User manual
Table Of Contents
- SAFETY INSTRUCTIONS
- GETTING STARTED
- OPERATION
- Menu Tree
- Test Lead Connection
- ACW, DCW and GB Manual Testing
- Choose/Recall a Manual Test Number
- Edit Manual Test Settings
- Setting the Test Function
- Setting the Test Voltage or Test Current
- Setting the Test Frequency
- Setting the Upper and Lower Limits
- Setting a Reference Value
- Setting the Test Time (Timer)
- Setting the Ramp Up Time
- Creating a MANU Test File Name
- Setting the ARC Mode
- Setting PASS HOLD
- Setting FAIL MODE
- Setting MAX HOLD
- Setting the Grounding Mode
- Saving and Exiting EDIT Status
- Running a MANU Test
- PASS / FAIL MANU Test
- Zeroing of the Test Leads (GB only)
- Special MANU Test Mode (000)
- Automatic Tests
- Common Utility Settings
- EXTERNAL CONTROL
- REMOTE CONTROL
- FAQ
- APPENDIX
- INDEX
GPT-9000 Series User Manual
42
Steps
1. Press the UP / DOWN arrow keys
to bring the cursor to the FREQ
setting.
I R G B
m A
A CW D CW I / LH O I M ET R
E
F R E Q = 0 H z 6
0
100
k V
IDE
MT I E = 0 0 1 . 0 SR
0 0 m AER F =# 0 .0MM A UN N A_
1 . 0 0 m AIH ES = 0T
0 0 . 1 S0A M P =R
T
2M A N U = * * * - 0 0
cursor
2. Use the scroll wheel to set the test
frequency.
ACW, GB
50Hz, 60Hz
Note
The test frequency can only be set for ACW or GB
tests.
Setting the Upper and Lower Limits
Background
There is both a LO and HI judgment setting.
When the measured value is below the LO SET
setting, the test will be judged as FAIL. When
the value exceeds the HI SET setting the test
will be judged as FAIL. Any measurement
between the LO SET and HI SET setting is
judged as PASS. The LO SET limit cannot be
made greater than the HI SET limit.
Steps
1. Press the HI/LO soft-key or use
the UP / DOWN arrow keys to
bring the cursor to the HI SET
(ACW/DCW/GB) setting or the
LO SET(IR) setting.
I / LH O
OR