Operating Manual
nanome|x – the ultimate X-ray solution
This automatic X-ray system of superior specifications satisfies even highest demands for the
inspection of high-end interconnections in the semiconductor and SMT industry. The high-per-
formance nanofocus tube (4-in-1) covers the full range from submicron resolution to high-inten-
sity applications. The digital realtime image chain provides an excellent contrast resolution and
enables oblique views up to 70 degrees and magnifications well above 24 000x. The nanome|x
offers unique performance and versatility and can be used for 2D X-ray inspection as well as for
full 3D computed tomography. With the new x|act software package the nanome|x is the system
of choice to ensure meeting actual and future zero defect requirements.
Setting new standards
180 kV / 15 W high-power nanofocus tube
2-Megapixel digital image chain
24” TFT monitor
x|act software package: easy and fast CAD based programming for high-
resolution automated X-ray inspection (µAXI) with high magnification and
repeatability
Outstanding ease-of-use
Detail detectability down to 0.2 microns
Optical zoom up to 24 000x
Oblique views at angles between 0 and 70 degrees
Dual detector (digital image chain and active temperature-stabilized digital
detector with 30 fps) for brilliant live images
4-Megapixel digital image chain available
Upgradeable to nanoCT
®
nanoCT
®
of CSP solder joints
BGA: insucient reow
QFN: two open joints
nanoCT
®
of stacked dies
Wedge-bond
Cracked die
GE
Measurement & Control Solutions
phoenix|x-ray