HP Intelligent Infrastructure Analyzer Software v2.1 Quick Start Guide
Overview
HP IIAS uses industry-standard protocols (such as SNMP, SMI-S, CIM, and Telnet) to monitor the
physical layer (SFPs) across SAN, diagnose changes or events in SFP states or characteristics, and
presents the SAN topology, inventory, and diagnostic information to the user in real-time.
The HP Intelligent Infrastructure Analyzer Software is intended for customers having HP storage hardware
in their SAN. HP IIAS can be used to monitor and diagnose the physical layer of Storage Area Network
(SAN) in real-time, with an emphasis on the Small Form-factor Pluggable (SFP) on FC Switch, HBA,
and Storage device. The solution is highly beneficial for enterprise SAN, where SAN management
becomes cumbersome and tedious.
Product Features
Benefits
HP IIAS enables you to:
• Discover and collect data of HP FlexFabric 5900CP (HP FlexFabric 5900CP-48XG-4QSFP+
Switch), B-Series and H-Series switches in SAN.
NOTE: The HP FlexFabric 5900CP switch supports FC or FCOE ports.
• Discover and collect data of 8Gb/16Gb HP branded Qlogic FC HBAs.
• Discover and collect data of HP 3PAR storage device.
• Periodically monitor the active profile in SAN, based on the user-configured time intervals.
• Monitor or diagnose the degrading, or failing of SFPs in an active profile.
• Generate reports (current and historical).
• Notify the user on any change in the topology or SAN component state.
• Provide SAN summary in terms of component inventory.
Key Features
Manage SAN Profiles
Includes creation, deletion, modification, activation, and deactivation of SAN Profiles.
Rescan SAN
Initiates a Data Collection for the active profile.
SAN Topology
Graphically depicts in real-time, the topology of the SAN being monitored.
SAN Inventory
Displays detailed inventory information for the discovered SAN components (such as Switches, Hosts,
and Storage devices).
Event Manager
Manages events and diagnostic logs.
Configuration
Allows user to change the product configuration settings for HP IIAS.
Overview 3