Datasheet

Z5K500 OEM Specifications
154
Error data structure: Data format of error data structure is shown below.
Description Bytes Offset
Reserved 1 00h
Error register 1 01h
Sector count register 1 02h
LBA Low register 1 03h
LBA Mid register 1 04h
LBA High register 1 05h
Device register 1 06h
Status register 1 07h
Extended error data (vendor specific) 19 08h
State 1 1Bh
Life timestamp (hours) 2 1Ch
30
Table 122 Error data structure
State field contains a value indicating the device state when command was issued to the device.
Value State
x0h
Unknown
x1h
Sleep
x2h
Standby
x3h
Active/Idle
x4h
S.M.A.R.T. Off-line or Self-test
x5h-xAh
Reserved
xBh-xFh
Vendor specific
Note: The value of x is vendor specific
14.41.6 Self-test log data structure
The following defines the 512 bytes that make up the Self-test log sector. All multi-byte fields shown in
these data structures follow the ATA/ATAPI-7 specifications for byte ordering.
Description Bytes Offset
Data structure revision 2 00h
Self-test number 1 n*18h+02h
Self-test execution status 1 n*18h+03h
Life time power on hours 2 n*18h+04h
Self-test failure check point 1 n*18h+06h
LBA of first failure 4 n*18h+07h
Vendor specific 15 n*18h+0Bh
...
Vendor specific 2 1FAh
Self-test log pointer 1 1FCh
Reserved 2 1FDh
Data structure checksum 1 1FFh
512
Note: n is 0 through 20
Table 123 Self-test log data structure
The data structure contains the descriptor of Self-test that the device has performed. Each descriptor is
24 bytes long and the self-test data structure is capable to contain up to 21 descriptors.
After 21 descriptors has been recorded, the oldest descriptor will be overwritten with new descriptor.
Self-test log pointer points the most recent descriptor. When there is no descriptor the value is 0. When
there is descriptor(s) the value is 1 through 21.