The address of the analyzer’s HP-GL graphics interface is always offset from the instrument’s HP-IB address by 1: n n If the current instrument address is an even number: HP-GL address = instrument address + 1.
Amplifier Tksting Amplifier parameters The HP 8753E allows you to measure the transmission and reflection characteristics of many amplifiers and active devices. You can measure scalar parameters such as gain, gain flatness, gain compression, reverse isolation, return loss (SWR), and gain drift versus time. Additionally, you can measure vector parameters such as deviation from linear phase, group delay, complex impedance and AM-to-PM conversion. pg6137d Figure 6-82.
The second/third harmonic response can be displayed directly in dBc, or dE3 below the fundamental or carrier (see Figure 6-84). The ability to display harmonic level versus frequency or RF power allows “real-time” tuning of harmonic distortion. Further, this swept harmonic measurement, as well as all of the traditional linear amplifier measurements can be made without reconnecting the test device to a different test configuration.
(b) Input Power (dBm) Input Power (dBm) pb697d Figure 6-85. Diagram of Gain Compression Figure 6-86 illustrates a simultaneous measurement of fundamental gain compression and second harmonic power as a function of input power. CHl Spi G A I N I CHI CH2 100 .2 NAG OHPR SSIOtj I I S T A R T - 5 . 0 dBnl B 102 N A G I L CH2 START I - 5 . 0 REF I 10 dB I I I I 1 c w i 2 0 0 . 0 0 0 0 0 0 HHZ 10 a24 R E F - 3 0 dB STOP 1 0 . 0 dBrn I I I I 1 2 0 0 . 0 0 0 0 0 0 MHZ I STOP I 1 1 0 .
Metering the power level When you are measuring a device that is very sensitive to absolute power level, it is important that you accurately set the power level at either the device input or output. The analyzer is capable of using an external HP-IB power meter and controlling source power directly. Figure 6-87 shows a typical test configuration for setting a precise leveled input power at the device input. NETWORK ANALYZER POWER METER UNDER TEST POWER SENSOR Figure 6-87.
Mixer Testing Mixers or frequency converters, by definition, exhibit the characteristic of having different input and output frequencies. Mixer tests can be performed using the frequency offset operation of the analyzer (with an external LO source) or using the tuned receiver operation of the analyzer (with an external RF and LO source). The most common and convenient method used is frequency offset.
Mixer Parameters That You Can Measure Pg6 140d Figure 6-88. Mixer hrameters w Transmission characteristics include conversion loss, conversion compression, group delay, and RF feedthru. n n n Reflection characteristics include return loss, SWR and complex impedance. Characteristics of the signal at the output port include the output power, the spurious or harmonic content of the signal, and intermodulation distortion.
Attenuation at Mixer Ports Mismatch between the instruments, cables, and mixer introduces errors in the measurement that you cannot remove with a frequency response calibration. You can reduce the mismatch by using high quality attenuators as close to the mixer under test as possible. When characterizing linear devices, you can use vector accuracy enhancement (measurement calibration) to mathematically remove all systematic errors from the measurement, including source and load mismatches.
Filtering Harmonics, linearity, and spurious signals also introduce errors that are not removed by frequency response calibration. These errors are smaller with a narrowband detection scheme, but they may still interfere with your measurements. You should filter the IF signal to reduce these errors as much as possible. Correct filtering between the mixer’s IF port and the receiver’s input port can eliminate unwanted mixing and leakage signals from entering the analyzer’s receiver.
kequency Selection By choosing test frequencies (frequency list mode), you can reduce the effect of spurious responses on measurements by avoiding frequencies that produce IF signal path distortion. LO Frequency Accuracy and Stability The analyzer source is phaselocked to its receiver through a reference loop. In the frequency offset mode, the mixer under test is inserted in this loop.
It is important to keep in mind that in the setup diagrams of the frequency offset mode, the analyzer’s source and receiver ports are labeled according to the mixer port that they are connected to. ,,, n In a down converter measurement where the ;~~~~~~~~. softkey is selected, the notation on the analyzer’s setup diagram indicates that the analyzer’s source frequency is labeled RF, connecting to the mixer RF port, and the analyzer’s receiver frequency is labeled IF, connecting to the mixer IF port.
n In m up converter measurement where the ,~~~~.~~~~ softkey is selected, the notation on the setup diagram indicates that the analyzer’s source frequency is labeled IF, connecting to the mixer IF port, and the analyzer’s receiver frequency is labeled RF, connecting to the mixer RF port. Because the RF frequency can be greater ,. . . _ set . . LO frequency in this type of ~..‘. -:,y~. or .” less “” $xn the measurement, you can select either ‘j&F:> ~%CV or k& .<:-,@.I. .i ./.; ..i .*. .
Conversion Loss fl F= fRF-fLO ’ RF iL0 fl F= fRF+ fLO FREQUENCY pg694d Figure 6-95. Example Spectrum of RF, LO, and IF Signals Present in a Conversion Loss Measurement Conversion loss is a measure of how efliciently a mixer converts energy from one frequency to another. It is the ratio of the sideband output power to input signal power and is usually expressed in dB.
RF Feedthru RF feedthru, or RF-to-IF isolation, is the amount the RF power that is attenuated when it reaches the IF port. This value is low in double balanced mixers. RF feedthru is usually less of a problem than the LO isolation terms because the LO power level is significantly higher than the RF power drive. You can make an RF feedthru measurement using the same instruments and setup that you use to measure conversion loss.
Conversion Compression (a) Input S i g n a l m D -, ( R F ) LL - (bj I n p u t S i g n a l ( R F ) pb6100d Figure 6-97. Conversion Loss and Output Power as a Function of Input Power Level Conversion compression is a measure of the maximm RF input signal level for which the mixer will provide linear operation. The conversion loss is the ratio of the IF output level to the RF input level, and this value remains constant over a specified input power range.
Amplitude and Phase Tracking The match between mixers is defined as the absolute difference in amplitude and/or phase response over a specified frequency range. The tracking between mixers is essentially how well the devices are matched over a specified interval. This interval may be a frequency interval or a temperature interval, or a combination of both. You can make tracking measurements by ratioing the responses of two mixer conversion loss measurements.
In standard vector error-correction, a thru (delay = 0) is used as a calibration standard. The solution to this problem is to use a calibration mixer with very small group delay as the calibration standard. An important characteristic to remember when selecting a calibration mixer is that the delay of the device should be kept as low as possible. ‘Ib do this, select a mixer with very wide bandwidth (wider bandwidth results in smaller delay).
Connection Considerations Adapters lb minimize the error introduced when you add an adapter to a measurement system, the adapter needs to have low SWR or mismatch, low loss, and high repeatability. Leakage signals 44 Worst Case System DiBtiVity Reflected signal * Coupler has 4OdE3 Directivity 3 ;;\. _ _ _ _ _ +i . Adapter c, __----:* : -----_____- s-.. x .,.....-., . . . . . . . . “,.I 1 D
Fixtures Fixtures are needed to interface non-coaxial devices to coaxial test instruments. It may also be necessary to transform the characteristic impedance from standard 50 ohm instruments to a non-standard impedance and to apply bias if an active device is being measured. For accurate measurements, the ilxture must introduce minimum change to the test signal, not destroy the test device, and provide a repeatable connection to the device.
Reference Documents Hewlett-Packard Company, “Simplify Your Amplifier and Mixer Testing” 5056-4363 Hewlett-Packard Company, “RF and Microwave Device Test for the ’00s - Seminar Papers” 5001~88043 Hewlett-Packard Company ‘%sting Amplifiers and Active Devices with the HP 8720 Network Analyzer” Product Note 8720-l 5091-1942E Hewlett-Packard Company “Mixer Measurements Using the HP 8753 Network Analyzer” Product Note 8753-2A 5052-2771 General Measurement and Calibration Techniques Rytting, Doug, “Effects of Un
On-Wafer Measurements Hewlett-Packard Company, “On-Wafer Measurements Using the HP 8510 Network Analyzer and Cascade Microtech Wafer Probes,” Product Note 8510-6 HP publication number 5054-1570 Barr, J.T., T. Burcham, A.C. Davidson, E. W. Strid, “Advancements in On-Wafer Probing Calibration Techniques, n Hewlett-Packard RF and Microwave Measurement Symposium paper, 1991 Lautzenhiser, S., A. Davidson, D.
7 Specifkations and Measurement Uncertainties Dynamic Range The specifications described in the table below apply to transmission measurements using 10 Hz IF BW and full 2-port correction. Dynamic range is limited by the maximum test port power and the receiver’s noise floor. ‘able 7-1. HP 8753E Dynamic Range Frequency Range Dynamic Range 30 kHz to 300 kHz 100 dB* ** 3OOkHzt~1.3GHz 110 dBt $ 1.
HP 8753E Measurement Port Specifications HP 8763E (6OQ) with 7-mm Test Ports The following specifications describe the system performance of the HP 8753E network analyzer. The system hardware includes the following: options: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .006 Calibration kit: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
‘Ihble 7-3. Measurement Port Characteristics (Uncorrected*) for EP 8753E (5OU) with 7-mm Ikst Ports Frequency Range 30 kHz to 300 k&t 300 kHz to 1.3 GHz 1.3 GHz to 3 GHz 3 Gliz to 6 GHz Directivity 20 dBi 35 dB 30 dB 26 dB Source match 18 dB§ 16 dB 16 dB 14 dB Load match 18 dBf’ 18 dB 16 dB 14 dB Reflection tracking f2.6 dB f1.6 dB il.6 dB f2.6 dB Transmission f2.6 dB fl.6 dB fl.6 dB f2.
HP 8763E (SO@ with Type-N Test Ports The following specifications describe the system performance of the HP 8753E network analyzer. The system hardware includes the following: options: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Calibration kit: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . , . . . . .
HP 8763E (SO@ W with 3.6~mm Test Ports The following specifications describe the system performance of the HP 8753E network analyzer. The system hardware includes the following: Options: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 006 Calibration kit: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
HP 8763E (76Q) with Type-N Test Ports The following specifications describe the system performance of the HP 8753E network analyzer. The system hardware includes the following: Options: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . , . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .075 Calibration kit-. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
‘Ihble 7-7. Measurement Port Characteristics (Uncorrected)*t for HP 8753E (75 Ohms) with Type-N !kst Ports Frequency Range 30 kuz to 300 kuzt 300 kllz to 1.3 GHz 1.3 GHz to 3 GHz Directivity 20dB$ 36 dB 30 dB Source match 10 dB 16 dB 16 dB Load match 14 dB 18 dB 16 dB Reflection tracking f2.6 dB il.6 dB il.6 dB Transmission f2.6 dB il.6 dB f1.
HP 8763E (7612) with Type-F Test Ports The following specifications describe the system performance of the HP 8753E network analyzer. The system hardware includes the following: Options: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .075 Calibration kit: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . , . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Instrument Spectications The specifications listed in lhble 1 range from those guaranteed by Hewlett-Packard to those typical of most HP 8753E instruments, but not guaranteed. Codes in the far right column of Table 1 reference a specification dellnition, listed below. These definitions are intended to clarify the extent to which Hewlett-Packard supports the specified performance of the HP 8753E. S-l: This performance parameter is verifiable using performance tests documented in the service manual.
‘lhble 7-12. HP 8753E Instrument Specifications (1 of 6) TEST PORT OUTPUT Del3cription SpS?d0cstioll Code ?RF.QUENCY CHARACI’JIRISTICS Standard Option 006 30kHzto3GHz 30kHzt.~6GHz S-l S-l f10 ppm S-l f7.6 ppm f3 mm 1HZ T T s-3 U: Standard option 076 -86to +lOdBm -S6to +SdHm S-l S-l Resolution Level Accuracy (at 0 dBm output level) (at 26 “C f 6 “C)t 0.06 dl3 fl.O dH s-3 S-1. Linearity (at 26 OC f6 “C)* -16t.o +SdBm +Sto +lOdBm(Standard) + 6 to + 8 dE%m (Option 076) f0.
‘Ihble 7-12. HP 8753E Instrument Specifkations (2 of 6) TEST POET INPUTS’ Description cHAlzAcTE~IsTIcs Frequency Range Standard Option 006 Impedance standard: 30kHzto60kHz 6OkHzto3OOkHz 3OOkHzto 1.3GHz 1.
‘lhble 7-12.
‘Ihble 7-12. HP 8753E Instrument Specifhtions (4 of 6) INPUT GENBBAL Description Speciftcation co& bfAGNITUDE CHABACTBBISTICS Display Resolution 0.01 dB/division s-: Marker* Resolution 0.001 dB s: s-l DynamicIF BW: 10 Hz, averaging factor: 1, inputs: test port 1 and 2 (R to -35 dBm) For test port powers > -50 dBm, magnitude dynamic accuracy is 0.02 dB + 0.001 dB/dB from the reference power (plus the effects of sampler compression). The following graphs include the effects of noise.
‘Ihble 7-12. EP 8753E Instrument Speciikations (5 of 6) INPUT GENEBAL Description Specillcation code SASE CHABACTEBISTICS (cont.) s-3 Dynamic Accuracy IF BW: 10 Hz, averaging factor: 1, inputs: test port 1 and 2 (R to -35 dBm) Phase dynamic accuracy is 0.132 deg + 0.0066 deg/dE4 from the reference power (plus the elfects of sampler compression) The following graphs include the effects of noise. HP8753E Phase Dynamic Accuracy 0.
‘Ihble 7-12. EIP 8753E Instrument Specifications (6 of 6) INPUT GENERAL (cont.) Description SpecWcation code GBOUP DELM CHABACTEBISTICS Soup delay is computed by measurhig the phase change within B speciiied frequency step (determined by the frequency span and the number of points per sweep).
HP 8763E Network Analyzer General Characteristics Measurement Throughput Summary The following table shows typical measurement times for the HP 8753E network analyzer in milliseconds.
Remote Programming Interface HP-IB interface operates according to IEEE 488-1978 and IEC 625 standards and IEEE 728-1982 recommended practices Transfer Formats Binary (internal 48-bit floating point complex format) ASCII 32/64 bit IEEE 754 Floating Point Format Interface Function Codes SHl, Ml, T6, TEO, IA, LEO, SRl, RLl, PPO, DCl, DTl, Cl, C2, C3, ClO, E2 Front Panel Connectors Connector type . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
External Auxilhry Input (AUX INPUT) Inputvoltagelimits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -1OVto +lOV External AM Input (EXT AM) fl volt into a 5 kQ resistor, 1 kHz maximum, resulting in approzimately 8 dB/volt amplitude modulation. External Trigger (EXT TRIGGER) Triggers on a positive or negative ‘ITL transition or contact closure to ground. EXT TRIGGER -TO SWEEP TRIGGER CIRCUITRY pg6145d Figure 7-1.
Display Pixel Integrity Red, Green, or Blue Pixels Speciiications Red, green, or blue “stuck on” pixels may appear against a black background. In a properly working display, the following will not occur: n complete rows or columns of stuck pixels n more than 5 stuck pixels (not to exceed a maximum of 2 red or blue, and 3 green) n 2 or more consecutive stuck pixels n stuck pixels less than 6.5 mm apart Dark Pixels Specifications Dark “stuck on” pixels may appear against a white background.
Environmental Characteristics General Conditions EMC characteristics: emissions, CISPR Publication 11; immunity, IEC 801-2/3/4, level 2. Electrostatic discharge (ESD): must be eliminated by use of static-safe work procedures and an anti-static bench mat (such as HP 92175T). Dust: the environment should be as dust-free as possible. Enclosure protection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Weight Net . . . . . . . . . . . . . . . . ..~....................................... . . . . . . . . . . . . . . . . . . . . . . . . . 21 kg (46 lb) shipping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 kg (76 lb) Cabinet Dimensions 222 mm H x 425 mm W x 457 mm D (8.75 x 16.75 x 18.0 in) (These dimensions exclude front and rear panel protrusions.
pb611ld 8-2 Menu Maps
84 Menu Maps
ir; COPY 3Pi INU PLOT DATA ON off PEN NUM DATA LINE PLOT MEM ON off PEN NUM MEMORY LINE TYPE MEMORY PLOT GPAT ON off PEN NUM GRAT ICULE PLOT TEXT ON off PEN NUM TEXT PLOT MKR ON off PEN NUM MARKER t PRINT UONOCHROME * PLOT PRINTER FORM FEED MORE QUAD c 1 DEFINE PLOT PLOT LIST A I 7 MENU LIST VALUES OP PARMS (MKRS etc) NEXT PAGE TYPE DATA - - LEFT X - LOW:R SPEED c 1 - X RIGHT - - UPPER - - RlGtiT - X LOWER X X FULL’ X X PAGE -RE::“,, I I r DEFINE PRINT MENU 1 PREVIOUS PA
FORMAT MENU FORMAT MORE MENU LOG MAG REAL I IMAGINARY ,,,,i, DELA,’ I SMITH CHART I POLAR LIN MAG SWR I MORE h RETURN pb6llOd ADDRESS MENU HP-18 MENU SYSTEM ADDRESS: 8753 CoNTRoLL;R TALKER/ LISTENER I USE PASS CONTROL PLOTTER __) PORT PRINTER _ PORT PLOTTER MENU FORT PLTR TYPE c 1 PLTR PORT HPIB PARALLEL ADDRESS : DISK SERIAL PARALLEL c 1 ADDRESS.
M/iRKER S E A R C H :NU MARtiER+ START MARtiER+ STOP MARKER+ CENTER MARKER+ SPAN MARKER-t REFERENCE MARKER+ DELAY I MKR SEARCH COFFI MKR MODE MENU I I TARGET MENU SEARCH.
r ;F;BAMETER [-z--J+ 3NVERSION -NV RefI:FWD 511 (A/R) Trans REV Sl2 (A/y) I Z:Ref I B/R I Z:Trans A/B I Y.Ref I RefI :REV 522 (B/p) I Y.
TIMULUS ENU P(IWER ME INU PWR RANGE AUTO mar, - POWER POWER MENU SWEEP TIME CAUTOI POWER RANGES TRIGGER MENU SLUPE - - NUMBER of POINTS 11 MEASURE RESTART COUPLED CH ON off CHAN PWR [COUPLEDI PORT POWER [COUPLED1 CW FREQ 11 RIGGER : ENU SWEEP TYPE MENU YEEP :NU L HOLD TYPE DELETE SWE:P CW TIME TRIGGER: TRIG OFF I EXT TRIG ON SWEEP EXT TRIG ON POINT ADD EDIT LIST MANUAL TdG ON POINT RETURN FREO appecrs ---B .
SAVE/RECALL MEN” + SAVE DEFINE MENU RENAME F I LE MENU STATE RECALL STtATE RECALL RECALL KEYS MENU SAVE GRAPHICS KEYS MENU DATA RECALL KEYS on OFF ONL, SAYE “SING FIIF ~ UTlLlTlii RECALL REG7 * FILE UTILlTlES MENU I L- SELECT MENU O I% I INTERNAL MEMORY INTERNAL DISK / EXTERdL DISK CONFIGURE EXT DISK d 1 CONFiGURE MENU EXT ADDRESS.
f- PIR E S E T M ENU * * * * * ** PRESET FACTORY -JR * U S E R - D E F I N E D S E Q U E N C E S WlLL A P P E A R IN THESE LOCATIONS ** S E O U E N C E 6 IS T H E ONLY U S E R - D E F I N E D S E Q U E N C E T H A T W I L L SUR”,“E P O W E R - O F F .
8-14 MenuMaps
I .
9 Key Definitions This chapter contains information on the following topics: w softkey and front-panel functions in alphabetical order (includes a brief description of each function) w cross reference of programming commands to key functions n cross reference of softkeys to front-panel access keys _ _ . _.:.: Note me ~~~~~~~~ keys we not included h as chapter.
Guide Tkrms and Conventions The eight keys along the right side of the analyzer display are called softkeys. Their labels are shown on the display. The softkeys appear in shaded boxes in this chapter (for example, ~~~~~~~~~~~). %:.,.L"./ii :.::sx..'~ ...<<...:::...T.:: .. .....i :.x:. .....w. me labeled keys that me on the front panel of the analyzer are called front-panel keys The front-panel keys appear in unshaded boxes in this chapter (for example, &iGJ).
turns off the delta marker mode, so that the values displayed for the active marker are absolute values. establishes marker 1 as a reference. The active marker stimulus and response values are then shown relative to this delta reference. Once marker 1 has,~.~~.~...se!ected as the delta . . . . j. .. . . . is underlined ., reference, the softkey label ‘~~~~~~ h t& :. ,.: ,.: ,.: .: .: .: .~.: ~.~;:. :.~ .~:.~.,:. ,:.~:., :. ~ :. ~:. :. menu, and the marker menu is returned to@f$fpgy the screen. ..:m* .
calculates and displays the complex ratio of the signal at input A to the reference signal at input R. puts the name of the active entry in the display title. puts the active marker magnitude in the display title. selects coaxial as the type of port used in adapter removal calibration. selects waveguide as the type of port used in adapter removal calibration. is used to enter the value of electrical delay of the adapter used in adapter removal calibration. provides access to the adapter removal menu.
turns the plotter auto feed function on or off when in the define plot menu. It turns the printer auto feed on or off when in the defie print menu. brings the trace data in view on the display with one keystroke. Stimulus values are not affected, only scale and reference values. The analyzer determines the smallest possible scale factor that will put all displayed data onto 80% of the vertical graticule.
measures the absolute power amplitude at input B. calculates and displays the complex ratio of input B to input R. deletes the last character entered. sets the background intensity of the LCD as a percent of white. The factory-set default value is stored in non-volatile memory. (Option 010 only) sets the time-domain bandpass mode. toggles an annunciator which sounds to indicate completion of certain operations such as calibration or instrument state save. turns the limit fail beeper on or off.
brings up the segment modify menu and segment edit (calibration factor menu) which allows you to enter a power sensor’s calibration factors The calibration factor data entered in this menu will be stored for power sensor B. leads to the select cal kit menu, which is used to select one of the default calibration kits available for different connector types. This, in turn, leads to additional menus used to deffne calibration standards other than those in the default kits (refer to Modifying Calibration Kits.
@iK.xChan 3 3) allows you to select channel 1 or channel 3 as the active channel. The active channel is indicated by an amber LED adjacent to the corresponding channel key. When the LED is constantly lit, channel 1 is active. When it is flashing, channel 3 is active. The front panel keys allow you to control the active channel, and ah of the channel-specific functions you select apply to the active channel. Note The (Ghan] and (Ghan] keys retain a history of the last active channel.
selects channel 4 memory trace for display color modification. selects channel1 .z4 “i..m:; memory for display color . ;w;j:., ., _ ;.~. . . trace mo&fication.\ ~~~~~~~~:lt~\brings ..:..: ..i.::: . .... . . . . .... i. ~. . . . .~~~.~~~.. ........... .... . . . . ...... up the printer color selection menu. The channel 2 data trace default color is blue for color prints. is used to apply the same power levels to each channel. is used to apply different power levels to each channel.
located under the 1Menu) key, is the standard sweep mode of the analyzer, in which the sweep is triggered automatically and continuously and the trace is updated with each sweep. brings up the conversion menu which converts the measured data to impedance (Z) or admittance (Y). When a conversion parameter has been defined, it is shown in brackets under the softkey label. . . . . . . . . . .,. .If . ._ ,. no conversion ,.;. . ., _;., .,..,., . ... ..._. .
divides the data by the memory, normalizing the data to the memory, and displays the result. This is useful for ratio comparison of two traces, for instance in measurements of gain or attenuation. subtracts the memory from the data. The vector subtraction is performed on the complex data. This is appropriate for storing a measured vector error, for example directivity, and later subtracting it from the device measurement. stores the current active measurement data in the memory of the active channel.
deletes the segment indicated by the pointer. deletes all liles. deletes a selected file. sets the limits an equal amount above and below a specified middle value, instead of setting upper and lower limits . . . . . .: . . . . separately. This is used in co~unction with ~~~~~~~~~: or . . . . ~~~~~~~~~~, ...a i........................... ...~....... ... ,,..;:.:,.........,.:. .,...:.... .‘:..:.;. to set limits for testing a device that is .‘.::<.:.:.::.
has two functions: H It shows the current sequences in memory. ‘Ib run a sequence, press the softkey next to the desired sequence title, n When entered into a sequence, this command performs a one-way jump to the sequence residing in the;;; specilled . . _._,.,._.,.,., _. . __ _. . sequence position (SEQUENCE 1 through 6). ~~~~~~~~ .: :_. i:. ;. . . . . ..>. >. x . . . L.; . . . . . i. i. i i .:;: . ,.;: jumps to a softkey position, not to a specific sequence title. Whatever sequence .z ., ,i ,.Iin .
Power meter calibration occurs on each sweep. Each measurement point is measured by the power meter, which provides the analyzer with the actual power reading. The analyzer corrects the power level at that point. The number of measurement/correction iterations performed on each poht is determined by the ~~~~~~~~~ softkey. :i :~ ~.:~.: ~ :~ ~ ~ ~ . ~;.~. ~ ~. ;. , ,”I. ,. :. . .~. ; ;. ;.~;~; ~. ~~ ...........s . ,.L. .,:z.: This measurement mode sweeps slowly, especially when the measured power is low.
Use this feature to add electrical delay (in seconds) to extend the reference plane at input A to the end of the cable. This is used for any input measurements including S-parameters, adds electrical delay to the input B reference plane for any B input measurements including S-parameters. extends the reference plane for measurements of &I, S21, and f&2. extends the reference plane for measurements of !& S12, and s21. toggles the reference plane extension mode.
..,- changes the response value of the fixed marker. In a Cartesian format this is the y-axis value. In a polar or Smith chart format with a magnitude/phase marker, a real/imaginary marker, an R + jX marker, or a G + jB marker, this applies to the first part of the complex data pair Fixed marker response values are always uncoupled in the two channels. active marker response values following a _To ..... ._. .....~ read .
sets the Lo frequency to sweep mode for frequency offset. provides access to the series of menus used to perform a complete calibration for measurement of all four S-parameters of a two-port device. This is the most accurate calibration for measurements of two-port devices. measures the forward isolation of the calibration standard. lets you enter a label for the forward match class. The label appears during a calibration that uses this class.
(Option 010 only) selects an intermediate time domain gate. copies the sequence titles currently in memory into the six softkey positions. calls sub-routines in sequencing. specifies whether or not to store display graphics on disk with the instrument state. brings up the graticule print color definition menu. The graticule default print color is cyan. selects the display graticule for color modification. (Option 002 only) leads to the harmonics menu.
jumps to one of the six sequence positions (SEQUENCE 1 through 6) if the limit test fails. This command executes any sequence residing in the selected position. Sequences may jump to themselves as well as to any of the other sequences in memory. When this softkey is pressed, the analyzer presents a softkey menu showing the six sequence positions and the titles of the sequences located in them. Choose the destination sequence to be called if the limit test fails.
,IiRrixwOi~.on ,.... ,. . .,/i.: . ,.OFF: turns interpolated error correction on or off. The interpolated error correction feature allows the operator to calibrate the system, then select a subset of the frequency range or a different number of points. Interpolated error correction functions in linear frequency, power sweep and CW time modes. When using the analyzer in linear sweep, it is recommended that the original calibration be performed with at least 67 points per 1 GHz of frequency span.
leads to a series of menus used to deline limits or specifications with which to compare a test device. Refer to Limit Lines and Limit Testing. turns limit testing on or off. When limit testing is on, the data is compared with the defined limits at each measured point. Limit tests occur at the end of each sweep, whenever the data is updated, when formatted data is changed, and when limit testing is hrst turned on. Limit testing is available for both magnitude and phase values in Cartesian formats.
Lxm provides a tabular listing of alI the measured data points and their current values, together with limit information if it is turned on. At the same time, the screen menu is presented, to enable hard copy listings and access new pages of the table. 30 lines of data are listed on each page, and the number of pages is determined by the number of measurement points specified in the stimulus menu. provides two user-delinable arbitrary frequency list modes.
shows the HP-IB address of the Lo source. defines the standard type as a load (termination). Loads are assigned a terminal impedance equal to the system characteristic impedance ZO, but delay and loss offsets may still be added. If the load impedance is not ZO, use the arbitrary impedance standard definition. LDAB AlO WFSET initiates measurement of a calibration standard load without offset. initiates measurement of a calibration standard load with offset. presents the load sequence from disk menu.
displays the current value of the loop counter and allows you to change the value of the loop counter. Enter any number from 0 to 32767 and terminate with the (x1) key. The default value of the counter is zero. This command should be placed in a sequence that is separate from the measurement sequence. For this reason: the measurement sequence containing a loop decision command must call itself in order to function.
displays an active marker on the screen and provides access to a series of menus to control from one to five display markers for each channel. Markers provide numerical readout of measured values at any point of the trace. The menus accessed from the @K&F] key provide several basic marker operations. These include special marker modes for different display formats, and a marker delta mode that displays marker values relative to a specified value or another marker. &$ggQQ$, . ,. . . .G #F$,. . ; :&& . . ., .
changes the start and stop values of the stimulus span to the values of the active marker and the delta reference marker. If there is no reference marker, the message “NO MARKER DEITA - SPAN NOT SET” is displayed. !f4ME't + ,START changes the stimulus start value to the stimulus value of the active marker. - ---r'.i STTJWLVS sets the starting stimulus value of a limit line segment using the active marker.
couples the marker stimulus values for the two display channels. Even if the stimulus is uncoupled and two sets of stimulus values are shown, the markers track the same stimulus values on each channel as long as they are within the displayed stimulus range. places markers only on measured trace points determined by the stimulus settings. allows the marker stimulus values to be controlled independently on each channel. moves the active marker to the maximum point on the trace.
moves the active marker to the minimum point on the trace. is used to define the lowest frequency at which a calibration kit standard can be used during measurement calibration. In waveguide, this must be the lower cutoff frequency of the standard, so that the analyzer can calculate dispersive effects correctly (see 3X?IWB &5UlY ). leads to the marker search menu, which is used to search the trace for a particular value or bandwidth.
mm OF FDXNTS is used to select the number of data points per sweep to be measured and displayed. Using fewer points allows a faster sweep time but the displayed trace shows less horizontal detail. Using more points gives greater data density and improved trace resolution, but slows the sweep and requires more memory for error correction or saving instrument states. The possible values that can be entered for number of points are 3, 11, 26, 51, 101, 201, 401,801, and 1601.
leads to the series of menus used to perform a high-accuracy two-port calibration without an S-parameter test set. This calibration procedure effectively removes directivity, source match, load match, isolation, reflection tracking, and transmission tracking errors in one direction only. Isolation correction can be omitted for measurements of devices with limited dynamic range. (The device under test must be manuaIly reversed between sweeps to accomplish measurement of both input and output responses.
when editing a sequence, False Tg .&ZLlZGT appears when you press XT0 ~E~~~.,. When placed in a sequence, it presents the menu of up to 6 available sequences (softkeys containing non-empty sequences). The message “CHOOSE ONE OF THESE SEQUENCES” is displayed and the present sequence is stopped. If the operator selects one of the sequences, that sequence is executed. Any other key can be used to exit this mode. This function is not executed if used during modify mode and does nothing when operated manually.
specifies whether the memory trace is to be drawn (on) or not drawn (off) on the plot. Memory can only be plotted if it is displayed (refer to “Display Menu” in Chapter 6). specifies whether the markers and marker values are to be drawn (on) or not drawn (off) on the plot. supplies a name for the plot file generated by a PLOT to disk. Brings up the TITLE PILE MENU. toggles between fast and slow speeds.
PCET P#R ~~~~~~~~ .i allows you to set different power levels at each port. makes power level the active function and sets the RF output power level of the analyzer’s internal source. The analyzer will detect an input power overload at any of the three receiver inputs, and automatically reduce the output power of the source to -85 dBm. This is indicated with the message “OVERLOAD ON INPUT (R, A, B).” In addition, the annotation “Pl” appears at the left side of the display.
PRami* t.. rx3ER is used to select a preset condition defined by the user. This is done by saving a state in a register under @G$Gii) and naming the register UPRESET. When .PRRSm::. ..VfsER is underlined, the w key will bring up the state of the UPRESET register. selects a menu to set the preset states of some items. steps backward through a tabular list of data page-by-page. FRXif :. Hii ../ tXWR when displaying list values, prints the entire list in color.
toggles the power range mode between auto and manual. Auto mode selects the power range based on the power selected. Manual mode limits power entry to within the selected range. leads to the power meter calibration menu which provides two types of power meter calibration, continuous and single-sample. turns off power meter calibration. measures the absolute power amplitude at input R. converts the active marker values into rectangular form.
searches the directory of the disk for Iile names recognized as belonging to an instrument state, and displays them in the softkey labels. No more than five titles are displayed at one time. If there are more than five, repeatedly pressing this key causes the next five to be displayed. If there are fewer than five, the remaining softkey labels are blanked. is a disk tile directory command.
RECALL STATE is used in conjunction with sequencing, to return the instrument to the known preset state without turning off the sequencing function. This is not the same as pressing the (Preset key: no preset tests are run, and the HP-IB and sequencing activities are not changed. provides access to the Receiver Cal Menu. selects the display reference line for color modification. selects the reference line for printer color modification.
kRSPti#SE . When in the specify class more menu, IB!$PSMSE is used to enter the standard numbers for a response calibration. This calibration corrects for frequency response in either reflection or transmission measurements, depending on the parameter being measured when a calibration is performed. (For default kits, the standard is either the open or short for reflection measurements, or the thru for transmission measurements.) n n When in the response cal menu, RE$P.
lets you enter a label for the reverse transmission class. The label appears during a calibration that uses this class. specifies which standards are in the reverse transmission class in the calibration kit. is used to enter the standard numbers for the reverse transmission (thru) calibration. (For default kits, this is the alru.) adjusts the source frequency higher than the LO by the amount of the LO (within the limits of the analyzer).
.,.,:,:,: ......... . ...._;.; .,., “““’ F7 g&g . _.:. ./ /i .b ...:i is used to enter the standard numbers for the third class required for an SZZ l-port calibration. (For default kits, this is the load.) measures the short circuit TRL/LRM calibration data for PORT 2. selects whether sampler correction is on or off. saves the modified version of the color set.
. . . .. .. . . . . . . . .......... .... ~~~~~ . . . . . . . . . . . . . . . . .. .. . . . . . . . specifies which limit segment in the table is to be modified. A maximum of three sets of segment values are displayed at one time, and the list can be scrolled up or down to show other segment entries. Use the entry block controls to move the pointer > to the required segment number. The indicated segment can then be edited or deleted. If the table of limits is new segments can be added using the . :~. :~ ,.
activates editing mode for the segment titled “SEQ3” (default title). activates editing mode for the segment titled “SEQ4” (default title). activates editing mode for the segment titled “SEQ5” (default title). activates editing mode for the segment titled “SEQG” (default title). accesses a filenaming menu which is used to automatically increment or decrement the name of a file that is generated by the network analyzer during a SEQUENCE.
sets up four-graticule, four-channel display as described in the ~~~~~~~~~~~~~~,, menu. g?jF : .: _.. . . . . . . . .i:. . .;. ;:. .; ,~:.:~.i .:..... n:. . . A. . I/. :.: . :.x:. up two-graticule, four-channel display as described in the ,sets .. ~~~~~~~~~~~~ menu. :.ik: ~<~<<.. 1: // :.:<;. : : i. <<.c. : .:.: .:. . . ~d>>>>..i .L. . :T.. sets up three-graticule, three-channel display as described in the g,; ~~~~~~~~~~, menu. defines the standard type as a short, for calibrating reflection measurements.
deilnes a sloping limit line segment that is linear with frequency or other stimulus value, and is continuous to the next stimulus value and limit. If a sloping line is the final segment it becomes a flat line terminated at the stop stimulus A sloping line segment is indicated as SL on the displayed table of limits. displays a Smith chart format. This is used in reflection measurements to provide a readout of the data in terms of impedance.
toggles between a full-screen single graticule display or two-, three-,oo.. fouggat@ule, multiple-channel display. Works with ~~@J@~.f$f#J to &e&e the number of channels gi6iiigd. ~~~~~~~ . selects whether spur avoidance is ON or OFF. Selecting spur avoidance OFF, along with selecting raw offsets OFF, saves substantial time at recalls and during frequency changes Spur avoidance is always coupled between channels. is used to deiine the start frequency of a frequency range.
deflnes the standard type as a short used for calibrating reflection measurements Shorts are assigned a terminal impedance of 0 ohms, but delay and loss offsets may still be added. is used to specify the subsweep in frequency steps instead of number of points. Changing the start frequency, stop frequency, span, or number of points may change the step size. Changing the step size may change the number of points and stop frequency in start/stop/step mode; or the frequency span in center/span/step mode.
is the mode used when peripheral devices are to be used and there is no external controller. In this mode, the analyzer can directly control peripherals (plotter, printer, disk drive, or power meter). System controller mode must be set in order for the analyzer to access peripherals from the front panel to plot, print, store on disk, or perform power meter functions, if there is no other controller on the bus. The system controller mode can be used without knowledge of HP-IB programming.
..-. . is used to specify the (arbitrary) impedance of the standard, in Ohllls. is used to set configurations before running the service tests is used to direct the RF power to port 1 or port 2. (For non-S parameter inputs only.) is used to support specialized test sets, such as a testset that measures duplexers. It allows you to set three bits (Dl, D2, and D3) to a value of 0 to 7, and outputs it as binary from the rear panel testset connector.
moves the title string data obtained with the ~:~~~~~~~~~~~~~L~,;: co-ad into a data may. .: :. ... , ., ., ., . v., ., , . , , . . .% ., . . . . . . ~~~~~~.~:~~~~.” strips off leading characters that are not numeric, reads the numeric value, and then discards everything else.
defies the measurement as &I, the complex forward transmission coefficient (magnitude and phase) of the test device. deilnes the measurement as S~Z, the complex reverse transmission coefficient (magnitude and phase) of the test device. (Option 010 only) leads to a series of menus that transform the measured data from the frequency domain to the time domain. (Option 010 only) switches between time domain transform on and off. leads to the transmission menu.
(Option 010 only) remembers a specified window pulse width (or step rise time) different from the standard window values. A window is activated only for viewing a time domain response, and does not affect a displayed frequency domain response. lets you control the analyzer with the computer over HP-IB as with the talker/listener mode, and also allows the analyzer to become a controller in order to plot, print, or directly access an external disk.
pauses the execution of subsequent sequence commands for x number of seconds. Terminate this command with a]. Entering a 0 in wait x causes the instrument to wait for prior sequence command activities to finish before allowing the next command to begin. The wait 0 command only affects the command immediately following it, and does not affect commands later in the sequence. selects the display warning annotation for color modification. brings up the color dell&ion menu.
(Option 010 only) is used to specify the parameters of the window in the transform menu. (Option 010 only) sets the pulse width to the widest value allowed. This minimizes the sidelobes and provides the greatest dynamic range. (Option 010 only) is used to set the window of a time domain measurement to the minimum value. Provides essentially no window. (Option 010 only) is used to set the window of a time domain measurement to the normal value.
Cross Reference of Key Function to Programming Command The following table lists the front-panel keys and softkeys alphabetically. The “Command” column identifies the command that is similar to the front-panel or softkey function. Softkeys that do not have corresponding programming commands are not included in this section. ‘Bible 9-1. Cross Reference of Key Function to Programming Command hY 0 0 : : : :. y: ;zy , :’ _/*,;., ., ., ., ., . /. . . . . . . . jp i,.A,.,w,;:Jg#$p .; :; ....., . . . . . . . .~. .
‘lhble 9-1.
‘able 9-1. Cross Reference of Key Function to Programm ingchmmand (continued) &Y (GJ C& FACT#R (XL FACTQA /. tXtX%EfR :A &T&Xi -FU%iR i%iEXIK B CXii #XT;. 2i4rm cA&#fT: :2,X@ :. . tg& :KXi: 2~,92mm $j& .#xTd “C&&j&-j . ..,.. . . . . . . . . . ii.. .” //, $X& KIT: . . ~,,&rird? . . . . . . . . . //i .j; . : / ,. .~,; .@X$XTt :/. .~~ . . . . . . hii% . . .I / .!%cEx:: ‘B?!?i1 i . ,. $&,&J?f$ .# ~j@jfi .: : .c%xi : . . . . . . ..:7: . ...KSz’: t .pxi t&L . . . . . . . . i :. . . .3ET . . . . . . !.
‘lhble 9-l. Cross Reference of Key Function to Programming Co nuuand (continued) Name WY 4% 4 pAT& Lfl$IT IZ#IJ m4HEH t%4 i?kTh [: ;J a& ,lffq .I.....3 fl%lAw PWR: DxPJlkm] 4zlIA# &!k D%JImm?LtiJ ‘, .i %xsfJP A,,s;od B 4ziAe .i i IkiE t?LEAE ‘B.XT -k?LEAE LXGT w Yv!!B!CE Icoa CifixAL niLAT .: rcol;il’Jli(, ~~~~~,:,~E~~~~, ~D~~~~#~~ ~D~~~E . : i[OktiJ . : : :.-. :. . _copyJ ~#~~~D~ ag,&g i 2. ..
‘able 9-1. Cross Reference of Key Function to Programming command (continued) -Y gvm% fiow cpmm .J?lZAXJ.LT CXtLUH .X&FAlJ&t l?Lm? Bi’UF DEFAULT,. ,. . i?RXllT f%KtVP E;DJET ~~f,f~~#&fj$ i T :. i:s i i ::: ,.
able 9-1.
‘able 9-l. Cross Reference of Key Function to Progranuuing commund (continued) &Y l?R?a OFFlPon #iv, Name FULL .i*PGRTFax& . i “PBGE ..... FMD ,ik&,lar ..IBQL?t4 STD 3?# mT$Zl (Label Class) Frequency Offset Off Frequency Frequency Blank Frequency: CW Frequency: SWEEP Full 2-Port FulI Page Forward Isolation Label Forward Match FW ‘3fATm (Specify Class) Specify Forward Match . . . ., Fw&mif ‘TmJ *,, ii I%lY T@JiJ$V (Label Class) Forward Match Thru Label Forward Transmission FUR& .
‘lhble 9-1.
Ihble 9-1.
‘Ihble 9-1.
able 9-1.
‘able 9-l.
‘lhble 9-1.
‘fhble 9-1.
‘lhble 9-l. Cross Reference of Key Function to Prog ramming command (continued) -Y l%lzwm~E & ..f%2L’N (Specify Class) REiMjRE . . . . . .-Df*SPLAIY . . . , , ,.,. ., , , , xf!Ejti..:.g&i . , jmgj$#CE ,. ,. &f JE&.?fj/i f&&q $qp , , , .,. . . Name Command Response and Isolation SPECRESI .&W HKkX (Label Class) Restore Display Resume Calibration Sequence Reverse Isolation Label Reverse Match ,W&f l%&@i$ (Specify Class) Specify Reverse Match & “&!?:’ .mRv, , ,. . . i T.. . :. .
‘Ihble 9-1.
‘lhble 9-1. Cross Reference of Key Function to Programming Commaud (continued) Q?Y .: .:. ~~~~~~~ _:,. ,. ,. ,..,,. ,_. , . _. , ., ., .: ~~~~~~~~~ >>;;>; ;i i i . ; . ;.~. ~; ~. ~ ; ~; ~ ~ ~ . . . . . . c. . . i. . . . . _. . .: . A. . ; ; .i . . . . . .
able 9-1. Cross Reference of Key Function to Programming commund (continued) &Y ~~~~~~~~~~~.: . >;:.:<.:.:. :.; .: .: .: x.: ,.: /,.“.~~~~~~,: :.: : :“” ... . . >:. : .
l’&ble 9-1.
lhble 9-1. Cross Reference of Key Function to Programming Co nunand (continued) Name =Y TRA~fE4: on,. OFF T;Rggcs /-PaME . ., . . .
‘lhble 9-1.
Softkey Locations The following table lists the softkey functions alphabetically, and the corresponding front-panel access key. This table is useful in determining which front-panel key leads to a specific softkey.
‘Ittble 9-2.
‘Ihble 9-2.
9-79 Key Definitions
Key Definitions 8-78
‘Ihble 9-2. Softkey Locations (continued) Softkey ~~~ ::.A...:..:: i._::.:::.:...... .~~~~~~~~~ 8.
able 9-2.
Ylhble 9-2. Softkey Locations (continued) Front-Panel Access Key @iii3 (SJ (G-J (ZiJ (GiJ Ical) m 9.
lhble 9-2.
‘I&ble 9-2.
‘lhble 9-2.
‘lhble 9-2. Softkey Locations (continued) Softkey 9.
%ble 9-2.
‘lhble 9-2.
l’hble 9-2.
‘lhble 9-2.
‘Ihble 9-2.
‘able 9-2.
able 9-2.
7hble 9-2.
‘Ihble 9-2.
10 Error Messages This chapter contains the following information to help you interpret any error messages that may be displayed on the analyzer LCD or transmitted by the instrument over HP-IB: n An alphabetical listing of all error messages, including: q An explanation of the message q Suggestions to help solve the problem H A numerical listing of all error messages Note Some messages described in this chapter are for information only and do not indicate an error condition.
Error Messages in Alphabetical Order 2-PORT CAL REQUIRED FOR AUX CHANNEL USE .,. _ Emor Number 217 l'his message is &splayed if you pressed ~~~~~~~~~without afu 2-port being /., . _; ,. ,. ,calibration . . ,. , ., . _ .:. . active. Perform (or recall) a full 2-port calibration and set ~~~~~~~~~~Q~~, c-s enable a . : . .< :.;,.;~:; .; ; ; . . . . . . . ~;~;. . . ; ....-. : : : :. ... .:.: : : ; >.,.,.: . . .<. <.;L.‘. to &@ h the Ical] menu. ‘I&n auxiliary channel.
ANALOG BUS DISABLED IN6KHZ IF BW Error Number When you press~~~~'~~~~~~~~,,, the analogbusis disabled and not 212 available for use in troubleshooting. For a description of the analog bus, refer to the HP 875333 Semvice Guide. ANOTHER SYSTEM CONTROLLER ON HP-IB BUS Error Number You must remove the active controller from the bus or the controller must relinquish the bus before the analyzer can assume the system controller mode.
ASCII: MISSING ‘VAR’ STATEMENT Error Number The CITblle you just downloaded over the HP-IB or via disk was not properly organized. The analyzer is unable to read the “VAR” statement. 196 AVERAGING INVALID ON NON-RATIO MEASURE Error Number You cannot use sweep-to-sweep averaging in single-input measurements. 13 Sweep-sweep averaging is valid only for ratioed measurements (A/R, B/R, A/B, and S-parameters).
BLOCKINPUTLENGTHEHHOR Error Number The length of the header received by the analyzer did not agree with the size of the internal array block. Refer to the HP 8753E Network Analyzer 35 Prop-ammiryr and Command Guide for instructions on using analyzer input commands. Reference CALIBRATION ABORTED Error Number You have changed the active channel during a calibration so the calibration in progress was terminated. Make sure the appropriate channel is active and 74 restart the calibration.
CAN'TSTORE/LOADSEQUENCE, INSUFFICIENTMEMORY Error Number Your sequence transfer to or from a disk could not be completed due to 127 insufficient memory. CAUTION: AUXCHANNELSMEASURES-PARAMETERS ONLY Error Number This message appears if you try to assign a non-S-parameter measurement to an auxiliary channel.
CORRECTION AND DOMAIN RESET Error Number When you change the frequency range, sweep type, or number of points, error-correction is switched off and the time domain transform is recalculated, 65 without error-correction. You can either correct the frequency range, sweep type, or number of points to match the calibration, or perform a new calibration. Then perform a new time domain transform. CORRECTION CONSTANTS NOT STORED Error Number A store operation to the EEPROM was not successful.
D2/DlINVALIDWITHSINGLECHANNEL Error Number You can only make a D2Dl measurement if both channels are on. 130 D2/DlINVALID: CHlCH2NWIPTSDIFFERENT Error Number You can only make a D2/Dl measurement if both channels have the same 152 number of points. DEADLOCK Error Number A fatal firmware error occurred before instrument preset completed. Call your 111 local Hewlett-Packard sales and service office. DEMODULATIONNOTVALID Error Number Demodulation was selected when the analyzer was not in CW time mode.
DISKIS WRITEPROTECTED Error Number The store operation cannot write to a write-protected disk. Slide the 48 write-protect tab over the write-protect opening in order to write data on the disk. DISKMEDIUMNOT INITIALIZED Error Number You must initialize the disk before it can be used. 40 DISKMESSAGELENGTHERROR Error Number The analyzer and the external disk drive aren’t communicating properly. Check the HP-IB connection and then try substituting another disk drive to isolate the 190 problem instrument.
DOS NAME LIMITED TO 8 CHARS+ 3 CHAR EXTENSION Error Number A DOS file name must meet the following criteria: 180 n minimum of 1 character format is filename . ext n q maximum of 8 characters in the fIlename q maximum of 3 characters in the extension field (optional) q DUPLICATING TO a dot separates the tiename from the extension field (the dot is not part of the name on the disk) THIS SEQUENCE NOT ALLOWED Error Number A sequence cannot be duplicated to itself.
FILE NOT COMPATIBLE WITH INSTRUMENT Information Message You cannot recall user graphics that had been saved on an earlier model of analyzer with a monochrome display. These files cannot be used with the HP 8753E. FILE NOT FOUND Error Number The requested file was not found on the current disk medium. 192 FILE NOT FOUND OR WRONG TYPE Error Number During a resave operation, either the file was not found or the type of file was not an instrument state flle.
FUNCTIONNOTAVAILABLE Error Number The function you requested over HP-IB is not avaiiable on the current 202 instrument. FUNCTIONNOTVALID Error Number The function you requested is incompatible with the current instrument state. 14 FUNCTIONNOTVALIDDURINGMOD SEQUENCE Error Number You cannot perform sequencing operations while a sequence is being modified. 131 FUNCTIONNOTVALIDFORINTERNALMEMORY Error Number The function you selected only works with disk Ivies. 201 FUNCTION ONLYVALIDDURINGMOD SEQUENCE .
IFBWKEYDISABLED, EDITLISTMODETBL Information When list IF bandwidth has been enabled and swept list mode is on, you will Message not be able to change the IF bandwidth using the . &E?#& key. To change theIF -. . . bandwidth, edit the swept list table. ILLEGALUNITORVOLUMENUMBER Error Number The disk unit or volume number set in the analyzer is not valid. Refer to the 46 disk drive operating manual.
INSUFFICIENTMEMORY, PWRMTRCAL OFF Error Number There is not enough memory space for the power meter calibration array. 154 Increase the available memory by clearing one or more save/recall registers, or by reducing the number of points. INVALIDKEY Error Number You pressed an undefined softkey. 2 LIMITTABLEEMPTY Error Number Limit lines cannot be turned on unless a limit table has been created. Refer to “‘IWing a Device with Limit Lines” in Chapter 2 for information on how to 205 create a limit table.
MEMORYFORCURRENTSEQUENCEISFULL Error Number All the memory in the sequence you are modifying is filled with instrument 132 commands. MORESLIDESNEEDED Error Number When you use a sliding load (in a user-dellned calibration kit), you must set at 71 least three slide positions to complete the calibration. NOCALIBRATIONCURRENTLYINPROGRESS Error Number The 69 ~~~~~~~~~~~ .I .,,... ::.~.~~~:~:~~.~:~~....~,...,.,;;;..~......~.~~:~:~~~~:~:~~~~........
NO LIMITLINESDISPLAYED Error Number You can turn limit lines on but they cannot be displayed on polar or Smith 144 chart display formats NO MARKERDELTA -SPANNOTSET Error Number You must turn the delta at least two markers displayed, :~ :.~:. . . . .:. marker ;.:. :. :. :. :.<. . :~.: .: ., :.;..mode .. I; .: ., .: .~p,. . . on, withfunction. in order to use the :~;~~~~,~~~::: 15 :. : .: i.:.: . i. ~. . . ~. . . ~. . . .
NOTENOUGHSPACE ONDISKFORSTORE Error Number The store operation will overflow the available disk space. Insert a new disk or 44 purge iiles to create free disk space. NOVALIDMEMORYTRACE Error Number If you are going to display or otherwise use a memory trace, you must first store a data trace to memory. 54 NOVALID STATEINREGISTER Error Number You have requested the analyzer, over HP-IB (or by sequencing), to load an instrument state from an empty internal register.
OVERLOAD ON INPUTB,POWERREDUCED Error Number See error number 57. 59 OVERLOAD ON INPUTR,POWERREDUCED Error Number You have exceeded approximately + 14 dBm at one of the test ports. The RF output power is automatically reduced to -85 dBm. The annotation PJ,l appears 57 in the left margin of the display to indicate that the power trip function has been~~~~~~~~~~ activated. When this softkey occurs, to reset the power a lower level, then toggle the swit* on *etopower again.
PLOT ABORTED Error Number When you press the LLocal) key, the analyzer aborts the plot in progress. 27 PLOTTER:noton,notconnect, wrongaddrs Error Number The plotter does not respond to control. Verify power to the plotter, and check 26 the HP-IB connection between the analyzer and the plotter. Ensure that the plotter address recognized by the analyzer matches the HP-IB address set on the plotter itself. PLOTTERNOTREADY-PINCHWHEELSUP Error Number The plotter pinch wheels clamp the paper in place.
POWERSUPPLYSHUTDOWN! Error Number One or more supplies on the A8 post-regulator assembly have been shut down 22 due to an over-current, over-voltage, or under-voltage condition. POWERUNLEVELED Error Number There is either a hardware failure in the source or you have attempted to set 179 the power level too high. The analyzer allows the output power to be set higher or lower than the specified available power range. However, these output powers may be unleveled or unavailable.
PRINTER:notconnected Error Number There is no printer connected to the parallel port. 173 PRINTER: not handshaking Error Number The printer at the parallel port is not responding. 177 PRINTER: not online Error Number The printer at the parallel port is not set on line. 172 PRINTER: noton, notconnected,wrong addrs Error Number The printer does not respond to control. Verify power to the printer, and check 24 the HP-IB connection between the analyzer and the printer.
PROBEPOWERSHUT DOWN! Error Number One or both of the probe power supplies have been shut down due to an over-current, over-voltage, or under-voltage condition. 23 PROCESSINGDISPLAYLIST Information The display information is being processed for a screen print to a copy device and stored in the copy spool buffer. During this time, the analyzer’s resources Message are dedicated to this task (which takes less than a few seconds).
SEGMENT#nPOUEROUTSIDERANGELIMIT Information The selected power range does not support the power level of one or more segments in the swept list table. This message appears when swept list mode is Message not on and reports the llrst segment that is out of range. Change the segment power or change the power range. SEGMENT#nSTARTFREQ OVERLAPSPREVIOUSSEGMENT Information A segment entered in the swept list table caused one or more frequency segments to overlap.
SLIDES ABORTED (MEMORYREALLOCATION) Error Number You cannot perform sliding load measurements due to insufficient memory. 73 Increase the available memory by clearing one or more save/recall registers and pressing preset), or by storing hles to a disk. SOURCE POWER Information Message DISABLED, EDIT LIST MODE TBL When list power has been enabled and swept ). . . . . ... . list ; ., mode is on, you will not be able to change the power level using the ~#@j&& key.
SWEEPTIMEINCREASED Error Number You have made instrument changes that cause the analyzer sweep time to be 11 automatically increased. Some parameter changes that cause an increase in sweep time are narrower IF bandwidth, an increase in the number of points, and a change in sweep type. SWEEPTIMETOO FAST Error Number The fractional-N and digital IF circuits have lost synchronization. Refer to the 12 HP 8753E N&work AnuZgzzr Semrice Guide for troubleshooting information.
TOO MANYNESTED SEQUENCES. SEQ ABORTED Error Number You can only nest sequences to a maximum level of six. The sequence will abort if you nest more than six. 164 TOO MANYSEGMENTS ORPOINTS Error Number You can have a maximum of 30 segments or 1632 points in frequency list mode. 50 In power meter calibrations, you can have a maximum of 12 segments for power sensor cal factors and power loss functions.
WAITINGFORHP-IB CONTROL Information Message You have instructed the analyzer to use pass control (USEPASC). When you send the analyzer an instruction that requires active controller mode, the analyzer requests control of the bus and simultaneously displays this message. If the message remains, the system controller is not relinquishing the bus. WRITEATTEMPTEDWITHOUTSELECTING INPUTTYPE Error Number You have sent the data header “#A” to the analyzer with no preceding input command (such as INPUDATA).
Error Messages in Numerical Order Refer to the alphabetical listing for explanations and suggestions for solving the problems. Some error numbers have been omitted due to obsoleted error messages.
Error Number I I I Error 27 PLUT ABORTED 28 PLOTTER NOT READY-PINCH WHEELS UP 30 REQUESTED DATA NOT CURRENTLY AVAILABLE 31 ADDRESSED TO TALK WITH NOTHING TO SAY 32 WRITE ATTEMPTED WITHOUT SELECTING INPUT TYPE 33 SYNTAX ERROR 34 BLOCK INPUT ERROR 35 1 BLOCK INPUT LENGTH ERROR 36 SYST CTRL OR PASS CTRL IN LOCAL MENU 37 ANOTHER SYSTEM CONTROLLER ON HP-IB BUS 38 I DISK: not on, not connected.
IN-zErl 1 1 I I I I I I Error 57 OVERLOAD ON INPUT R, POWER REDUCED 58 OVERLOAD ON INPUT A, POWER REDUCED 59 OVERLOAD ON INPUT B, POWER REDUCED 61 HP 8753 SOURCE PARAMETERS CHANGED 63 CALIBRATION REQUIRED 64 1 CURRENT PARAMETER NOT IN CAL SET 65 CORRECTION AND DOMAIN RESET 66 CORRECTION TURNED OFF 67 DOMAIN RESET 68 ADDITIONAL STANDARDS NEEDED 69 NO CALIBRATION CURRENTLY IN PROGRESS 70 1 NO SPACE FOR NEW CAL.
Error I 125 1 DUPLICATING TO THIS SEQUENCE NOT ALLOWED I I 126 1 NO MEMORY AVAILABLE FOR SEQUENCING I 127 CAN’T STORE/LOAD SEQUENCE, INSUFFICIENT MEMORY I 130 1 D2/Dl INVALID WITH SINGLE CHANNEL 1 131 ( FUNCTION NOT VALID DURING MOD SEQUENCE I I I 132 I MEMORY FOR CURRENT SEQUENCE IS FULL I 133 THIS LIST FREQ INVALID IN HARM/3 GHZ RNG 140 FREQ OFFSET ONLY VALID IN NETWORK ANALYZER MODE IB COPY IN PROG ErrorMemyer 1 0 3 1
1 182 1 LIST MODE OFF: INVALID WITH LO FREQ 1 183 1 BATTERY FAILED.
Error Number Error 197 FILE NOT FOUND OR WRONG TYPE 198 NOT ALLOWED DURING POWER METER CAL 199 CANNOT MODIFY FACTORY PRESET ) 200 ( ALL REGISTERS HAVE BEEN USED I 201 I FUNCTION NOT VALID FOR INTERNAL MEMORY ----I 1 202 1 FUNCTION NOT AVAILABLE 1 203 1 CANNOT READ/WRITE HFS FILE SYSTEM 1 204 1 FREQS CANNOT BE CHANGED, TOO MANY POINTS I I I 1 205 ILIMIT TABLE EMPTY ( 206 1 ARGUMENT OUT OF RANGE I 207 1 POWER OUT MAY BE UNLEVELED 1 208 1 EXT R CHAN MUST BE ON FOR FREQUENCY OFFSET
11 Compatible Peripherals This chapter contains the following information: n Measurement accessories available n System accessories available n Connecting and conflgming peripherals w HP-IB programming overview Where to Look for More Information Additional information about many of the topics discussed in this chapter is located in the following areas: l Chapter 2, “Making Measurements,” contains step-by-step procedures for making measurements or using particular functions.
Verification Kit Accurate operation of the analyzer system can be verified by measuring known devices other than the standards used in calibration, and comparing the results with recorded data. HP 86029B 7-mm Verifkation Kit This kit contains traceable precision 7-mm devices used to confIrm the system’s error-corrected measurement uncertainty performance. Also included is verification data on a 3.5 inch disk, together with a hard-copy listing.
Transistor Test Fixtures The following Hewlett-Packard transistor test fixtures are compatible with the HP 8753E. Additional test fixtures for transistors and other devices are avaiIable from Inter-Continental Microwave. lb order their catalog, request HP literature number 5091-4254E. Or contact Inter-Continental Microwave as follows: 1515 Wyatt Drive Santa Clara, CA 95054-1524 (tel) 408 727-1596 (fax) 408 727-0105 HP 11600B and 11602B lkansistor Fixtures.
System Accessories Available System Cabinet The HP 85043D system cabinet is designed to rack mount the analyzer in a system configuration. The 132 cm (52 in) system cabinet includes a bookcase, a drawer, and a convenient work surface. System Testmobile The HP 1181A system testmobile is designed to provide mobility for instruments, test systems, and work stations.
n HP C1676A, DeskJet 1200C (can also be used to plot) n HP C354OA, DeskJet 1600C (can also be used to plot) n AR LaserJets (can also be used to plot) n HP 2227B QuietJet n HP 2225A ThinkJet n HP 3630A Pain&Jet Color Graphics Printer Epson printers which are compatible with the Epson ESC/P2 printer control language, such as the LQ570, are also supported by the analyzer. Older Epson printers, however, such as the FX-80, will not work with the analyzer.
Keyboards A keyboard can be connected to the analyzer and used for control or data input, such as titling files. The HP C1405A Option ADA keyboard is suitable for this purpose. The analyzer is also designed to accept most PC-AT-compatible keyboards with a standard mini-DIN connector. ‘Ihble 11-l provides the same information that can be found on the HP 8753E keyboard template (HP part number 08753-80131). ‘Ihble 1 l-l.
Controller An external controller is not required for measurement calibration or time domain capability. However, some performance test procedures are semi-automated and require the use of an external controller. (The system verification procedure does not require an external controller.
Connecting Peripherals Connecting the Peripheral Device Connect the peripheral to the corresponding interface port. \ HP- I B PARALLEL PORT KEYBOARD RS-232 SERIAL PORT pg64e Figure 11-l. Peripheral Connections to the Analyzer Note 11-8 The keyboard can be connected to the analyzer while the power is on or off.
Cotiguring the Analyzer for the Peripheral All copy configuration settings are stored in non-volatile memory. Therefore, they are not affected if you press @GZj or switch off the analyzer power. If the Peripheral is a Printer _ . , _ _ ., . . . . . _.,. ., ., _., . . . _ _ ,. _ .,. .... 1. Press LLocal) ~~~~~~~~~~~ until the come& printer choice . .,. . . .~. Li . . . L;:. .~. ~. .: : . . ... A. . . . . . .: : .: . . . . . ;~$JJQ@ ./ . . . .A. . . : . . . . . . . . _. .,. F I . . . . . .;E@& s . .: : .
. . _ .,.,. .,. .:. :. . Choose SE&&& if your printer has a serial (RS-232) interface, and then configure the print function as follows: a. Press ~~~~~~~~:~~~~ and enter the phter’s baud rate, followed by (-&). . i; . .i.i./ ; . _:. . .;~. . . /i i \i. . i . . . . b. lb select ,,._;; //_._;,. the ..,...__. ;,..___.. ,. ,. ./_ ., . )transmission control method that is compatible with your printer, press ,~~~~~ (transmit control - handshaking protocol) until the correct method appears: ,. ,. ,. ./.:. .; . .
Choose #t&&g& .;,,;.i if your printer has a partiel (centronics) interface, and then consgure . . . . ..A. L. . . . . . the print function as follows: q Press ILocal md then sel& the parallel poti interface fun&ion by pressing ~~~ i :. /:: s. s. . . . . . ii until the correct function appears: ,:;,. . . . . .: // ., ., . ; . . . . If you choose j~~~~~~~~~,~ the parallel pod is dedicated for normal copy /: :A ;. ,.r< < < < ii . ;: :. : : . , . /; ; . . . . . . . . . /. . . . . .i ;.
2. Configure the analyzer for one of the following plotter interfaces: . Choose :,~~~.~~~~~~~~ if your plotter has ~ HP-IB hterface, and then condgure the , /. / .I. . . . i. .i . i. _.. . . .; . . . . /i. ./i . . . ..A plot function as follows: a. Enter the HP-IB address of the printer (default is 05), followed by (XJ). b. Press LLocal) and ~~~~~~~~~~~~ if there is no external controller connected to .: 1.: :;: :. . . . ...z.z. . i >z;:z. . i .w. . .A. . . w; ; ;. i.i the HP-IB bus. ; ,” . . “‘.“’ .~ _..,.
If the Peripheral Is a Power Meter ..i .; 2. press ~~~~~~~~~~~.‘~~~~~ until the come& s&&ion appears: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .’ HP 436A HP 437B or 438A , “‘8”‘. ““‘(” :p 3. fiess ~~~~‘~.~~~.~:~~~~~~~~ i :. :. .: : : : : . _. . i. . . /,.: . :ad configure the power meter a folJows: q q a. Enter the HP-IB‘,~.,~ ,~ ,address of _the _ _ _ _ _ power / _ _ _ meter, followed by @. ~ ., b.
Configuring the Analyzer to Produce a Time Stamp You can set a clock, and then activate it, if you want the time and date to appear on your hardcopies. ... 1. Press ISystem) /::~~;:~:~~~~~~.. 2. press $m>$&& ad enter the au-rent .:. . :. .:s<:; ;; year, fdlowed by Ixl). 3. mess ‘g* ..;:::: ..:sj .I ':- .<<: ,. :,.;. ,,; .;.;,.,,.;,,.,.,;;; .M&#@E~ ..As.; ;: . . A. i.2 :w: : .i and enter the current month of the year, followed (xl). , ,;.,.. (., ., ., . . ,. ., ._ 4.
HP-IB Programming Overview The analyzer is factory-equipped with a remote programming digital interface using the Hewlett-Packard Interface Bus (HP-IB). HP-IB is Hewlett-Packard’s hardware, software, documentation, and support for IEEE 488.1 and IEC-625, worldwide standards for interfacing instruments. The HP-IB lets you control the analyzer with an external computer that sends commands or instructions to and receives data from the analyzer.
HP-IB Operation The Hewlett-Packard Interface Bus (HP-IB) is Hewlett-Packard’s hardware, software, documentation, and support for IEEE 488.2 and IEC-625 worldwide standards for interfacing instruments.
HP-IB Bus Structure Able to talk DEVICE D Able to talk only I D A T A 8US ( 8 s i g n a l l i n e s ) , HANDSHAKE LINES pg635d Figure 11-2. HP-IB Bus Structure Data Bus The data bus consists of 8 bidirectional lines that are used to transfer data from one device to another. Programming commands and data transmitted on these lines are typically encoded in ASCII, although binary encoding is often used to speed up the transfer of large arrays.
ATN (Attention) The active controller uses this line to define whether the information on the data bus is command-oriented or data-oriented. When this line is true (low), the bus is in the command mode, and the data lines carry bus commands. When this line is false (high), the bus is in the data mode, and the data lines carry device-dependent instructions or data. SRQ (Service Request) This line is set true (low) when a device requests service and the active controller services the requesting device.
HP-II3 Operational Capabilities On the network analyzer’s rear panel, next to the HP-IB connector, there is a list of HP-IB device subsets as detlned by the IEEE 488.2 standard. The analyzer has the following capabilities: SHl Full-source handshake. AH1 Full-acceptor handshake. T6 Basic talker, answers serial poll, unaddresses if MIA is issued. No talk-only mode. L4 Basic listener, unaddresses if MTA is issued. No listen-only mode. SRl Complete service request (SRQ) capabilities.
HP-II3 Status Indicators When the analyzer is connected to other instruments over the HP-IB, the HP-IB status indicators illuminate to display the current status of the analyzer. The HP-IB status indicators are located in the instrument-state function block on the front panel of the network analyzer. R = Remote Operation L = Listen mode T = ‘IU mode S = Service request (SRQ) asserted by the analyzer Bus Device Modes The analyzer uses a single-bus architecture.
System-Controller Mode This mode allows the analyzer to control peripherals directly in a stand-alone environment (without an external controller). This mode can only be selected manually from the analyzer’s front panel. It can only be used if no active computer or instrument controller is connected to the system via HP-IB.
Note There is also an address for the system controller. This address refers to the controller when the network analyzer is being used in pass-control mode. This is the address that control is passed back to when the analyzer-controlled operation is complete.
‘Bible 11-2. Code Naming Convention Convention One Word Two Words Key Title Power start Electrical Delay For HP-IB Code Use First Four Letters Example POWE First Three Letters of First Word, First Letter ELED of Second Word Search Right Two Words in a Group Marker +Center Gate +Span Four Letters of Both Three Words Cal Kit N 60 0 First Three Lett.
Units The analyzer can input and output data in basic units such as Hz, dB, seconds, ohms, etc. S v Seconds Volts HZ DB Hertz dBordBm Input data is assumed to be in basic units unless one of the following units expressions qualifies the data input (upper and lower case are equivalent): MS US NS PS Milliseconds Microseconds Nanoseconds Picoseconds kHz MHz GHz FS Kilohertz Megahertz Gigahertz Femtoseconds HP-II3 Debug Mode An HP-IB diagnostic feature (debug mode) is available in the HP-IB menu.
12 Preset State and Memory Allocation The analyzer is capable of saving complete instrument states for later retrieval. It can store these instrument states into the internal memory, to the internal disk, or to an external disk.
Non-Volatile Memory This is CMOS read/write memory that is protected by a battery to provide storage of data when line power to the instrument is turned off. With this battery protection, data can be retained in memory for ~250 days at 70’ C and for ~~10 years at 25” C (characteristically). Non-volatile memory consists of a block of user-allocated memory and a block of fixed memory.
‘Iable 12-1 shows the memory requirements of calibration arrays and memory trace arrays to help you approximate memory requirements. For example, add the following memory requirements: n n n a full 2-port calibration with 801 points (58 k) the memory trace array (4.9 k) the instrument state (approximately 6 k) The total memory requirement is 68.9 kbytes. There is sufficient memory to store 29 calibrations of this type.
Storing Data to Disk You can use the internal disk drive or connect an external disk drive for storage of instrument states, calibration data, measurement data, and plot files. (Refer to Chapter 4, “Printing, Plotting, and Saving Measurement Results”, for more information on saving measurement data and plot llles.) The analyzer displays one file name per stored instrument state when you list the disk directory. In reality, several llles are actually stored to the disk when you store the instrument state.
‘&ble 12-2.
Conserving Memory If you are concerned about conserving memory, either internal memory or external disk space, some of the most memory-intensive operations include: two-port error correction w interpolated error correction n 1601 measurement points n using time domain w saving data arrays and graphics with the instrument state n Using Saved Calibration Sets When you are saving to internal memory (CMOS, non-volatile memory), calibration sets are linked to the instrument state and measurement parameter for w
Preset State When the lpresetJ key is pressed, the analyzer reverts to a known state called the factory preset state. This state is defined in ‘Iable 12-3. There are subtle differences between the preset state and the power-up state. These differences are documented in Table 12-4. If power to non-volatile memory is lost, the analyzer will have certain parameters set to default settings ‘Ihble 12-5 shows the affected parameters.
‘Ihble 12-3.
‘lhble 12-3. Preset Conditions (2 of 5) Preset Conditions Preset V.
able 12-3.
‘Ihble 12-3. Preset Conditions (4 of 5) Preset Conditions Preset Value Prht Preset C4mditions I Preset l&due CHZXh4 Data Blue Printer Mode Last Active State CHWCh4 Mem Red Auto-Feed on Graticule cyan Warning Black Printer Colors CHlKh3 Data Magenta n?xt Black CHlICh3 Mem Green Reference Line Black ‘lhble 12-3. Preset Conditions (5 of 5) Format ‘lhble SWR 1.00 0.0 1.0 able 12-4. Power-on Conditions (versus Preset) Taker/listener.
‘Ihble 12-5. Results of Power Loss to Non-Volatile Memory HP-IB ADDRESSES are set to the following defaults: HP 8753E................................................................................ 16 USER DISPLAY .......................................................................... 17 PLOTTER. ................................................................................ .5 PRINTER .................................................................................. I POWER METER .....................
The CITIfile Data Format and Keyword Reference This appendix contains the following information: n n The CITIllle Data Format q Description and Overview q Definition Of CITIflle Terms q CITIfile Examples The CITIllle Keyword Reference. The CITIfile Data Format Description and Overview CITIfile is a standardized data format, used for exchanging data between different computers and instruments. CITIflle is an abbreviation for “Common Instrumentation Transfer and Interchange file”.
Defhition of CITIfl.le Terms This section will dehne the following terms: n package n header n data array 8 keyword A CZTIfile Package A typical package is divided into two parts: The hrst part, the header, is made up of keywords and setup information. The second part, the data, usua.Ry consists of one or more arrays of data. Example 1 shows the basic structure of a CITIlile package: Example 1, A ClTIiile package The “header” part CITIFILEA.
CITIfile Keyword Keywords are always the first word on a new line. They are always one continuous word without embedded spaces. A listing of all the keywords used in the latest A.01.01 version of CITIlile is shown in “The CITIflle Keyword Reference. n When reading a CITIflle, unrecognized keywords should be ignored. This allows new keywords to be added, without affecting an older program or instrument that might not use the new keywords.
CITIfile Examples Example 2, An 8510 Display Memory File Example 2 shows a simple file that contains no frequency information. Some instruments do not keep frequency information for display memory data, so this information is not included in the CITIfile package. Note that instrument-specific information (#NA = Network Analyzer information) is also stored in this fle. This convention allows the designer to define keywords that are particular to his or her particular implementation. Example CITIFILE A.O1.
Example 4,861O S-Term Frequency List Cal Set F’ile Example 4 shows how CITIfIle may be used to store instrument setup information. In the case of an 8510 Cal Set, a limited instrument state is needed in order to return the instrument to the same state that it was in when the calibration was done. Three arrays of error correction data are dellned by using three DATA statements. Some instruments require these arrays to be in the proper order, from El to E3.
Example (continued) BEGIN l.l2134E-3,1.73103E-3 4.23145E-3,-5.36775E-3 -0.56815E-3,5.32650E-3 -1.85942E-3,-4.07981E-3 END BEGIN 2.03895E-2,-0.82674E-2 -4.21371E-2,-0.24871E-2 0.21038E-2,-3.06778&2 1.20315E-2,5.99861E-2 END BEGIN 4.45404E-1,4.31518E-1 8.34777E-l,-1.33056E-1 -7.09137E-1,5.58410E-1 4.84252E-l,-8.07098E-1 END When an instrument’s frequency list mode is used, as it was in Example 4, a list of frequencies is stored in the file after the VAR-LIST-BEGIN statement.
The CITINe Keyword Reference Keyword Explanation and Examples CITIFILE CITIFILE A. 01.01 identifies the Ele as a CITIflle, and indicates the revision level of the llle. The CITIflle keyword and revision code must precede any other keywords. The CITIlile keyword at the beginning of the package assures the device reading the file that the data that follows is in the CITIllle format. The revision number allows for future extensions of the CITIflle standard.
VAR_LIST_BEGIN VAR_LIST_BEGIN indicates that a list of the values for the independent variable (declared in the VAR statement) follow. Only the MAG format is supported in revision A.O1.OO. VARIZ3’I’-END VAR_LIST_ENDdefines the end of a list of values for the independent variable. DATA DATA S Cl, 1] RI defines the name of an array of data that will be read later in the current CITIllle package, and the format that the data will be in.
Determining System Measurement Uncertainties In any measurement, certain measurement errors associated with the system add uncertainty to the measured results This uncertainty deilnes how accurately a device under test (DUT) can be measured. Network analysis measurement errors can be separated into two types: raw and residual. The raw error terms are the errors associated with the uncorrected system that are called systematic (repeatable), random (non-repeatable), and drift errors.
Etc, Erc = effective crosstalk Efl, Erl = effective load match n Eft, Ert = effective transmission tracking w Cnn, Ctm = cable stability (deg.
Sources of Additional Measurement Errors Two additional categories of measurement errors are connection techniques and contact surfaces. The connection techniques category includes torque limits, flush setting of sliding load center conductors, and handling procedures for beadless airlines. The contact surfaces category includes cleaning procedures, scratches, worn plating, and rough seating. These types of errors are not accounted for in the uncertainty analysis.
where w Efnt = effective noise on trace w Efnf = effective noise floor n Crtl = connector repeatability (transmission) n Crrl = connector repeatability (reflection) n Ctml = cable 1 transmission magnitude stability n Crml = cable 1 reflection magnitude stability w Cm12 = cable 2 reflection magnitude stability n Dmsl = drift magnitude/°C source to port 1 n Efs = effective source match error n Efr = effective reflection tracking error n Efl = effective load match error n Efd = effective directivity error n Cr
Transmission Uncertainty Equations Transmission Magnitude Uncertainty (Etm) An analysis of the error model, located at the end of this appendix, yields an equation for the transmission magnitude uncertainty. The equation contains all of the first order terms and some of the significant second order terms. The terms under the radical are random in character and are combined on an RSS basis. The terms in the systematic error group are combined on a worst case basis.
Transmission Phase Uncertainty (Etp) Transmission phase uncertainty is calculated from a comparison of the magnitude uncertainty with the test signal magnitude. The worst case phase angle is computed. This result is combined with the error terms related to phase dynamic accuracy, cable phase stability, and thermal drift of the total system.
Determining Expected System Performance Use the uncertainty equations, dynamic accuracy calculations in this appendix, and tables of system performance values from the “Specifications and Measurement Uncertainties” chapter in the HP 87533 User’s tiide to calculate the expected system performance. The following pages explain how to determine the residual errors of a particular system and combine them to obtain total error-corrected residual uncertainty values, using worksheets provided.
Characteristic Vdues ‘lhble 8.5mm T y p e - N 2.
Measurement Uncertainty Worksheet (1 of 3) Error !lbm Symbol dBVdne Linear V..
Index 1 10 MHz precision reference output, l-l 1 10 MHz reference adjust, l-11 3 3.
single bus concept, 11-20 analyzer description, l-2 analyzer display measurement setup diagram, 3-31 annotations of display, 1-8 anti-static mat, 7-20 application and operation concepts, 6-l applications amplifier testing, 6-153-156 mixer testing, 6-157-168 on-wafer measurements, 2-91 arrays flexibiity, 4-36 format, 6-7 format , 4-36 raw data , 4-36 ASCII data formats, 4-39 assign classes, 5-30, 5-32 atmospheric conditions, 7-20 ATN (attention) control line, 11-18 attention (ATN) control line, 11-18 attenua
specifying kits, 6-82 standard devices, 6-73 standards, 5-6 temperature, 12-6 TRL*/LRM*, 6-92 TRL*/LRM’ two-port, 6-81 using on multiple analyzers, 12-6 validity of, 6-78 verify performance of, 6-91 calibration arrays memory requirements, 12-3 saving, 4-37 calibration constants entering, 5-27 ..
application and operation, 6-l calibration, 6-57-109 connections, 6- 169 data processing, 6-4-7 entry keys, 6-9-11 error-correction, 6-57-109 frequency domain, 6-125-145 instrument state, 6-110-116 markers, 6-54-56 measurement calibration, 6-57-109 response function, 6-28-53 sequencing, 6-146-152 stimulus function, 6-12-27 system overview, 6-2-3 time domain, 6-125-145 conditions for environment, 7-20 conditions for error-correction, 5-4 configuration external disk drive, 11-13 plotter, 4-8, 11-10 power mete
types, 5-4 correction procedures use of, 5-5 Cor status notation, l-8 couple and uncouple display markers, 2-24 coupled channels, 2-7, 2-8 markers, 6-9 coupling channel power, 6-16 port power, 6-16 power, 6-16 primary channel stimulus, 6-21 creating a sequence, 2-69 crosstalk, 6-60 reducing, 5-57 uncorrected specifications, 7-3 CA status notation, l-8 CW time sweep, 6-27 CW time-to-frequency domain, 6-142 D damage level, 7-11 data bus, 11-17 divided by memory, 2-8 loss of power calibration, 5-34 processing,
disk files using with other models, 12-6 dispersion effects, 6-101 display blanking, 6-49 format, 6-32 four-parameter, 2-10 information, l-7 location, l-4 markers, 2-17 markers activation, 2-18 memory, 6-7 memory trace, 2-7 of analyzer, l-7 setting intensity, 6-48 status notations, l-8 titling, 2-9 trace math, 2-8 displayed measurement title, 4-29 display format group delay, 6-33 imaginary, 6-37 linear magnitude, 6-36 log magnitude, 6-32 phase, 6-33 polar, 6-35 real, 6-37 smith chart, 6-34 SWR, 6-36 displ
response for transmission measurements, 5-11 TRL”, 5-24 TRL*/LRM* two-port calibration, 6-81 TRM* , 5-24 types, 5-4 error messages, 10-2 alphabetically listed, 10-2-27 numerically listed, 10-28-33 error model device measurement, 6-66 one-port, 6-61 two-port, 6-66 errors removing, 5-4 ESD precautions, 7-20 ..
area of display, l-10 arrays, 6-7 menu, 6-32 giizj ;zkzz polar, 2-24 Smith, 2-25 @ZZJ menu map, 8-7 formatting a disk, 4-43 ~~~~~:~ : : .i>. . . i . . .../.... , ,. .,. . .
harmonics measurement, 2-81 harmonics (option 002) specifications, 7-l 1 hide softkey menu, 6-11 high dynamic range swept IF conversion loss measurement connections, 3-15 high dynamic range swept RF/IF conversion loss, 3-12 high-stability frequency reference( 10 MHz) (Option lD5), 7-17 high stability frequency reference option, 1-13 Hld status notation, l-9 hold mode, test set switch, 5-54 how to abort a print or plot process, 4-30 activate a llxed marker, 2-21 activate chop sweep mode, 5-54 activate displa
measure swept harmonics, 2-81 measure swept RF/IF mixers, 3-7 measure transmission response in time domain, 2-83 modify a sequence command, 2-72 modify calibration standards, 5-27 modify TRL calibration standards, 5-29 modify TRM calibration standards, 5-31 offset limit lines, 2-54 output a single page of values, 4-30 output multiple plots to a single page using a printer, 4-25 output plot files, 4-20 output plot files from a PC to a plotter, 4-22 output plot files from a PC to a printer, 4-23 output single
HPGL initialization commands, 4-23 outputting plot files to compatible printer , 4-23 test file commands, 4-24 HPGL/2 compatible printer, configuring to plot, 4-8 HP-IB, 11-15 address capability, 11-18 addresses, 6-112, 11-21 bus structure, 11-16, 11-17 cables, 11-5 connector, l-11 data rate, 11-18 debug mode, 11-24 device types, 11-16 menu, 6-111 message transfer scheme, 11-18 multiple-controller capability, 1 1 - 18 operation, 11-16 operational capabilities, 11-19 pass control mode, 6-112 requirements, 11
l&J, 6-51 It), 6-11 @J], 6-78 0, 6-11 @jiiJ, 6-42 entry, 6-9-l 1 WK l instAent state, 6-110-116 &iJ, 6-111 B ;2$ 6-30 Menu , - ,.
softkey labels, l-10 softkeys, 14 stimulus function block, l-4 test sequence connector, 1-12 test set interconnect, 1-12 logarithmic frequency sweep, 6-23 log magnitude format, 6-32 LOG MKR, 2-25, 2-26 loop counter sequence, 2-77 loss of power meter calibration data, 5-34 Lo to RF isolation for mixers, 3-33 low pass mode reflection measurements, 6-131 setting frequency range, 6-130 transmission measurements, 6-133 M magnitude specifications, 7-13 magnitude and insertion phase response measurement, 2-37 maki
example, 2-3 examples, 2-1 output results, 2-5 parameters set with markers, 2-26 sequence, 2-3 type:setting, 2-4 measurement accuracy calibration standards, 5-6 changing parameters, 5-5 compensating for directional coupler response, 5-36 connector repeatability, 5-2 error-correction, 5-4 frequency drift, 5-3 increasing, 5-2 interconnecting cables, 5-2 performance verification, 5-3 reference plane and port extensions, 5-3 temperature drift, 5-2 measurement averaging changing, 5-56 measurement calibration con
sweep types, 6-22 system, 6- 114 trigger, 6-19 (Menu) key, 6-13 menu map, 8-l IAVP). 8-2 gx’ 8-3 ICON, 8-5 @g$), 8-6 @iii), 8 - 7 68-7 3, 8-10 2.
the caI kit thru definition, 5-47 modifying a sequence, 2-71 a sequence command, 2-72 calibration constants, 5-27 calibration kits, 6-83 calibration standards, 5-27 TRL calibration standards, 5-29 TRM calibration standards, 5-31 monitor, 7-18 connector, 1-12 monitors, 1 l-7 multiple channel display, 6-9 multiple-controller capability, 11-18 multiple measurements plotted, 4-26 printed, 4-7 multiple sequence cascading, 2-76 N naming conventions, 1 l-22 network analyzer mode, 6-117 new features ~~~~ 4-29to the
P Pl and P2 on the plotter, 4-15 page halves, 4-7 page of values printed or plotted, 4-30 page quadrants, 4-28 panel rear, l-11 parallel interface, l-l 1 parallel poII non response (PPO), 11-19 parallel port, 7-19 copy mode, 6-113 GPIO mode, 6-l 13, 6-147 plotting, 6-l 13 printing, 6-113 ‘ITL input, 6-148 ‘ITL output, 6-148 use of, 6-113 parameters defaults for plotting, 4-16 defaults for printing, 4-6 0perating:printing or plotting, 4-30 parameters set with markers, 2-26 center frequency, 2-28 CW frequency
pola format markers, 2-24 polar chart markers LIN MKR, 2-25 LOG MKR, 2-25 ReAm MKR, 2-25 polar format, 6-35 polar or Smith format markers, 2-22 port 1 and port2, l-6 port coupling, 6-16 port extensions, 5-3 port power increasing, 5-56 p o w e r coupling, 6-16 increasing test port, 5-56 line, 7-19 menu, 6-14 probe, 7-17 power cord receptacle with fuse, l-11 power level, calibrated, 6-102 power meter calibration, 5-34 calibration for mixer measurements, 3-6 configuration, 11-13 power meter calibration, 6-102
configuring a print function, 4-3 constructing a loop structure in a sequence, 2-77 coupling and uncoupling display markers, 2-24 creating a sequence, 2-69 creating flat limit lines, 2-47 creating single point limits, 2-51 creating sloping limit lines, 2-49 defining line types, 4-14 defining the plot, 4-12 de&ring the print, 4-5 deleting an instrument state, 4-41 deleting a single instrument state fle, 4-41 deleting limiting segments, 2-52 deviation from linear phase measurement, 242 dividing measurement
searching for bandwidth, 2-35 searching for maximum amplitude, 2-32 searching for minimum amplitude, 2-33 sequencing, 3-17 setting center frequency with markers, 2-28 setting CW frequency using markers, 2-31 setting display reference using markers, 2-30 setting electrical delay using markers, 2-31 setting frequency span with markers, 2-29 setting measurement parameters, 2-3 setting start frequency with markers, 2-27 setting stop frequency with markers, 2-27 setting the frequency range, 2-3 setting the measu
level of display, l-10 markers, 2-20 reference documents, 6-171 reference plane extending, 5-3 reflection measurements using bandpass mode, 6-127 using low pass mode, 6-131 reflection response in time domain, 2-88 reflection tracking uncorrected specifications, 7-3 register contents, 4-33 register data retention, 4-33 Re/Im MKR, 2-25, 2-26 relative marker mode, 2-20 relative velocity factor adjusting of, 6-127 relative velocity for time domain, 2-90 remote control, 11-15 remote enable (REN) control line, 11
using HP-IB, 6-152 sequence of measurement, 2-3 sequencing autostarting, 6-147 cascading multiple sequences, 2-76 changing the sequence title, 2-73 clearing a sequence from memory, 2-72 command information, 6-146 concepts, 6-146-152 decision making functions, 6-150 deleting commands, 2-71 editing, 6- 147 editing a sequence, 2-71 gosub sequence command, 6-148 HP-GL commands, 6-151 inserting a command, 2-71 Iimit test sequence, 2-79 loading a sequence from disk, 2-75 loop counter sequence, 2-77 menu, 6-148 mo
group delay, 7-15 harmonics (option 002), 7-11 impedance, 7-l 1 magnitude, 7-13 measurement port, 7-2 noise level, 7-11 option 001, 7-17 output power, 7-10 phase, 7-13, 7-14 remote programming, 7-17 spectral purity characteristics, 7-10 spurious signals, 7-10 type-N test ports, 7-4 uncorrected, 7-3 uncorrected test port, 7-3 specify class menu, 6-88 offset menus, 6-87 spectral purity characteristics, 7-10 spectrum of RF&C and IF signals present in a conversion loss measurement, 3-7 speed increased, 5-50 spu
linear, 6-22 logarithmic, 6-23 power, 6-27 stepped list frequency, 6-23 swept list frequency, 6-25 swept harmonics measurement, 2-81 swept IF conversion loss measurement example, 3-16 swept list frequency sweep, 6-25 increasing sweep speed, 5-50 measurements, 2-61 swept list mode increasing sweep speed, 5-50 in-depth description, 6-25 measurements, 2-61 swept power conversion compression measurement example, 3-32 swept RF/IF mixer measurement, 3-7 switch protection, 6-20 SWR format, 6-36 syntax for commands
hold mode, 6-20 interconnect location, 1-12 test set switch, controlling the, 5-54 test using limits, 2-53 time domain bandpass, 6-127 bandpass mode, 6-125 bandpass mode:reflection, 6-127 bandpass mode: transmission, 6- 129 concepts, 6-125-145 forward transform mode, 6-126 gating, 6-141 gating procedure, 2-85 general theory, 6-126 low pass, 6-130 low pass impulse mode, 6-125 low pass mode, fault location measurements, 6-131 low pass mode, reflection, 6-131 low pass mode, transmission, 6-133 low pass, settin
type-F (75Q) test ports measurement uncertainties, 7-8 type-F test ports specifications, 7-8 type-N (5Ot?) test ports specifications, 7-4 type-N (75Q) test ports measurement uncertainties, 7-6 specifications, 7-6 type-N calibration standard sex, 5-6 type-N test ports specifications, 7-4 type-N test ports (5OQ) measurement uncertainties, 7-4 type of sweep how to set, 5-53 typical calibration kit standard and corresponding number, 5-28 uncertainties 3.
