User's Manual

Table Of Contents

TRF7970A

SLOS743K –AUGUST 2011–REVISED APRIL 2014

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6.14.3.4 Test Registers

6.14.3.4.1 Test Register (0x1A)

Table 6-54. Test Register (0x1A) (for Test or Direct Use)

Default: 0x00 at POR = H and EN = L.

Bit Name Function Description

B7 OOK_Subc_In Subcarrier Input OOK Pin becomes decoder digital input

B6 MOD_Subc_Out Subcarrier Output MOD Pin becomes receiver digitized subcarrier output

Direct TX modulation and

B5 MOD_Direct MOD pin becomes input for TX modulation control by the MCU

RX reset

o_sel = L: First stage output used for analog out and digitizing

B4 o_sel First stage output selection

o_sel = H: Second Stage output used for analog out and digitizing

Second stage gain -6 dB,

B3 low2

HP corner frequency/2

First stage gain -6 dB, HP

B2 low1

corner frequency/2

B1 zun Input followers test

AGC test, AGC level is

B0 Test_AGC

seen on rssi_210 bits

6.14.3.4.2 Test Register 0x1B

Table 6-55. Test Register (0x1B) (for Test or Direct Use)

Default: 0x00 at POR = H and EN = L. When a test_dec or test_io is set IC is switched to test mode. Test Mode persists until a stop

condition arrives. At stop condition the test_dec and test_io bits are cleared.

Bit Name Function Description

test_rf_level RF level test

B3 test_io1

I/O test Not implemented

B2 test_io0

B1 test_dec Decoder test mode

B0 clock_su Coder clock 13.56 MHz For faster test of coders

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