HP StorageWorks HSG60 and HSG80 Array Controller and Array Controller Software Troubleshooting Guide (EK-G80TS-SA. C01, March 2005)

Utilities and Exercisers
121HSG60 and HSG80 Array Controller and Array Controller Software Troubleshooting Guide
Testing the read and write capabilities of a unit
Run a DILX Basic Function test to test the read and write capability of a unit.
During the Basic Function test, DILX runs the following four tests:
Note: DILX repeats the last three tests until the time entered in step 7 on page 123
expires.
■ Write test—Writes specific patterns of data to the unit (see Table 34). DILX
does not repeat this test.
■ Random I/O test—Simulates typical I/O activity by issuing read, write,
access, and erase commands to randomly-chosen LBNs. The ratio of these
commands can be manually set, as well as the percentage of read and write
data that is compared throughout this test. This test takes 6 minutes.
■ Data-transfer test—Tests throughput by starting at an LBN and transferring
data to the next unwritten LBN. This test takes 2 minutes.
■ Seek test—Stimulates head motion on the unit by issuing single-sector erase
and access commands. Each I/O uses a different track on each subsequent
transfer. The ratio of access and erase commands can be manually set. This
test takes 2 minutes.
Table 34: Data Patterns for Phase 1: Write Test
Pattern Pattern in Hexadecimal Numbers
1 0000
28B8B
3 3333
4 3091
5 0001, 0003, 0007, 000F, 001F, 003F, 007F, 00FF, 01FF, 03FF, 07FF, 0FFF,
1FFF, 3FFF, 7FFF
6 FIE, FFFC, FFFC, FFFC, FFE0, FFE0, FFE0, FFE0, FE00, FC00, F800, F000, F000,
C000, 8000, 0000
7 0000, 0000, 0000, FFFF, FFFF, FFFF, 0000, 0000, FFFF, FFFF, 0000, FFFF, 0000,
FFFF, 0000, FFFF
8B6D9
9 5555, 5555, 5555, AAAA, AAAA, AAAA, 5555, 5555, AAAA, AAAA, 5555,
AAAA, 5555, AAAA, 5555, AAAA, 5555