User manual

GMC-I Messtechnik GmbH 59
Classification Parameter – IEC 60974-4
1
These parameters must be entered manually if they’re not automatically
detected, or if they’re detected incorrectly.
Sequence Parameter (as of firmware V1.3.0)
The default test sequences can be adapted to your applica-
tion or test standard via the sequence parameter. The entered
sequence parameter settings are only valid for the currently
selected switch position (A1 to A8 or AUTO) and are retained until
they are changed. Not all of the parameters are relevant, depend-
ing on the selected DUT classification (protection class etc.).
❑ Suppressing Test Steps
Depending on the selected test standard, some of the following
test steps can be suppressed:
1
Before switching line voltage to the device under test, a short-circuit test
is conducted regardless of this setting.
❑ Setting Measuring Parameters for Individual Test Steps
Depending on the selected test standard, some of the following
test steps can be selected:
1)
SECUTEST BASE10/PRO (feature G01)
2)
SECULIFE ST BASE25 (feature G02)
❑ Select between single and multiple measurement for individual test steps
Parameter Setting Options / Meaning
1/2
Standard/Test Sequence VDE 0701-0702, see table above
VDE 0701-0702-IT, see table above
VDE 0701-0702-ExtC, see table above
VDE 0701-0702-PRCD, see table above
IEC 62353, see previous table
IEC 60974-4
Protection class
1
Class I, Class II or Class I+II
Connection type
1
test socket
Perman. connect.
Adapter: AT16/32-DI-Adap.
Adapter: AT3-Adapter
2/2
Measurement type (MA)
1
Active
Voltage, rating plate Voltage from rating plate U(R) RMS
(Limit value RMS, variably adjustable)
or open-circuit voltage U0 DC (limit value = 113 V DC)
Auto detection Conn. & PC & MM
Conn. & PC
Conn. & MM
Conn. only
PC & MM
Prot. Class only
Meas. mode only
disabled:
all classification parameters such as connection and protec-
tion class must be entered manually.
Parameter Suppressible test steps
Visual Inspection Visual Inspection
Function test Function test
RPE Protective conductor resistance test
RISO PCI+II Insulation resistance tests for PCI and PCII
RISO pri./sec. Insulation resistance test between the primary and
secondary sides of PCIII DUTs
RISO sec./PE Insulation resistance test between the secondary side and
PE of PCIII DUTs
RISO BF/CF
(IEC 62353)
Insulation resistance tests at BF/CF application parts
RISO welding circuit
(IEC 60974-4)
RISO tests between the primary side and the welding
output, as well as between PE and the welding output
Reversed polarity All leakage current measurements with reversed polarity
IPE measurement type
(active)
Protective conductor current test
IB Touch current test
IB welding circuit Touch current test at welding circuit
Display test instructions Test instructions which are not necessarily required for experi-
enced inspectors
Short-circuit test L-N Short-circuit test between L and N
1
Short-circuit test LN-PE Short-circuit test between LN and PE1
1
Open-circuit voltage
(IEC 60974-4)
Open-circuit voltage at welding unit
Continuity test
(VLTG test only)
Continuity test with EL1/VL2E/AT3-IIIE adapter
PCIII supply voltage Supply voltage measurement (for PCIII DUTs; only for
measurement type „Active“)
Parameter Meaning
RPE IP Select test current for protective conductor resistance test:
200 mA AC, ±200 mA DC or 10 A AC
1
or 25 A AC
2
IPE measurement type
(active)
Select measurement type for protective conductor current
measurement for active device testing (differential/direct)
IG measurement type
(active) (IEC 62353)
Select measurement type for device leakage current
measurement for active device testing (differential/direct)
Parameter
(as of FW 1.5.0)
Meaning
RPE as Switch the “protective conductor resistance” test step back
and forth between multiple and single measurement
Parameter
(as of FW1.8.0)
Meaning
RISO SK II as Switch the insulation resistance measurement at PC II
parts (measurements at applied parts/welding outputs are
not affected) back and forth between multiple and single
measurement
IB as Switch the touch current measurement back and forth
between multiple and single measurement
IB SK II as (IEC 60974 only) Switch the touch current measurement
at PC II parts back and forth between multiple and single
measurement