Datasheet

Z5K500 OEM Specifications
108
14.17.3 Extended Self-test log sector
The following table defines the format of each of the sectors that comprise the Extended SMART self-test
log.
The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries
contained in the SMART self-test log, defined in “Self-test log data structure” shall also be included in the
Extended SMART self-test log with all 48-bit entries.
Description Bytes Offset
Self-test log data structure revision number 1 00h
Reserved 1 01h
Self-test descriptor index (7:0) 1 02h
Self-test descriptor index (15:8) 1 03h
Descriptor entry 1 26 04h
Descriptor entry 2 26 1Eh
...
Descriptor entry 19 26 1D8h
Vendor specific 2 1F2h
Reserved 11 1F4h
Data structure checksum 1 1FFh
512
Table 79 Extended Self-test log data structure
These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a descriptor
entry that replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that
replaces descriptor entry 2, etc. All unused self-test descriptors shall be filled with zeros
14.17.3.1 Self-test log data structure revision number
The value of this revision number shall be 01h.
14.17.3.2 Self-test descriptor index
This indicates the most recent self-test descriptor. If there have been no self-tests, this is set to zero.
Valid values for the Self-test descriptor index are 0 to 18.
14.17.3.3 Extended Self-test log descriptor entry
The content of the self-test descriptor entry is shown below.
Description Bytes Offset
Self-test number 1 00h
Self-test execution status 1 01h
Power-on life timestamp in hours 2 02h
Self-test failure check point 1 04h
Failing LBA (7:0) 1 05h
Failing LBA (15:8) 1 06h
Failing LBA (23:16) 1 07h
Failing LBA (31:24) 1 08h
Failing LBA (39:32) 1 09h
Failing LBA (47:40) 1 0Ah
Vendor specific 15 0Bh
26
Table 80 Extended Self-test log descriptor entry